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An Integrated Vision Touch-Probe System for Dimensional Inspection Tasks

Published

Author(s)

M Nashman, Tsai H. Hong, William G. Rippey, Martin Herman

Abstract

Vision
Proceedings Title
Proceedings of the SME Applied Machine Vision ''96 Conference
Conference Dates
June 3-6, 1996
Conference Location
Cincinnati, OH, USA

Citation

Nashman, M. , Hong, T. , Rippey, W. and Herman, M. (1996), An Integrated Vision Touch-Probe System for Dimensional Inspection Tasks, Proceedings of the SME Applied Machine Vision ''96 Conference, Cincinnati, OH, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=820549 (Accessed May 30, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created June 5, 1996, Updated October 12, 2021