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Conferences

On-Line Accuracy Assessment for the Dual Six-Port ANA:Background and Theory

June 1, 1986

Author(s)

G F. Engen

Calibrating a Dual Six-Port or Four-Port for Measuring Two-Portswith Any Connectors

June 1, 1986

Author(s)

C. A. Hoer, G F. Engen

A Simple Technique for Determining Joint Losses on a CoaxialLine from Swept-Frequency Reflection Data

June 1, 1986

Author(s)

W C. Daywitt

Fast Path Planning in Unstructured, Dynamic, 3-D Worlds

April 21, 1986

Author(s)

Martin Herman

Issues dealing with fast motion planning in unstructured, dynamic 3-D worlds are discussed, and a fast path planning system under the development at NBS is

Building Representations From Fusion of Multiple Views

April 10, 1986

Author(s)

Ernest Kent, Michael O. Shneier, Tsai Hong Hong

Fast, Three-Dimensional, Collision-Free Motion Planning

April 10, 1986

Author(s)

Martin Herman

Issues dealing with fast, 3-D, collision-free motion planning are discussed, and a fast path planning system under development at NBS is described. The

The Vertical Machining Workstation of the AMRF: Software Integration

April 1, 1986

Author(s)

Charles R. McLean

The software architecture of the Vertical Machining Workstation (VWS) in the Automated Manufacturing Research Facility (AMRF) at the National Bureau of

Standard Measurement Procedures for Characterizing Single-Mode Fiber

April 1, 1986

Author(s)

Douglas L. Franzen

Information Architecture of the Automated Manufacturing Research Facility (AMRF)

March 1, 1986

Author(s)

Charles R. McLean

A small batch manufacturing system testbed, currently under construction at the National Bureau of Standards (NBS), is designed to support research in factory

1.25 MHz Attenuation Measurement System

March 1, 1986

Author(s)

Ronald A. Ginley, C M. Allred

Millimeter Wave Standards: An Emerging Need

March 1, 1986

Author(s)

R T. Adair, Gerome R. Reeve, L E. Gatterer

SIPS: An Application of Hierarchical Knowledge Clustering to Process Planning

March 1, 1986

Author(s)

D Nau, M M. Gray

This paper describes SIPS, an AI system which selects machining operations for the creation of metal parts. SIPS is a successor to SIPP, which was described at

Dynamic Performance of Digital Recorders Used for MonitoringHigh-Voltage Impulse Tests

March 1, 1986

Author(s)

J Kuffel, R Malewski, R Van heeswijk, R A. Lawton

The Automated Manufacturing Research Facility at NBS

February 1, 1986

Author(s)

Charles R. McLean

The Automated Manufacturing Research Facility (AMRF) at the U.S. National Bureau of Standards (NBS) is a major government laboratory for research in computer

Electromagnetic Shielding Effectiveness: Measurement Techniquesand Interpretations

February 1, 1986

Author(s)

Perry F. Wilson, M T. Ma

The AMRF Material Handling System Architecture

February 1, 1986

Author(s)

Charles R. McLean, Carl Wenger

A small batch manufacturing system testbed, the Automated Manufacturing Research Facility (AMRF), currently under construction at the National Bureau of

Hierarchical Abstraction of Problem-Solving Knowledge

February 1, 1986

Author(s)

D Nau

In most frame-based reasoning systems, the data manipulated by the system is represented using frames, and the problem-solving knowledge used to manipulate this

Rotation and Translation of Objects Represented by Octrees

January 2, 1986

Author(s)

Tsai H. Hong, Michael O. Shneier

This paper describes an algorithms for performing arbitrary translations and rotations of objects represented by octrees. Given an octree in a standards

Chemical Production Rates of Intermediate Hydrocarbons in a Methane/Air Diffusion Flame

January 1, 1986

Author(s)

J. H. Miller, William G. Mallard, K C. Smyth

The net production and destruction rates for acetylene, diacetylene, butadiene, and benzene have been determined from measurements of species concentration

A Photonic Electric Field Probe for Frequencies up to 2 GHz

January 1, 1986

Author(s)

Keith D. Masterson

Quality Control of Measurements-Measurement Assurance

January 1, 1986

Author(s)

Robert M. Judish

State Selection in Electron-Atom Scattering: Spin-Polarized Electron Scattering from Optically Pumped Sodium

January 1, 1986

Author(s)

Jabez J. McClelland, Michael H. Kelley, Robert Celotta

New Techniques in Microscopy: Scanning Tunneling and Polarized Electron Microscopy

January 1, 1986

Author(s)

Robert Celotta

Integrated Automated Manufacture of Metal Parts

January 1, 1986

Author(s)

Thomas R. Kramer

This paper describes a system for the automated manufacture of metal parts developed at the National Bureau of Standards by the author and his colleagues. The

A Knowledge Representation Scheme for Processes in an Automated Manufacturing Environment

January 1, 1986

Author(s)

Steven R. Ray

A key factor in applying advance programming concepts to an industrial manufacturing environment is the establishment of a language to specify the process steps

Hybrid computer-optical processing with inexpensive liquid crystal television

January 1, 1986

Author(s)

M. Young, M. B. Weppner

We describe a computer-optical processing system that uses an inexpensive liquid crystal (LCD) television monitor and a selective holographic filter for