TY  - GEN
AU  - Christopher Chantler
C2  - J. Phys. & Chem. Ref. Data (JPCRD), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2001-01-01
LA  - en
M1  - 29
PB  - J. Phys. & Chem. Ref. Data (JPCRD), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2001
TI  - Detailed New Tabulation of Atomic Form Factors and Attenuation Coefficients in the Near-Edge Soft X-Ray Regime (Z=30-36, <I>Z</I>=60-89, 3+0.1 keV-8 keV)
ER  -