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Test Patterns and Quality Metrics for Digital Video Compression

Published

Author(s)

Charles D. Fenimore, B. F. Field, C. T. Van Degrift
Proceedings Title
Proc. Intl. Soc. for Optical Engineering (SPIE) Conf. on Human Vision and Electronic Imaging II
Conference Dates
February 10-13, 1997
Conference Location
San Jose, CA

Citation

Fenimore, C. , Field, B. and Van Degrift, C. (1997), Test Patterns and Quality Metrics for Digital Video Compression, Proc. Intl. Soc. for Optical Engineering (SPIE) Conf. on Human Vision and Electronic Imaging II, San Jose, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=29638 (Accessed June 4, 2023)
Created June 30, 1997, Updated October 12, 2021