Gates, R.
and Hsu, S.
(2003),
Measurement/Calibration Technique for Nanometer Scale Average Film Thickness on Atomically Rough Surfaces Developed, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed October 10, 2024)
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Measurement/Calibration Technique for Nanometer Scale Average Film Thickness on Atomically Rough Surfaces Developed
Published
Author(s)
,
Abstract
Current magnetic hard disks are protected by ananometer-thick layer of alcohol functionalized perfluoroakyletherand carbon overcoat. Achievement ofhigher areal density requires further reduction in thespace between the head and the magnetic layer athigher speed. The possibility of occasional impactsfrom head disk collisions requires that the adhesivestrength of the organic molecules be increased whileretaining the mobility of some of the molecules. Onepossible solution is to use a mixed molecular assemblyin which two separate species are assembled togetherto impart both adhesive strength and mobility. Becauseof the poor solubility characteristics of perfluoroakylethers,such mixed films are very difficultto achieve.Citation
Journal of Research (NIST JRES) -
Volume
108
Issue
No. 5
NIST Pub Series
Pub Type
NIST Pubs
Citation
Issues
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Created September 1, 2003, Updated February 19, 2017