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Conferences

Improving the NIST Ionospheric Measurement System

January 1, 1996

Author(s)

Marc A. Weiss, Steven R. Jefferts, L Gaudron

Time and Frequency Metrology

January 1, 1996

Author(s)

Donald Sullivan, Judah Levine

The Evaluation of NIST-7: A New Era

January 1, 1996

Author(s)

Jon H. Shirley, W D. Lee, Robert E. Drullinger

Velocity Distributions from the Fourier Transforms at Ramsey Lineshapes

January 1, 1996

Author(s)

Jon H. Shirley

Recent Improvements in the Performance of the NIST AT1 Time Scale

January 1, 1996

Author(s)

Thomas E. Parker, Judah Levine

Extending the Range for Precision AM Noise Measurements

January 1, 1996

Author(s)

Craig W. Nelson, F L. Walls, C K. Boggs

Computer Timekeeping

January 1, 1996

Author(s)

Michael A. Lombardi

Time and Frequency Activities at NIST

January 1, 1996

Author(s)

Judah Levine, Donald Sullivan

Advances in Primary Frequency Standards

January 1, 1996

Author(s)

W D. Lee

A 1 GHz Diode Laser-Driven Optical-Delay-Line Oscillator

January 1, 1996

Author(s)

John E. Kitching, Leo W. Hollberg, F L. Walls

Two-Way Time Transfer Through SDH and SONET Systems

January 1, 1996

Author(s)

Steven R. Jefferts, Marc A. Weiss, Judah Levine, S Dilla

The Effect of Drift on TOTALDEV

January 1, 1996

Author(s)

David A. Howe, K J. Lainson

NIST-7, The US Primary Frequency Standard: New Evaluation Techniques

January 1, 1996

Author(s)

Robert E. Drullinger, Jon H. Shirley, W D. Lee

DBR Laser Diodes for Optically Pumped Cs Frequency Standards

January 1, 1996

Author(s)

Robert E. Drullinger, D A. Jennings, W D. Lee, J M. Lopez-romero

Analytical Applications of Fourier Transform Microwave (FTMW) Spectroscopy to Trace Gas Analysis

January 1, 1996

Author(s)

R D. Suenram, Francis J. Lovas, J U. Grabow, Angela R. Hight Walker, C Lugez, P M. Chu

Simulating X-ray Fluorescence in Graphite and Boron Nitride

January 1, 1996

Author(s)

Eric L. Shirley

Color Centers in LiF for Measurement of Absorbed Doses up to 100 MGy

January 1, 1996

Author(s)

W L. Mclaughlin

NIST Commitment to National MQA Programs

January 1, 1996

Author(s)

Randall S. Caswell

The Effect of Formulation Changes on the Response to Ultraviolet and Ionizing Radiation of Radiochromic Dye Films

January 1, 1996

Author(s)

M Barcelo, R M. Uribe, W L. Mclaughlin, G Belmont

Short Period (

January 1, 1996

Author(s)

J Pedulla, R Deslattes

Integral Equation for Scattering by a Rough Surface

January 1, 1996

Author(s)

Egon Marx

An equation for an unknown surface field that represents scattering by a rough patch on a flat dielectric surface is presented. The geometrical considerations...

New NIST-Certified Length Microscale

January 1, 1996

Author(s)

James E. Potzick

The National Institute of Standards and Technology is developing a simple one-dimension certified pitch standard (or scale) covering the range 1 um to 10 mm...

Hierarchical Control in a Virtual Manufacturing Facility

January 1, 1996

Author(s)

Michael Iuliano, Albert W. Jones

Researchers at the National Institute of Standards and Technology are developing a virtual manufacturing cell, which will facilitate standards development and...

Position Paper for Workshop on Application Integration Architectures

January 1, 1996

Author(s)

Katherine C. Morris

This paper summarizes - the work that is currently being done within ISO 10303 (a.k.a. STEP -- ISO/TC184/SC4) -- the needs for data access and sharing in a...

Wavelength-Shift Interferometry: Using a Dither to Improve Accuracy

January 1, 1996

Author(s)

Jack A. Stone Jr., Alois Stejskal, Lowell P. Howard

A dither in path length can dramatically improve the accuracy of wavelength-shift methods used for absolute distance interferometry. Here we report how a dither...

Novel Methods for Length Measurement Employing Diode Lasers

January 1, 1996

Author(s)

Jack A. Stone Jr., Lowell P. Howard, Alois Stejskal, M Stephens, C Oates, L Hollberg

Diode lasers have several unique capabilities for length-measurement applications, arising from properties of the diodes that are much different from those of...

Height Calibration of Atomic Force Microscopes Using Silicon Atomic Step Artifacts

January 1, 1996

Author(s)

V W. Tsai, Theodore V. Vorburger, P Sullivan, Ronald G. Dixson, Richard M. Silver, Edwin R. Williams, J Schneir

The decreasing feature dimensions required in the semiconductor manufacturing industry are placing ever increasing demands upon metrology instruments. Atomic...

Proposed IEEE-P1451.3 Mixed-mode Smart Transducer Interface

January 1, 1996

Author(s)

S Chen, Kang B. Lee

Various transducer companies offer proprietary smart transducers and interfaces as upgrades or improvements. Such upgrades ease installation, perform self-test...

PC-based Machine-tool Controller Implemented as Testbed for Smart Transducer Interface

January 1, 1996

Author(s)

Kang B. Lee, Richard D. Schneeman, R Gavin, L Fronczeck

Time and Polarization Resolved Ultrasonic Testing of Materials

January 1, 1996

Author(s)

Gerald V. Blessing, D Xiang, Nelson N. Hsu

We have developed a transducer which allows the benefits of Line Focus Beam (LFB) acoustic microscopy to be realized over large areas, using a conventional...

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