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Journals

Lifetime Prediction for Silicon Nitride

Author(s)
Sheldon M. Wiederhorn
This paper reviews lifetime prediction methodologies for high-temperature structural ceramics. The methodologies consider failure from subcritical crack growth

Predicting Fracture Resistance of Brittle Crystals

Author(s)
Grady S. White, Stephen W. Freiman, Lin-Sien H. Lum
A simple expression is derived relating fracture surface energy to easily measured material properties, i.e., the elastic Young's modulus and the equilibrium

Combinatorial Tools for Inorganic Thin Films

Author(s)
Peter K. Schenck, Debra L. Kaiser
We report the deveopment of a novel dual beam - dual target pulsed laser deposition (PLD) system for the production of compositionally-graded library films for

Habits of Grains in Dense Polycrystalline Solids

Author(s)
D M. Saylor, B S. El-Dasher, Y Pang, H M. Miller, P Wynblatt, Anthony D. Rollett, G S. Rohrer
Three-dimensional interfacial networks in polycrystalline solids are topologically and crystallographically complex. With a few notable exceptions, most of what

Phase-Correct Bond Lengths in Crystalline-GexSil-x Alloys

Author(s)
Joseph Woicik, K E. Miyano, C A. King, R W. Johnson, J G. Pellegrino, T L. Lee, Z H. Lu
Extended x-ray absorption fine structure performed at the Ge-K edge has determined the Ge-Ge and Ge-Si bond lengths in a series of crystalline-Ge l-x alloys (x

Characterization of the Mirror Region With Atomic Force Microscopy

Author(s)
Sheldon M. Wiederhorn, Jose Lopez-Cepero, Jay S. Wallace, Jean-Pierre Guin, Theo Fett
In this paper we use atomic force microscopy to investigate the roughness of the mirror region in silica glass. We demonstrate a decrease in surface RMS

A Combinatorial Study of Metal Gate/HfO2-MOSCAPS

Author(s)
Martin L. Green, Kao-Shuo Chang, Ichiro Takeuchi, T Chikyow
Combinatorial methodology is a rapid technique for surveying new gate dielectrics and gate metal electrodes for the very complex advanced CMOS gate stack. Here
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