Villarrubia, J.
(1997),
Blind Estimation of Tip Geometry in Scanned Probe Microscopy, Proceedings of Microscopy and Microanalysis, Unknown, USA
(Accessed February 12, 2026)
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Blind Estimation of Tip Geometry in Scanned Probe Microscopy
Published
Author(s)
Abstract
Broadening of surface protrusions is a well-known imaging artifact in scanned probe microscope topographs. Blind reconstruction is a method for estimating the tip shape from the image of a tip characterizer, without independent knowledge of the characterizer geometry. A description of and a plausibility argument for blind reconstruction are given. A recent development for discriminating against other (non-tip-induced) image artifacts is summarized.Proceedings Title
Proceedings of Microscopy and Microanalysis
Volume
3
Issue
Supplement 2
Conference Dates
August 1, 1997
Conference Location
Unknown, USA
Pub Type
Conferences
Keywords
atomic force microscopy, blind reconstruction, scanned probe microscopy, scanning tunneling microscopy, tip artifacts, tip estimation
Citation
Issues
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Created August 1, 1997, Updated February 19, 2017