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Conferences

Uncertainty Procedure for NIST Surface Finish and Microform Calibration

January 1, 1996

Author(s)

Jun-Feng Song, Theodore V. Vorburger

An uncertainty procedure is used for reporting the NIST surface finish and microform calibration uncertainties. The combined standard uncertainty is a...

Optical Overlay Metrology at NIST

January 1, 1996

Author(s)

Richard M. Silver, Amy Singer, L Carroll, S Berg-cross, James E. Potzick

Many of the significant challenges in making accurate overlay registration measurements are discussed. An understanding of the causes of the errors affecting...

Accurate measurements of the local deuterium abundance from HST spectra, ed. by M. Kafatos and Y. Kondo

January 1, 1996

Author(s)

J L. Linsky

Electron-ion collisions processes

January 1, 1996

Author(s)

G H. Dunn

Application of Laser-Cooled Ions to Frequency Standards and Metrology

January 1, 1996

Author(s)

David J. Wineland, James C. Bergquist, D J. Berkeland, John J. Bollinger, F C. Cruz, Wayne M. Itano, Branislav M. Jelenkovic, B E. King, D M. Meekhof, J D. Miller, C Monroe, Joseph N. Tan

A Simple Algorithm for Approximating Confidence on the Modified Allan Variance and the Time Variance

January 1, 1996

Author(s)

Marc A. Weiss, C. A. Greenhall

Confidence on the Modified Allan Variance and the Time Variance

January 1, 1996

Author(s)

Marc A. Weiss, F L. Walls, C. A. Greenhall, T Walter

Two-Way Time and Frequency Transfer in SONET

January 1, 1996

Author(s)

Marc A. Weiss, Steven R. Jefferts, Judah Levine, S Dilla, E W. Bell, Thomas E. Parker

Improving the NIST Ionospheric Measurement System

January 1, 1996

Author(s)

Marc A. Weiss, Steven R. Jefferts, L Gaudron

Time and Frequency Metrology

January 1, 1996

Author(s)

Donald Sullivan, Judah Levine

The Evaluation of NIST-7: A New Era

January 1, 1996

Author(s)

Jon H. Shirley, W D. Lee, Robert E. Drullinger

Velocity Distributions from the Fourier Transforms at Ramsey Lineshapes

January 1, 1996

Author(s)

Jon H. Shirley

Recent Improvements in the Performance of the NIST AT1 Time Scale

January 1, 1996

Author(s)

Thomas E. Parker, Judah Levine

Extending the Range for Precision AM Noise Measurements

January 1, 1996

Author(s)

Craig W. Nelson, F L. Walls, C K. Boggs

Computer Timekeeping

January 1, 1996

Author(s)

Michael A. Lombardi

Time and Frequency Activities at NIST

January 1, 1996

Author(s)

Judah Levine, Donald Sullivan

Advances in Primary Frequency Standards

January 1, 1996

Author(s)

W D. Lee

A 1 GHz Diode Laser-Driven Optical-Delay-Line Oscillator

January 1, 1996

Author(s)

John E. Kitching, Leo W. Hollberg, F L. Walls

Two-Way Time Transfer Through SDH and SONET Systems

January 1, 1996

Author(s)

Steven R. Jefferts, Marc A. Weiss, Judah Levine, S Dilla

The Effect of Drift on TOTALDEV

January 1, 1996

Author(s)

David A. Howe, K J. Lainson

NIST-7, The US Primary Frequency Standard: New Evaluation Techniques

January 1, 1996

Author(s)

Robert E. Drullinger, Jon H. Shirley, W D. Lee

DBR Laser Diodes for Optically Pumped Cs Frequency Standards

January 1, 1996

Author(s)

Robert E. Drullinger, D A. Jennings, W D. Lee, J M. Lopez-romero

Analytical Applications of Fourier Transform Microwave (FTMW) Spectroscopy to Trace Gas Analysis

January 1, 1996

Author(s)

R D. Suenram, Francis J. Lovas, J U. Grabow, Angela R. Hight Walker, C Lugez, P M. Chu

Simulating X-ray Fluorescence in Graphite and Boron Nitride

January 1, 1996

Author(s)

Eric L. Shirley

Color Centers in LiF for Measurement of Absorbed Doses up to 100 MGy

January 1, 1996

Author(s)

W L. Mclaughlin

NIST Commitment to National MQA Programs

January 1, 1996

Author(s)

Randall S. Caswell

The Effect of Formulation Changes on the Response to Ultraviolet and Ionizing Radiation of Radiochromic Dye Films

January 1, 1996

Author(s)

M Barcelo, R M. Uribe, W L. Mclaughlin, G Belmont

Short Period (

January 1, 1996

Author(s)

J Pedulla, R Deslattes

Integral Equation for Scattering by a Rough Surface

January 1, 1996

Author(s)

Egon Marx

An equation for an unknown surface field that represents scattering by a rough patch on a flat dielectric surface is presented. The geometrical considerations...

New NIST-Certified Length Microscale

January 1, 1996

Author(s)

James E. Potzick

The National Institute of Standards and Technology is developing a simple one-dimension certified pitch standard (or scale) covering the range 1 um to 10 mm...

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