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NIST Pubs

A Comparison of the CMM-Driver Specification Release #1.9 with the I++ DME-Interface Release 0.9

March 1, 2002

Author(s)

Thomas R. Kramer, John A. Horst

This comparison focuses on the interface between high-level inspection instruction execution and low-level inspection instruction execution.This interface is

Admission Discharge and Transfer System Protection Profile (ADT-PP) (An ISO/IEC 15408 Security Protection Profile for a Healthcare IT Application System)

March 1, 2002

Author(s)

Ramaswamy Chandramouli, G Marshall

The central piece of information in this document is a set of security functional and assurance requirements for an Admissions Discharge and Transfer System

Standard Reference Material 1749: Au/Pt Thermocouple Thermometer

March 1, 2002

Author(s)

Dean C. Ripple, G W. Burns

Standard Reference Material (SRM) 1749 is a lot of 18 specially-constructed gold versus platinum (Au/Pt) thermocouple thermometers, each calibrated on the

Planning Report 02-1: The Economic Impact of Role-Based Access Control

March 1, 2002

Author(s)

Michael P. Gallaher, Alan C. O'Connor, Brian Kropp, Gregory C. Tassey

The National Institute of Standards and Technology (NIST) began working on RBAC in the early 1990s after a study of federal agency security needs identified the

NIST Stray Light Elimination Tube Prototype

March 1, 2002

Author(s)

Paul A. Boynton, Edward F. Kelley

Electronic projection displays involve the projection of an image, usually through a lens system, onto a viewing screen. Metrics such as light output, contrast

Agent Technology: Feasibility for Business and Manufacturing Application

March 1, 2002

Author(s)

Elizabeth N. Fong, Nenad Ivezic, R Korchak, Y Peng, Thomas R. Rhodes

Electronic commerce (e-commerce) may be defined as the entire set of processes that support transaction activities on a network and involve information analysis

IT Security for Industrial Control Systems

February 28, 2002

Author(s)

Joseph Falco, Frederick M. Proctor, Keith A. Stouffer, Albert J. Wavering

The National Institute of Standards and Technology (NIST) is working to improve the IT security of networked digital control systems used in industrial

Risk Management Guidance for Information Technology Systems

February 26, 2002

Author(s)

Joan Hash

Risk Management is the process of identifying risk, assessing risk, and taking steps to reduce risk to an acceptable level. Organizations use risk assessment

Automated Image Processing Tools for High Throughput Measurements of Polymer Coatings: Initial Report on Software to Quantify Features

February 25, 2002

Author(s)

Isabel M. Beichl, J. Bernstein, A Karim

We have developed a series of Matlab programs to analyze photographs of polymer dewetting. This report provides details of how the programs work, what they do

Trapped Ions and Laser Cooling, V

February 20, 2002

Author(s)

James C. Bergquist, John J. Bollinger, Wayne M. Itano, David J. Wineland

Trapped Ions and Laser Cooling, VI

February 13, 2002

Author(s)

James C. Bergquist, John J. Bollinger, Wayne M. Itano, David J. Wineland

The NIST Electron Effective-Attenuation-Length Database

February 1, 2002

Author(s)

Cedric J. Powell, Aleksander Jablonski

The NIST Electron Effective-Attenuation-Length Database provides values of electron effective attenuation lengths (EALs) in solid elements and compounds at

Lattice Symmetry and Identification--The Fundamental Role of Reduced Cells in Materials Characterization

February 1, 2002

Author(s)

Alan D. Mighell

In theory, physical crystals can be represented by idealized mathematical lattices. Under appropriate conditions, these representations can be used for a

Data Analysis Methods for Synthetic Polymer Mass Spectrometry: Autocorrelation

February 1, 2002

Author(s)

William E. Wallace, Charles M. Guttman

Autocorrelation is shown to be useful in describing the periodic patterns found in high-resolution mass spectra of synthetic polymers. Examples of this

Survey of FY 2001 Nanotechnology-Related Research at the National Institute of Standards and Technology

February 1, 2002

Author(s)

Chad R. Snyder, J P. Looney, F A. Moris

This report catalogs the efforts of the National Institute of Standards and Technology (NIST) in nanotechnology during FY 2001. The purpose of this report is to

