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Conferences

Comparison of 1/f PM Noise in Commercial Amplifiers

January 1, 1997

Author(s)

M C. Delgado Aramburo, Eva Ferre-Pikal, F L. Walls, Huascar Ascarrunz

International Comparisons using Round-robin Thermometers Organized by NRLM in the Last Four Years, ed. by Z. Baoyu, H. Lide, and Z. Xiaona

January 1, 1997

Author(s)

F Sakuma, H Sakate, B. Carol Johnson, Charles E. Gibson, Graham Machin, T Ricolfi, M Battuello, Fischer j

Radiative Calibration of Heat flux Sensors at NIST - an Overview

January 1, 1997

Author(s)

A V. Murthy, Benjamin K. Tsai

Transfer Calibration of Heat Flux Sensors at NIST

January 1, 1997

Author(s)

A V. Murthy, Benjamin K. Tsai

Characterization of Multi-phase and Multi-component Polymers using the Atomic Force Microscope

January 1, 1997

Author(s)

Mark R. VanLandingham, John S. Villarrubia, G Meyers, M Dineen

Abstract not available.

Hydrogen-Bond and Vibrational Up-Pumping Studied by Broadband Transient Infrared Spectroscopy, ed. by W. Woodruff

January 1, 1997

Author(s)

S M. Arrivo, T P. Dougherty, W T. Grubbs, Edwin J. Heilweil

Microheating Elements in CMOS Technology

December 31, 1996

Author(s)

Michael Gaitan

Measurements of Fracture Strength and Young's Modulus of Surface-Micromachined Polysilicon

December 31, 1996

Author(s)

David T. Read, Janet M. Cassard

Time-Dependent Dielectric Breakdown of Intrinsic SiO₂ Films Under Dynamic Stress

December 31, 1996

Author(s)

P Chaparala, John S. Suehle, C. Messick, M. Roush

Scanning Capacitance Microscopy Measurements and Modeling for Dopant Profiling of Silicon

December 31, 1996

Author(s)

Joseph Kopanski, Jay F. Marchiando, J R. Lowney

Natural Convection from an Array of Electronic Packages Mounted on a Horizontal Board in a Narrow Aspect Ratio Enclosure

December 31, 1996

Author(s)

V. H. Adams, Yogendra K. Joshi, David L. Blackburn

Hybrid Optical-Electrical Overlay Test Structure

December 31, 1996

Author(s)

Michael W. Cresswell, Richard A. Allen, Loren W. Linholm, William F. Guthrie, A. W. Gurnell

MOCVD of SnO₂ on Silicon Microhotplate Arrays for Use in Gas Sensing Applications

December 31, 1996

Author(s)

F. DiMeo, Stephen Semancik, Richard E. Cavicchi, John S. Suehle, P Chaparala, N. H. Tea

IGBT Half-Bridge Shoot-Through Characterization for Model Validation

December 31, 1996

Author(s)

David W. Berning, Allen R. Hefner Jr.

A circuit is described for making a variety of measurements on half-bridge Insulated Gate Bipolar Transistor (IGBT) pairs for validating IGBT models. The