Stephen E. Russek, Terry J. Gaffron, S. L. Burkett
As spin valve technology evolves, understanding the limitations and design constraints is a critical consideration. Choosing the correct materials combination, aspect ratio and size depends upon careful device characterization. Analysis of spin valves in this study shows that device lifetime and durability are determined by allowable current densities and the internal temperatures that result. Parameters such as maximum sustained current and device degradation can be predicted and calculated, allowing the designer to choose the correct parameters for a specific application.