Geyer, R.
(1997),
Complex Permittivity Measurements of Extremely Low Loss Dielectric Materials Using Whispering Gallery Modes, Tech. Dig., IEEE MTT-S International Microwave Symposium, Denver, CO
(Accessed March 2, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Complex Permittivity Measurements of Extremely Low Loss Dielectric Materials Using Whispering Gallery Modes
Published
Author(s)
Proceedings Title
Tech. Dig., IEEE MTT-S International Microwave Symposium
Conference Dates
June 8-12, 1997
Conference Location
Denver, CO
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created June 1, 1997, Updated February 19, 2017