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Theodore V. Vorburger, Christopher J. Evans, V W. Tsai, Joseph Fu, E. C. Williams, Ronald G. Dixson, P Sullivan, T. McWaid
Abstract
Abstract not available.
Proceedings Title
Proceedings of Japan Society for Precision Engineering: U.S.-Japan Workshop on Soft X-ray Optics: Technical Challenges, T. Namioka, H. Kinoshita, and K. Ito, Editors
Vorburger, T.
, Evans, C.
, Tsai, V.
, Fu, J.
, , E.
, Dixson, R.
, Sullivan, P.
and McWaid, T.
(1997),
Finish and Figure Metrology for Soft X­ray Optics, Proceedings of Japan Society for Precision Engineering: U.S.-Japan Workshop on Soft X-ray Optics: Technical Challenges, T. Namioka, H. Kinoshita, and K. Ito, Editors, Tokyo, -1
(Accessed October 13, 2025)