Geyer, R.
(1997),
Complex Permittivity Measurements of Extremely Low Loss Dielectric Materials Using Whispering Gallery Modes, Tech. Dig., IEEE MTT-S International Microwave Symposium, Denver, CO
(Accessed March 13, 2025)
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Complex Permittivity Measurements of Extremely Low Loss Dielectric Materials Using Whispering Gallery Modes
Published
Author(s)
Proceedings Title
Tech. Dig., IEEE MTT-S International Microwave Symposium
Conference Dates
June 8-12, 1997
Conference Location
Denver, CO
Pub Type
Conferences
Citation
Issues
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Created June 1, 1997, Updated February 19, 2017