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SEMCconductors Resistivity Measurements Using Split-Dielectric Resonator Technique

Published

Author(s)

Jerzy Krupka, S. Pietruszko, Richard G. Geyer, James R. Baker-Jarvis, Kristof Derzakowski
Proceedings Title
Proc., Intl. Microwave Conf. MIKON
Conference Dates
May 27-30, 1996
Conference Location
Warsaw, 1, PL

Citation

Krupka, J. , Pietruszko, S. , Geyer, R. , Baker-Jarvis, J. and Derzakowski, K. (1996), SEMCconductors Resistivity Measurements Using Split-Dielectric Resonator Technique, Proc., Intl. Microwave Conf. MIKON, Warsaw, 1, PL (Accessed February 22, 2024)
Created April 30, 1996, Updated October 12, 2021