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Complex Permittivity Measurements of Extremely Low Loss Dielectric Materials Using Whispering Gallery Modes

Published

Author(s)

Richard G. Geyer
Proceedings Title
Tech. Dig., IEEE MTT-S International Microwave Symposium
Conference Dates
June 8-12, 1997
Conference Location
Denver, CO

Citation

Geyer, R. (1997), Complex Permittivity Measurements of Extremely Low Loss Dielectric Materials Using Whispering Gallery Modes, Tech. Dig., IEEE MTT-S International Microwave Symposium, Denver, CO (Accessed March 1, 2024)
Created June 1, 1997, Updated February 19, 2017