TY  - CONF
AU  - Richard Geyer
C2  - Tech. Dig.,   IEEE MTT-S International Microwave Symposium, Denver, CO
DA  - 1997-06-01
LA  - en
PB  - Tech. Dig.,   IEEE MTT-S International Microwave Symposium, Denver, CO
PY  - 1997
TI  - Complex Permittivity Measurements of Extremely Low Loss Dielectric Materials Using Whispering Gallery Modes
ER  -