Towards Near Perfect Crystals With Only Well-Characterized Imperfections

February 1, 2002

Author(s)

H S. Peiser

Throughout the past century NBS/NIST supported a great variety of research studies in crystallography where the aim was the highest attainable accuracy in

Certification of the Rheological Behavior of SRM 2490, Polyisobutylene Dissolved in 2,6,10,14-Tetramethylpentadecane

February 1, 2002

Author(s)

Carl R. Schultesiz, C. Leighton

The certification of the rheological properties of standard reference material SRM 2490, a non-Newtonian fluid consisting of polyisobutylene dissolved in 2,6,10

Electron-Impact Total Ionization Cross Sections of Hydrocarbon Ions

February 1, 2002

Author(s)

Karl K. Irikura, Yong Sik Kim, M A. Ali

The Binary-Encounter-Bethe (BEB) model for electron-impact total ionization cross sections has been applied to CH 2 +, CH 3 +, CH 4 +, C 2H 2 +, C 2H 4 +, C 2H

Intelligent Systems Annotated Bibliography and Survey, Part I. Systems with Intelligent Controllers

February 1, 2002

Author(s)

A Meystel

In Part I of this report, a place of Intelligent Control in the variety of systems is discussed. In many cases it amounts to transforming the system into an

NIST Standard Reference Materials Catalog 2002

February 1, 2002

Author(s)

J W. Thomas

This catalog provides technical and general ordering information for the Standard Reference Materials [SRMs] and Reference Materials [RMs] currently available

Chemical Science and Technology Laboratory FY 2001

February 1, 2002

Author(s)

Hratch G. Semerjian, W Koch, Ellyn S. Beary

This report summarizes the research and services provided by the Chemical Science and Technology Laboratory of the National Institute of Standards and

Model Checkers in Software Testing

February 1, 2002

Author(s)

Paul E. Black, P E. Ammann, W Ding

The primary focus of formal methods is static analysis of specifications and code, but there is also a long tradition of exploiting formal methods for testing

The Validation of Fourier-Transform Microwave Spectroscopy for Trace-Gas Analysis

February 1, 2002

Author(s)

Pamela M. Chu, R D. Suenram, Angela R. Hight Walker, R S. DaBell, George C. Rhoderick, Gerald T. Fraser

There is strong interest by regulatory agencies and automobile manufacturers, motivated in large part by increasingly stringent emission standards, for

Distributed Testing of a Device-Level Interface Specification for a Metrology System

January 31, 2002

Author(s)

Joseph Falco, John A. Horst, Hui-Min Huang, Thomas Kramer, Frederick M. Proctor, Keith A. Stouffer, Albert J. Wavering

A test suite for an key interface within a dimensional measuring system (coordinate measuring machine or CMM) is presented. The test suite consists of test

Electricity Division Programs, Activities, and Accomplishments 2001

January 30, 2002

Author(s)

James K. Olthoff, Barry A. Bell

A review of the Technical Accomplishments in the Electricity Division.

Semiconductor Electronics Division Programs, Acitivites, and Accomplishments 2001

January 21, 2002

Author(s)

Erik M. Secula

This document represents the fiscal year 2000 production of the Projects comprising the Semiconductor Electronics Division (SED). Project goals, customer needs

Cost Analysis of Fire Suppression Systems

January 2, 2002

Author(s)

J M. Bennett, M L. Kolleck

Prototype Software for Contaminant-Based Design

January 2, 2002

Author(s)

George Walton, Andrew K. Persily

Outdoor air intake rates of mechanical ventilation systems have traditionally been determined using prescriptive methods based on ventilation requirements per

Electromagnetic Technology Division 2001 Technical Accomplishments

January 1, 2002

Author(s)

Sara E. Metz

The roughly forty staff and guest scientists in the Electromagnetic Technology Division take great pride in bringing you this brief report on recent progress in

Contingency planning guide for information technology systems ::recommendations of the National Institute of Standards and Technology

January 1, 2002

Author(s)

Marianne Swanson, Amy Wohl, Lucinda Pope, Tim Grance, Joan Hash, Ray Thomas