Nashman, M.
, Hong, T.
, Rippey, W.
and Herman, M.
(1996),
An Integrated Vision Touch-Probe System for Dimensional Inspection Tasks, Proceedings of the SME Applied Machine Vision ''96 Conference, Cincinnati, OH, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=820549
(Accessed October 13, 2024)
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An Integrated Vision Touch-Probe System for Dimensional Inspection Tasks
Published
Author(s)
M Nashman, , ,
Abstract
VisionProceedings Title
Proceedings of the SME Applied Machine Vision ''96 Conference
Conference Dates
June 3-6, 1996
Conference Location
Cincinnati, OH, USA
Pub Type
Conferences
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Citation
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If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created June 5, 1996, Updated October 12, 2021