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A Method is described for reconstructing the crystal habit from the observations of many random planar sections of known orientation. We have generated
This paper reviews lifetime prediction methodologies for high-temperature structural ceramics. The methodologies consider failure from subcritical crack growth
The method of determining the surface roughness of a transparent solid interface by fitting spectrophotometric transmittance and/or reflectance data with a
N D. Leifer, A Colon, K Martocci, S G. Greenbaum, Faisal Alamgir, T B. Reddy, N R. Gleason, R A. Leising, E S. Takeuchi
Structural studies have been carried out on Ag2V4O11 (silver vanadium oxide, SVO) and LixAg2V4O11, lithiated SVO with x = 0.72, 2.13 and 5.59 using Nuclear
Julia Slutsker, V Talanov, I Smolyaninov, Igor Levin, A R. Schwartz, Alexander L. Roytburd
The response of self-assembled CoFe2O4-PbTiO3 multiferroic nanostructures to an external microwave field was analyzed using a near-field scanning microwave
Grady S. White, Stephen W. Freiman, Lin-Sien H. Lum
A simple expression is derived relating fracture surface energy to easily measured material properties, i.e., the elastic Young's modulus and the equilibrium
Y E. Lee, Mark D. Vaudin, Peter K. Schenck, B Hockey
A BaTiO 3 polycrystalline thin film was fabricated by pulsed laser deposition on a Pt/Ti/SiO 2/Si substrate. X-ray diffraction suggested that the film contained
An analytical result has been obtained for the value of the dynamical charge necessary for calculations of oxygen vacancy kinetics in dielectric perovskite-type
Products based upon nanotechnology represent a potential market for revolutionary new materials, particularly those where one or more dimension is less than 50
The purpose of this document is to propose a standard procedure for measuring the thermal conductivity of insulating thin films on silicon substrates. The
The general expression relating Raman scattering intensity to incident and scattered polarization directions is modified to account for an experimental
We report the deveopment of a novel dual beam - dual target pulsed laser deposition (PLD) system for the production of compositionally-graded library films for
The diametral compression (or Brazilian disk) test is a useful method for determining the tensile strength of ceramic materials. This test method has been
D M. Saylor, B S. El-Dasher, Y Pang, H M. Miller, P Wynblatt, Anthony D. Rollett, G S. Rohrer
Three-dimensional interfacial networks in polycrystalline solids are topologically and crystallographically complex. With a few notable exceptions, most of what
Joseph Woicik, K E. Miyano, C A. King, R W. Johnson, J G. Pellegrino, T L. Lee, Z H. Lu
Extended x-ray absorption fine structure performed at the Ge-K edge has determined the Ge-Ge and Ge-Si bond lengths in a series of crystalline-Ge l-x alloys (x
Sheldon M. Wiederhorn, Jose Lopez-Cepero, Jay S. Wallace, Jean-Pierre Guin, Theo Fett
In this paper we use atomic force microscopy to investigate the roughness of the mirror region in silica glass. We demonstrate a decrease in surface RMS
Martin L. Green, Kao-Shuo Chang, Ichiro Takeuchi, T Chikyow
Combinatorial methodology is a rapid technique for surveying new gate dielectrics and gate metal electrodes for the very complex advanced CMOS gate stack. Here
Amol Jadhav, N P. Padture, Eric Jordan, Maurice Gell, Pilar Miranzo, Lin-Sien H. Lum
The solution precursor plasma spray (SPPS) process has been used to deposit ZrO2-7wt%Y2O3 (7YSZ) thermal barrier coatings (TBCs) that contain alternate layers
Ultra-small-angle x-ray scattering data were obtained from a single-crystal Al sample deformed in situ at strains up to 18 %. High sensitivity to the resulting
T J. Haugan, Winnie Wong-Ng, Lawrence P. Cook, L Swartzendruber, H J. Brown, D T. Shaw
Efforts to improve the magnetic flux-pinning properties of Bi 2Sr 2Ca 1Cu 20 8 +δ /Ag (2212/Ag) tape conductors utilizing (Srd1-x^Ca x)14Cu 240 41+δ (014x24)
TEM has been used to characterize the defect structures produced in Si and Mgo by Berkovich indentation at loads ranging from 0.1 mN to 5 mN. Plane-section
TEM has been used to characterize residual defect structures produced in 111} Si and 001] MgO by Berkovich nanoindentation at loads ranging from 5 mN to 0.1 mN
Atomic force microscopy measurements of the piezoelectric response of a lead zirconate titanate (PZT) thin film detect domain pinning sites along grain
Joseph Woicik, H Li, P Zschack, E Karapetrova, P Ryan, C R. Ashman, C S. Hellberg
X-ray diffraction has been used to study the epitaxy and lattice expansion of SrTiO3 thin films grown on Si(001) by kinetically controlled sequential deposition
Two-dimensional calculations of anisotropic growth and coarsening are illustrated. This model is intended to simulate the development of microstructure in
Images produced by x-ray computed tomography contain intrinsic error due to the limited spatial resolution of the technique. Two bounds on the mean intrinsic
In the last three decades, communications technologieshave been completely transformed by the wirelessrevolution. Devices such as cell phones are now socommon
The effect of Sb5+ substitution on the crystal chemistry and dielectric properties of Ba3MNb2-xSbxO9 (M = Mg, Zn, Ni) was investigated using a combination of X
NASA=S interest in tracing the structural origins of the superior electronic performance of mercuric iodide crystals grown in microgravity has led to an