Chantler, C.
(2001),
Detailed New Tabulation of Atomic Form Factors and Attenuation Coefficients in the Near-Edge Soft X-Ray Regime (Z=30-36, <I>Z</I>=60-89, 3+0.1 keV-8 keV), J. Phys. & Chem. Ref. Data (JPCRD), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed April 19, 2024)
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Detailed New Tabulation of Atomic Form Factors and Attenuation Coefficients in the Near-Edge Soft X-Ray Regime (Z=30-36, Z=60-89, 3+0.1 keV-8 keV)
Published
Author(s)
Citation
J. Phys. & Chem. Ref. Data (JPCRD) -
Volume
29
NIST Pub Series
Pub Type
NIST Pubs
Citation
Created January 1, 2001, Updated November 14, 2018