Fenimore, C.
, Field, B.
and Van Degrift, C.
(1997),
Test Patterns and Quality Metrics for Digital Video Compression, Proc. Intl. Soc. for Optical Engineering (SPIE) Conf. on Human Vision and Electronic Imaging II, San Jose, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=29638
(Accessed April 29, 2025)
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Test Patterns and Quality Metrics for Digital Video Compression
Published
Author(s)
, B. F. Field, C. T. Van Degrift
Proceedings Title
Proc. Intl. Soc. for Optical Engineering (SPIE) Conf. on Human Vision and Electronic Imaging II
Conference Dates
February 10-13, 1997
Conference Location
San Jose, CA
Pub Type
Conferences
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Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created June 30, 1997, Updated October 12, 2021