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NIST Comparison of the Quantized Hall Resistance and the Realization of the SI Ohm Through the Calculable Capacitor

Published

Author(s)

Anne-Marie Jeffery, Randolph Elmquist, Lai H. Lee, John Q. Shields, Ronald F. Dziuba
Proceedings Title
Tech. Dig., Conf. on Precision Electromagnetic Measurements
Conference Dates
June 17-20, 1996
Conference Location
Braunschweig, 1, GM

Citation

Jeffery, A. , Elmquist, R. , Lee, L. , Shields, J. and Dziuba, R. (1996), NIST Comparison of the Quantized Hall Resistance and the Realization of the SI Ohm Through the Calculable Capacitor, Tech. Dig., Conf. on Precision Electromagnetic Measurements, Braunschweig, 1, GM, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=24763 (Accessed April 18, 2024)
Created May 31, 1996, Updated October 12, 2021