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Conferences

The Extraction of Electrical Material Properties Using a Free-Space Time-Domain RF Absorber Reflectivity Measurement System

August 1, 1997

Author(s)

Robert T. Johnk, Arthur Ondrejka

Use of Polycapillary Optics to Increase the Effective Area of Microcalorimeter Spectrometers

August 1, 1997

Author(s)

David A. Wollman, C. Jezewski, Gene C. Hilton, Xiao Qi-Fan, Kent D. Irwin, John M. Martinis

Improvements in the CW Evaluation of Mode-Stirred Chambers

August 1, 1997

Author(s)

John M. Ladbury, Galen H. Koepke, Dennis G. Camell

Packaging Hygroscopic and Stress-Sensitive Optics for a Standard Retarder

August 1, 1997

Author(s)

Allen Rose, Kent B. Rochford

Measurement and Analysis of Quasi-Static Hexapod Errors

July 17, 1997

Author(s)

Johannes A. Soons

This paper describes the measurement and analysis of the quasi-static errors of a prototype hexapod milling machine at NIST

Force Measurement Services at NIST: Equipment, Procedures, and Uncertainty

July 17, 1997

Author(s)

Thomas W. Bartel, Ricky L. Seifarth, Simone L. Yaniv

The facilities, instrumentation, and procedures currently used at the National Institute of Standards and Technology (NIST) for force measurement services are...

The NIST Automated Arch Welding Testbed

July 11, 1997

Author(s)

William G. Rippey, Joseph A. Falco

Welding, Robotics & Intelligent Systems

Advanced Methods and Models for Describing Coating Appearance

July 7, 1997

Author(s)

M E. McKnight, Jonathan W. Martin

The National Institute of Standards and Technology has recently initiated a study to advance appearance metrology. A systems approach which applies...

Negative Ion Kinetic-Energy Distributions and Ion-Neutral Reactions in O2 and CO2 Townsend Discharges at High E/N

July 1, 1997

Author(s)

MVVS. Rao, James K. Olthoff, Loucas G. Christophorou, Richard J. Van Brunt

Kinetic-Energy Distributions of Positive Ions Produced in Townsend Discharges of Oxygen at High Electric Field-to-Gas Density Ratios

July 1, 1997

Author(s)

MVVS. Rao, Richard J. Van Brunt, James K. Olthoff

Atomic Collisions in Ultracold Atomic Gases

July 1, 1997

Author(s)

Paul S. Julienne, Kevin Jones, Paul D. Lett, William D. Phillips, Eite Tiesinga, U Volz, Carl J. Williams

Cold collisions between trapped atoms are very important in the context of Bose-Einstein condensation. The meaning of the scattering length, and its...

Characterization of the Coherent Microwave Emission From the Surf II Synchrotron Storage Ring

July 1, 1997

Author(s)

Gerald T. Fraser, Angela R. Hight Walker, Thomas B. Lucatorto, Uwe Arp, K. K. Lehmann

The temporal profile and frequency spectrum of the microwave emission from the Synchrotron Ultraviolet Radiation Facility [SURF II] electron storage ring at the...

Obtaining the Unit of Capacitance from the Calculable Capacitor at the National Institute of Standards and Technology (NIST)

July 1, 1997

Author(s)

Anne-Marie Jeffery

Microstuctural Characterization of Hardened Steel by Nondestructive Methods

July 1, 1997

Author(s)

P T. Purtscher, B Igarashi, Donna C. Hurley, K W. Hollman

This paper describes the application of a variety of methods to the nondesctructive characterization (NDC) of microstructure in hardened steels. The...

Writing a Tcl Extension in Only Seven Years

July 1, 1997

Author(s)

Don E. Libes

Tcl is a command language library for embedding into other applications. It is often touted as the best language for this purpose and it is only natural that...

Managing Tcl's Namespaces Collaboratively

July 1, 1997

Author(s)

Don E. Libes

The NIST Identifier Collaboration Service (NICS) is a proposed service to encourage collaboration among researchers and developers when choosing identifiers...

Quiet-Zone Evaluation Using a Spherical Synthetic-Aperture

July 1, 1997

Author(s)

Ronald C. Wittmann, David R. Black

Improvements in the Properties of Internal-Tin Nb₃SN Strands

July 1, 1997

Author(s)

E. A. Gregory, E Gulko, T Pyon, Loren F. Goodrich

Josephson Standards for AC Voltage Metrology

July 1, 1997

Author(s)

Samuel Benz, Clark A. Hamilton, Charles J. Burroughs, Laurie Christian

Translational Kinetic-Energy Distributions of Positive Ions Produced in Townsend Discharges of SF6 at High Electric Field-To-Gas Density Ratios (E/N)

July 1, 1997

Author(s)

MVVS. Rao, James K. Olthoff, Richard J. Van Brunt

Negative Ion-Energy Distributions and Ion-Neutral Reactions in SF6 Townsend Discharges at High Electric Field-To-Gas Density Ratios (E/N)

July 1, 1997

Author(s)

MVVS. Rao, James K. Olthoff, Richard J. Van Brunt

Electron Interactions with CCl2F2

July 1, 1997

Author(s)

Loucas G. Christophorou, James K. Olthoff, Yicheng Wang

Test Patterns and Quality Metrics for Digital Video Compression

July 1, 1997

Author(s)

Charles D. Fenimore, B. F. Field, C. T. Van Degrift

Calibration of Polarimetric Radar Systems

July 1, 1997

Author(s)

Lorant A. Muth, Ronald C. Wittmann

Nonideal Measurement Locations in Planar Near-Field Antenna Metrology

July 1, 1997

Author(s)

Ronald C. Wittmann, Bradley Alpert, Michael H. Francis

Measurement Assurance and Certification of Radar Cross Section Measurements

July 1, 1997

Author(s)

Lorant A. Muth, Ronald C. Wittmann, B. M. Kent

Measurement of Heat Conduction Through Stacked Screens

July 1, 1997

Author(s)

T Kuriyama, F Kuriyama, Michael A. Lewis, Ray Radebaugh

This paper describes the experimental apparatus for the measurement of heat conduction through stacked screens as well as some experimental results taken with...

Analysis of Variability in the Design of Wood Products Under Imprecision

July 1, 1997

Author(s)

Ronald Giachetti, R Young

The design and analysis of many products is performed with imprecisely known parameters, relationships, and environmental conditions. This is especially true...

A Method to Characterize Overlay Tool Misalignments and Distortions

July 1, 1997

Author(s)

Richard M. Silver, James E. Potzick, Fredric Scire, Christopher J. Evans, Michael L. McGlauflin, Edward A. Kornegay, Robert D. Larrabee

A new optical alignment artifact under development at NIST is described. This structure, referred to as a stepped microcone, is designed to assist users and...

Fourier Transform Feedback for Scanning Electron Microscopes Used in Semiconductor Metrology

July 1, 1997

Author(s)

Michael T. Postek, Andras Vladar, M P. Davidson

The utility of the sharpness concept for use on metrology scanning electron microscopes (SEM) as implemented through the Fourier transform technique has been...

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