Blind Estimation of Tip Geometry in Scanned Probe Microscopy
John S. Villarrubia
Broadening of surface protrusions is a well-known imaging artifact in scanned probe microscope topographs. Blind reconstruction is a method for estimating the tip shape from the image of a tip characterizer, without independent knowledge of the characterizer geometry. A description of and a plausibility argument for blind reconstruction are given. A recent development for discriminating against other (non-tip-induced) image artifacts is summarized.
Proceedings of Microscopy and Microanalysis
August 1, 1997
atomic force microscopy, blind reconstruction, scanned probe microscopy, scanning tunneling microscopy, tip artifacts, tip estimation