Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Conferences

Photomask Metrology in the Era of Neolithography

February 1, 1997

Author(s)

James E. Potzick

The appearance of smaller photomask feature sizes, high density patterns, and optical enhancements such as phase shifters and OPC features, and the increasing

Using Incandescent Lamp Failure Levels for Assessment of the Surge Environment

February 1, 1997

Author(s)

H. Bachl, Francois D. Martzloff, D. Nastasi

Models for Integrating Scheduling and Shop Floor Data Collection

February 1, 1997

Author(s)

Frank H. Riddick, V. Lourenco

Increasing shop floor efficiency through scheduling has become one of the major concerns of manufacturing companies. Two of the problems that manufacturers have

The NIST Electronic Kilogram

January 1, 1997

Author(s)

David B. Newell, K Fujii, Andrew Gillespie, P. T. Olsen, Alain Picard, Richard L. Steiner, Gerard N. Stenbakken, Edwin R. Williams

The Calculation of CMM Measurement Uncertainty via The Method of Simulation by Constraints

January 1, 1997

Author(s)

Steven D. Phillips, Bruce R. Borchardt, Daniel S. Sawyer, William T. Estler, David E. Ward, K Eberhardt, M. Levenson, Marjorie A. McClain, B Melvin, Ted Hopp, Y Shen

The calculation of task specific measurement uncertainty when using coordinate measuring machines is an important and challenging task. Current methods to

Total Variance: A Progress Report on a New Frequency Stability Characterization

January 1, 1997

Author(s)

David A. Howe, C. A. Greenhall

Virtual Supply Chain Management: A Re-Engineering Approach Using Discrete Event Simulation

January 1, 1997

Author(s)

Shigeki Umeda, Albert W. Jones

Modern manufacturing enterprises must collaborate with a large number of suppliers to design and produce their products. Management of these supply chains is

New NIST-Certified Small Scale Pitch Standard

January 1, 1997

Author(s)

James E. Potzick

The National Institute of Standards and Technology is developing a dimensional pitch standard covering the range 1 ?m to 10 mm, intended for the calibration of

Methods of Improving the Estimation of Long-Term Frequency Variance

January 1, 1997

Author(s)

David A. Howe

Establishing a Common Rockwell Hardness Scale Using Geometrically Calibrated Standard Diamond Indenters

January 1, 1997

Author(s)

Jun-Feng Song

Recently developed microform measurement techniques have reduced the measurement uncertainties in the geometry of Rockwell diamond indenters. In this paper, we

Finish and Figure Metrology for Soft Xray Optics

January 1, 1997

Author(s)

Theodore V. Vorburger, Christopher J. Evans, V W. Tsai, Joseph Fu, E. C. Williams, Ronald G. Dixson, P Sullivan, T. McWaid

Abstract not available.

In-Chamber Thermometry Calibration using a Silicon Proof-Wafer

January 1, 1997

Author(s)

Benjamin K. Tsai, Francis J. Lovas, D P. DeWitt, K G. Kreider, G W. Burns, David W. Allen

Integral Equations for Scattering by a Particle in a Layer

January 1, 1997

Author(s)

Egon Marx

The single integral equation method is applied to the scattering of electromagnetic waves by particles in a layer on top of a substrate. A second layer on top

The dynamics of chip formation in machining

January 1, 1997

Author(s)

Matthew A. Davies, Christopher J. Evans, Timothy J. Burns

In this paper, we provide experimental, numerical and analytical evidence suggesting that the onset of segmented chip formation is the result of a Hopf

Improved Matrix Method for Tristimulus Colorimetry of Displays

January 1, 1997

Author(s)

Yoshihiro Ohno, Jonathan E. Hardis

Finish and Figure Metrology for Soft X-ray Optics

January 1, 1997

Author(s)

T Mcwaid

The performance of high quality optics relies heavily on their geometrical properties of surface finish and figure. The surface finish consists of the short

The Dynamics of Chip Segmentation in Machining

January 1, 1997

Author(s)

Matthew A. Davies, Christopher J. Evans, Timothy J. Burns

Improved Photometric and Colorimetric Calibrations at NIST

January 1, 1997

Author(s)

Yoshihiro Ohno, M Navarro

Workshop Discussion: A Framework for Standards Development and the Future of the IASPM Workshops

January 1, 1997

Author(s)

John A. Dagata

A proposal to develop the Industrial Applications of Scanned Probe Microscopy (IASPM) workshops, which NIST has co-sponsored with Sematech, the ASTM E42.14

The Guidelines for Expressing Measurement Uncertainties and the 4:1 Test Uncertainty Ratio

January 1, 1997

Author(s)

Jun-Feng Song

In 1988, MIL-STD-45662A adopted the 4:1 Test Uncertainty Ratio (TUR); this was later incorporated into the ANSI/NCSL Z540-1 standard in 1994. However, in 1992