TY  - CONF
AU  - Jerzy Krupka
AU  - S. Pietruszko
AU  - Richard Geyer
AU  - James Baker-Jarvis
AU  - Kristof Derzakowski
C2  - Proc., Intl. Microwave Conf. MIKON, Warsaw, 1, PL
DA  - 1996-05-01 00:05:00
LA  - en
PB  - Proc., Intl. Microwave Conf. MIKON, Warsaw, 1, PL
PY  - 1996
TI  - SEMCconductors Resistivity Measurements Using Split-Dielectric Resonator Technique
ER  -