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Conferences

Mean-Field-Scaling in Lattice Boltzmann Fluid Mixtures

June 1, 1999

Author(s)

Nicos Martys, Jack F. Douglas

Basic equilibrium properties of Lattice Boltzmann (LB) fluid mixtures (coexistence curve, surface tension, and interfacial profile) are calculated to...

Performance of Tape-Bonded Seams of EPDM Membranes: Resistance to Peel-Creep

June 1, 1999

Author(s)

Walter J. Rossiter Jr, M Vangel, K M. Kraft

This paper provides a summary of the major results of an industry-government consortium study on the creep resistance of tape-bonded seams of EPDM roof...

Comparison of Wind Loading Estimates Based on Extreme Speeds and Squares of Extreme Speeds

June 1, 1999

Author(s)

Emil Simiu, A N. Heckert, James J. Filliben

The hypothesis that better estimates of wind force extremes are obtained by analyzing time series of squares of wind speeds, rather than time series of wind...

Calibration of Thin-Film Thermocouples on Silicon Wafers

June 1, 1999

Author(s)

Kenneth G. Kreider, Dean C. Ripple, D P. DeWitt

Thin-film thermocouples (TFTCs) can be fabricated from a much broader range of electrical conductors than wire thermocouples, but even with the same composition...

Telepresence: A New Paradigm for Industrial and Scientific Collaboration

June 1, 1999

Author(s)

Michael T. Postek, Marylyn H. Bennett, N J. Zaluzec

A portion of the mission of the National Institute of Standards and Technology (NIST) Manufacturing Engineering Laboratory (MEL) is to improve and advance...

Analysis of Conducted EMI Emissions from PWM Inverters Based on Empirical Models and Comparative Experiments

June 1, 1999

Author(s)

Huibin Zhu, Jih-Sheng Lai, Yi-hua Tang, Allen R. Hefner Jr., Celia Chen

For the purpose of investigation of electromagnetic interference (EMI) mechanisms in PWM inverters, empirical models and comparative experiments were studied in...

Time-Resolved Line Focus Acoustic Microscopy of Composites

June 1, 1999

Author(s)

Nelson N. Hsu

Acoustic microscopy has been used to measure material properties since the 1980s. The velocity of the leaky surface wave can be accurately determined from the V...

Delivery of an Advanced Double-Hull Ship Welding System using RoboCrane

June 1, 1999

Author(s)

Roger V. Bostelman, Adam S. Jacoff, Robert Bunch

The Office of Naval Research has sponsored a collaborative effort between the Naval Surface Warfare Center Carderock Division, Advanced Technology and Research...

A Queueing Model of a Spread Spectrum Multiple Access

June 1, 1999

Author(s)

Vladimir V. Marbukh, Nader Moayeri

We propose a queueing model of the reverse link from mobiles to the base station in a single cell of a cellular DS-CDMA system. Approximation of independent...

Embedded Systems, The Forgotten Y2K Problem

June 1, 1999

Author(s)

G E. Fisher

Much has been written about embedded systems and how they will be affected by the year 2000 problem. During the first 6 months of 1999, a significant amount of...

Thermal Conductivity of Two Compositions of Yttria-Stabilized Zirconia

June 1, 1999

Author(s)

Andrew J. Slifka, Bernard J. Filla, Judith K. Stalick

The thermal conductivities of two different compositions of yttria-stabilized zirconia have been measured using an absolute, steady-state method. The...

Determination of Radiance Temperatures Using Detectors Calibrated for Absolute Spectral Power Response

June 1, 1999

Author(s)

Howard W. Yoon, Charles E. Gibson

We describe a method of directly determining blackbody radiance temperatures using filter detectors calibrated for absolute spectral power responsivity. The...

Chamber Radiation Effects on Calibration of Radiation Thermometers With a Thin-Film Thermocouple Test Wafer

June 1, 1999

Author(s)

Benjamin K. Tsai, D P. DeWitt, Francis J. Lovas, Kenneth G. Kreider, Christopher W. Meyer, David W. Allen

In the semiconductor industry, Rapid Thermal Processing (RTP) utilizes a prescribed temperature-time recipe to silicon wafers undergoing processes such as...

Intercomparison of SEM, AFM, and Electrical Linewidths

June 1, 1999

Author(s)

John S. Villarrubia, Ronald G. Dixson, Samuel N. Jones, J R. Lowney, Michael T. Postek, Richard A. Allen, Michael W. Cresswell

Uncertainty in the locations of line edges dominates the uncertainty budget for high quality sub-micrometer linewidth measurements. For microscopic techniques...

