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Journals

Capability in Rockwell C Scale Hardness

Author(s)
Walter S. Liggett Jr, Samuel Low, David J. Pitchure, Jun-Feng Song
A measurement system is capable if it produces measurements with uncertainties small enough for demonstration of compliance with product specifications. To...

Enterprise Resource Planning Systems in Manufacturing

Author(s)
Edward J. Barkmeyer Jr., Mary B. Algeo
Enterprise resource planning (ERP) systems are commercial applications that provide the backbone necessary to support the enterprise-wide integration of...

Monitoring and Controlling Operations

Author(s)
Albert T. Jones, Evan K. Wallace, Yuehwern Yih
This work is a chapter in a forthcoming Handbook of Industrial Engineering. The chapter contains five sections. In addition to a short introduction and a...

Web-Based System for Design Artifact Modeling

Author(s)
Simon Szykman, J Racz, Christophe Snowden, Ram D. Sriram
Modern engineering industry is relying more and more on the use of knowledge in product development. The NIST-Design Repository Project, at NIST, is working to...

The Role of Standards in Innovation

Author(s)
Robert Allen, Ram D. Sriram
We review and explore the role of standards in innovation, with particular emphasis on the design and manufacturing processes. We begin by defining and...

Agent Based Services for B2B Electronic Commerce

Author(s)
Yun Peng, Nenad Ivezic, Thomas R. Rhodes, N Fong
The potential of agent-based systems has not been realized yet, in part, because of the lack of understanding how the agent technology support industrial needs...

Structural Information Mapping with Express-X

Author(s)
D B. Sanderson, Peter O. Denno
This paper provides an overview of the Express-X language, a language that provides structural information mapping of information modeled in EXPRESS schema. The...

Fast Imaging of Hard X-Rays With a Laboratory Microscope

Author(s)
A S. Bakulin, S M. Durbin, Terrence J. Jach, J Pedulla
An improved x-ray microscope with a fully electronic CCD detector system has been constructed that allows improved laboratory-based microstructural...

Exclusion Limits on the WIMP-Nucleon Cross Section from the Cryogenic Dark Matter Search

Author(s)
R. Abusaidi, D. S. Akerib, P. D. Barnes, D. B. Bauer, A. Bolozdynya, P. Brink, R. Bunker, B. Cabrera, D. O. Caldwell, J. P. Castle, R. M. Clarke, P. Colling, M. B. Crisler, A Cummings, A. Da Silva, A. K. Davies, R. Dixon, B. L. Dougherty, D. Driscoll, S. Eichblatt, J. Emes, R. J. Gaitskell, S. R. Golwala, D. Hale, E. E. Haller, J. Hellmig, Martin Huber, Kent D. Irwin, J. Jochum, F. P. Lipschultz, A. Lu, V. Mandic, John M. Martinis, Sae Woo Nam, Harold E. Nelson, B. Neuhauser, M. J. Penn, T. A. Perera, M. Perillo-Issac, B Pritychenko, R. R. Ross, T. Saab, B. Sadoulet, R. W. Schnee, D. N. Seitz, P. Shestople, T. Shutt, Amy Smith, G. W. Smith, A. H. Sonnenschein, A. L. Spadafora, W. Stockwell, J. D. Taylor, Stephen White, S. Yellin, B. A. Young
The cryogenic Dark Matter Search (CDMS) employs Ge and Si detectors to search for weakly interacting massive particles (WIMPs) via their elastic-scattering...
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