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Conferences

Novel Radiochromic Films for Clinical Dosimetry

January 1, 1996

Author(s)

W L. Mclaughlin, James M. Puhl, M Al-sheikhly, C A. Christou, A Miller, A Kov{aacute}cs, L Wojn{aacute}rovits, D F. And lewis

Proposed IEEE-P1451.3 Mixed-mode Smart Transducer Interface

January 1, 1996

Author(s)

S Chen, Kang B. Lee

Various transducer companies offer proprietary smart transducers and interfaces as upgrades or improvements. Such upgrades ease installation, perform self-test

Hot Particle Intercomparison Dosimetry

January 1, 1996

Author(s)

D G. Kaurin, J W. Baum, M W. Charles, D P. Darley, J S. Durham, M J. Scannell, Christopher G. Soares

PC-based Machine-tool Controller Implemented as Testbed for Smart Transducer Interface

January 1, 1996

Author(s)

Kang B. Lee, Richard D. Schneeman, R Gavin, L Fronczeck

The Russian-American Gallium Experiment Cr-Neutrino Source Measurement, ed. by M. Baldo-Ceolin

January 1, 1996

Author(s)

J N. Abdurashitov, Jeffrey S. Nico

Time and Polarization Resolved Ultrasonic Testing of Materials

January 1, 1996

Author(s)

Gerald V. Blessing, D Xiang, Nelson N. Hsu

We have developed a transducer which allows the benefits of Line Focus Beam (LFB) acoustic microscopy to be realized over large areas, using a conventional

Recent Results from SAGE, ed. by M. Baldo-Ceolin

January 1, 1996

Author(s)

J N. Abdurashitov, Jeffrey S. Nico

Lithographic Antennas for Submillimeter and Infrared Frequencies

December 31, 1995

Author(s)

Erich N. Grossman

MEMS in Standard CMOS VLSI Technology

December 31, 1995

Author(s)

Michael Gaitan

Wire Bonding to Multichip Modules and Other Soft Substrates

December 31, 1995

Author(s)

George G. Harman

Measurement of Patterned Film Linewidth for Interconnect Characterization

December 31, 1995

Author(s)

Loren W. Linholm, Richard A. Allen, Michael W. Cresswell, Rathindra Ghoshtagore, Santos D. Mayo, Harry A. Schafft, John A. Kramar, E C. Teague

TDDB Characterization of Thin SiO₂ Films With Bimodal Failure Populations

December 31, 1995

Author(s)

J. Prendergast, John S. Suehle, P Chaparala, E. Murphy, M. Stephenson

High-Power, High-Frequency Oscillators Using Distributed Josephson-Junction Arrays

December 31, 1995

Author(s)

P. A. Booi, Samuel Benz

Mesoscopic Conductance Fluctuations in Large Devices

December 31, 1995

Author(s)

Curt A. Richter, David G. Seiler, Joseph G. Pellegrino

Selected Area Deposition of Multiple Active Films for Conductometric Microsensor Arrays

December 31, 1995

Author(s)

Stephen Semancik, Richard E. Cavicchi, John S. Suehle, Kenneth G. Kreider, P Chaparala

Effect of Implant Dose on Formation of Buried Oxide Si Islands in Low-Dose SIMOX

December 31, 1995

Author(s)

S. Bagchi, J. H. Lee, S. J. Krause, Peter Roitman

Novel Magnetic Field Characterization Techniques for Compound Semiconductor Materials and Devices

December 31, 1995

Author(s)

Curt A. Richter, David G. Seiler, Joseph G. Pellegrino, W. F. Tseng, W. R. Thurber

Business and Manufacturing Motivations for the Development of Analytical Technology and Metrology for Semiconductors

December 31, 1995

Author(s)

Thomas J. Shaffner, Alain C. Diebold, R. C. McDonald, David G. Seiler, W M. Bullis

2D-Scanning Capacitance Microscopy Measurement of Cross-Sectional VLSI Test Structures

December 31, 1995

Author(s)

G. Neubauer, A. Erickson, C. C. Williams, Joseph Kopanski, M. Rodgers, D. Adderton

Time-Dependent Dielectric Breakdown in Thin Intrinsic SiO₂ Films

December 31, 1995

Author(s)

John S. Suehle, P Chaparala

Characterization of Two-Dimensional Dopant Profiles: Status and Review

December 31, 1995

Author(s)

Alain C. Diebold, M. Kump, Joseph Kopanski, David G. Seiler

OBIC Analysis of Stressed, Thermally Isolated Polysilicon Resistors

December 31, 1995

Author(s)

E. I. Cole, John S. Suehle, K. A. Peterson, P Chaparala, A. N. Campbell, E. S. Snyder, D T. Pierce

A New Physics-Based Model for Time-Dependent-Dielectric-Breakdown

December 31, 1995

Author(s)

B. Schlund, John S. Suehle, C. Messick, P Chaparala

CMOS Circuit Design for Controlling Temperature in Micromachined Devices

December 31, 1995

Author(s)

C. A. Zincke, Michael Gaitan, Mona E. Zaghloul

Optical Characterization of Materials and Devices for the Semiconductor Industry: Trends and Needs

December 31, 1995

Author(s)

S. Perkowitz, David G. Seiler, W M. Bullis

Double-Modulation and Selective Excitation Photoreflectance for Wafer-Level Characterization of Quantum-Well Laser Structures

December 31, 1995

Author(s)

Deane Chandler-Horowitz, David W. Berning, Joseph G. Pellegrino, John H. Burnett, Paul M. Amirtharaj, D. P. Bour, D. W. Treat

Electrical Characterization of Narrow Gap n-type Bulk HgCdTe Single Crystals by Variable-Magnetic-Field Hall Measurements and Reduced-Conductivity-Tensor Analyses

December 31, 1995

Author(s)

Jin S. Kim, David G. Seiler, R. A. Lancaster, M. B. Reine

Scanning Capacitance Microscopy Measurements and Modeling: Progress Towards Dopant Profiling of Silicon

December 31, 1995

Author(s)

Joseph Kopanski, Jay F. Marchiando, J R. Lowney

High-Accuracy Principal-Angle Scanning Spectroscopic Ellipsometry of Semiconductor Interfaces

December 31, 1995

Author(s)

Nhan Van Nguyen, Deane Chandler-Horowitz, Joseph G. Pellegrino, Paul M. Amirtharaj

Micromachined Display Output for a Cellular Neural Network

December 31, 1995

Author(s)

R. Yentis, C. A. Zincke, Mona E. Zaghloul, Michael Gaitan

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