Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Conferences

Obtaining the Unit of Capacitance from the Calculable Capacitor at the National Institute of Standards and Technology (NIST)

July 1, 1997

Author(s)

Anne-Marie Jeffery

Microstuctural Characterization of Hardened Steel by Nondestructive Methods

July 1, 1997

Author(s)

P T. Purtscher, B Igarashi, Donna C. Hurley, K W. Hollman

This paper describes the application of a variety of methods to the nondesctructive characterization (NDC) of microstructure in hardened steels. The...

Writing a Tcl Extension in Only Seven Years

July 1, 1997

Author(s)

Don E. Libes

Tcl is a command language library for embedding into other applications. It is often touted as the best language for this purpose and it is only natural that...

Managing Tcl's Namespaces Collaboratively

July 1, 1997

Author(s)

Don E. Libes

The NIST Identifier Collaboration Service (NICS) is a proposed service to encourage collaboration among researchers and developers when choosing identifiers...

Quiet-Zone Evaluation Using a Spherical Synthetic-Aperture

July 1, 1997

Author(s)

Ronald C. Wittmann, David R. Black

Improvements in the Properties of Internal-Tin Nb₃SN Strands

July 1, 1997

Author(s)

E. A. Gregory, E Gulko, T Pyon, Loren F. Goodrich

Josephson Standards for AC Voltage Metrology

July 1, 1997

Author(s)

Samuel Benz, Clark A. Hamilton, Charles J. Burroughs, Laurie Christian

Translational Kinetic-Energy Distributions of Positive Ions Produced in Townsend Discharges of SF6 at High Electric Field-To-Gas Density Ratios (E/N)

July 1, 1997

Author(s)

MVVS. Rao, James K. Olthoff, Richard J. Van Brunt

Negative Ion-Energy Distributions and Ion-Neutral Reactions in SF6 Townsend Discharges at High Electric Field-To-Gas Density Ratios (E/N)

July 1, 1997

Author(s)

MVVS. Rao, James K. Olthoff, Richard J. Van Brunt

Electron Interactions with CCl2F2

July 1, 1997

Author(s)

Loucas G. Christophorou, James K. Olthoff, Yicheng Wang

Test Patterns and Quality Metrics for Digital Video Compression

July 1, 1997

Author(s)

Charles D. Fenimore, B. F. Field, C. T. Van Degrift

Calibration of Polarimetric Radar Systems

July 1, 1997

Author(s)

Lorant A. Muth, Ronald C. Wittmann

Nonideal Measurement Locations in Planar Near-Field Antenna Metrology

July 1, 1997

Author(s)

Ronald C. Wittmann, Bradley Alpert, Michael H. Francis

Measurement Assurance and Certification of Radar Cross Section Measurements

July 1, 1997

Author(s)

Lorant A. Muth, Ronald C. Wittmann, B. M. Kent

Measurement of Heat Conduction Through Stacked Screens

July 1, 1997

Author(s)

T Kuriyama, F Kuriyama, Michael A. Lewis, Ray Radebaugh

This paper describes the experimental apparatus for the measurement of heat conduction through stacked screens as well as some experimental results taken with...

Analysis of Variability in the Design of Wood Products Under Imprecision

July 1, 1997

Author(s)

Ronald Giachetti, R Young

The design and analysis of many products is performed with imprecisely known parameters, relationships, and environmental conditions. This is especially true...

A Method to Characterize Overlay Tool Misalignments and Distortions

July 1, 1997

Author(s)

Richard M. Silver, James E. Potzick, Fredric Scire, Christopher J. Evans, Michael L. McGlauflin, Edward A. Kornegay, Robert D. Larrabee

A new optical alignment artifact under development at NIST is described. This structure, referred to as a stepped microcone, is designed to assist users and...

Fourier Transform Feedback for Scanning Electron Microscopes Used in Semiconductor Metrology

July 1, 1997

Author(s)

Michael T. Postek, Andras Vladar, M P. Davidson

The utility of the sharpness concept for use on metrology scanning electron microscopes (SEM) as implemented through the Fourier transform technique has been...

Dimensional Metrology at the Nanometer Level: Combined SEM and PPM

July 1, 1997

Author(s)

Michael T. Postek, H Ho, L Harrison

The National Institute of Standards and Technology (NIST) is currently exploring the potentials afforded by the incorporation of a commercial proximal probe...

Statistical Measure for the Sharpness of the SEM Image

July 1, 1997

Author(s)

Nien F. Zhang, Michael T. Postek, Robert D. Larrabee

Fully automated or semi-automated scanning electron microscopes (SEM) are now commonly used in semiconductor production and other forms of manufacturing...

Optical Radiation Detectors for Laser Measurements: Survey and Tutorial

July 1, 1997

Author(s)

John H. Lehman, Thomas Scott

What Does it Take to Make Good Things Happen?

June 27, 1997

Author(s)

J E. Snell

The theme of this symposium is fire risk and hazard assessment research application. We tend to focus on the tools which in themselves are means to some end...

Computer Simulations of Ultrasonic Flow Meter Performance in Ideal and Non-Ideal Pipeflows

June 22, 1997

Author(s)

Tsyh Tyan Yeh, G E. Mattingly

High-Differential-Pressure Laminar Flowmeter

June 22, 1997

Author(s)

S A. Tison, L Berndt

Surveying Through Solid Walls

June 8, 1997

Author(s)

William C. Stone

A good metrology system in the automated environment must (1) measure the three dimensional position and attitude of any component to a reasonable degree of...

Embedded multiconductor transmission line characterization

June 8, 1997

Author(s)

Dylan F. Williams

This paper presents a measurement method that characterizes lossy printed multiconductor transmission lies embedded in transitions, connectors, or packages with...

Impact of Recent Advances in Synthesis & Processing of Ceramic Superconductors, American Ceramic Society High Temperature Superconductor Symposium Volume

June 5, 1997

Author(s)

Winnie K. Wong-Ng, U Balachandran, A S. Bhalla

The contents of this volume comprise the proceedings of the 1997 high Temperature Superconductor Symposium titled Impact of Recent Advances in synthesis and...

Design of a Vapor-Liquid Equilibrium, Surface Tension, and Density Apparatus

June 1, 1997

Author(s)

C D. Holcomb, Stephanie L. Outcalt

Evaluation of Seismic Performance Parameters

June 1, 1997

Author(s)

Hai S. Lew

Recent earthquakes have shown that buildings designed for life safety could sustain severe damage to structural and nonstructural elements and building contents...

Permittivity Characterization from Transmission-Line Measurement

June 1, 1997

Author(s)

Michael D. Janezic, Dylan F. Williams

We analyze three accurate broadband techniques for measuring the complex permittivity of dielectric substrates using coplanar waveguide transmission-line...

Was this page helpful?