Measurement Traceability to NIST Standard Rockwell Diamond Indenters

June 1, 1999

Author(s)

Jun-Feng Song

A metrology-based Rockwell hardness scale is established by a standard machine and a standard diamond indenter. Both must be established through force and...

Measurement Uncertainity and Noise in Nanometrology

June 1, 1999

Author(s)

James E. Potzick

The measurement of feature sizes on integrated circuit photomasks and wafers is an economically important and technically challenging application of...

Toward Nanometer Accuracy Measurements

June 1, 1999

Author(s)

John A. Kramar, E Amatucci, David E. Gilsinn, Jay S. Jun, William B. Penzes, Fredric Scire, E C. Teague, John S. Villarrubia

We at NIST are building a metrology instrument called the Molecular Measuring Machine (MMM) with the goal of performing 2D point-to-point measurements with one...

Focus and Edge Detection Algorithms and Their Relevance to the Development of an Optical Overlay Calibration Standard

June 1, 1999

Author(s)

S Fox, Mario Dagenais, Edward A. Kornegay, Richard M. Silver

We present results of investigations into optical focus and edge detection algorithms relevant to overlay metrology. We compare gradient energy, standard...

Two-Dimensional Calibration Artifact and Measurement Methodology

June 1, 1999

Author(s)

Richard M. Silver, Theodore D. Doiron, William B. Penzes, S Fox, Edward A. Kornegay, S Rathjen, M Takac, D Owen

In this paper, we describe our design and the manufacturing of a two-dimensional grid artifact of chrome on quartz on a 6 inch by 6 inch by .250 glass blank...

Dimensional Metrology with the NIST Calibrated Atomic Force Microscope

June 1, 1999

Author(s)

Ronald G. Dixson, R Koning, V W. Tsai, Joseph Fu, Theodore V. Vorburger

Atomic force microscopes (AFMs) are increasingly used in the semiconductor industry as tools for submicrometer dimensional metrology. The scales of an AFM must...

Comparison of Methods for Adapter Characterization

June 1, 1999

Author(s)

James P. Randa, Wojciech Wiatr, Robert L. Billinger

Operating Margins for a Superconducting Voltage Waveform Synthesizer

June 1, 1999

Author(s)

Samuel Benz, Clark A. Hamilton, Charles J. Burroughs

Operating margins for biolar superconducting voltage waveform synthesizer were measured. Current ranges were determined for 101 equally spaced dc voltage steps...

Coplanar Transmission Lines with Meandering Center Conductors in Y-Ba-Cu-O/Au Bilayers

June 1, 1999

Author(s)

C Weber, Ronald H. Ono, James Booth, Leila R. Vale, Samuel Benz, A. M. Klushin, H. Kohlstedt, R. Semerad

We have investigated both conventional and meandering coplanar microwave transmission lines patterned in Y-Ba-Cu-O/Au bilayers on yttria-stablized zirconia and...

Software to Optimize the Testing of Mixed-Signal Devices

June 1, 1999

Author(s)

Gerard N. Stenbakken, Andrew D. Koffman, T. M. Souders

New software is now available to help test and measurement engineers optimize the testing of complex electronic devices. Examples of products that are...

The Fallacy of Monitoring Surge Voltages: SPDs and PCs Galore

June 1, 1999

Author(s)

A. Mansoor, K. O. Phipps, Francois D. Martzloff

To support the recommendation of shifting transient monitoring from voltage surges to current surges, the paper presents experimental results as well as...

Predicting Nonlinear Effects in Superconducting Microwave Transmission Lines from Mutual Inductance Measurements

June 1, 1999

Author(s)

James Booth, Leila R. Vale, Ronald H. Ono, John H. Claassen

We demonstrate the use of a new experimental technique based on mutual inductance measurements to quantitatively predict nonlinear effects in microwave...

Large Area YBa₂Cu₃O_7-x Bolometers on Si Substrates

June 1, 1999

Author(s)

Leila R. Vale, Ronald H. Ono, Donald G. McDonald, Robert J. Phelan

We have developed YBa 2Cu 3O 7-x (YBCO) thermometers for large-area (4 mm x 4 mm) electrical substitution bolometers. We passivated the YBCO with a thin Au...

Third Harmonics Generation from Y-Ba-Cu-O Bicrystal Josephson Junctions in Coplanar Waveguides

June 1, 1999

Author(s)

Hisashi Shimakage, James Booth, Leila R. Vale, Ronald H. Ono

Distributed Nonlinear Effects in Planar Transmission Lines

June 1, 1999

Author(s)

James Booth, James A. Beall, Leila R. Vale, Ronald H. Ono

Optimum Characteristics of High Temperature Josephson Junctions for "Lumped" Array Applications

June 1, 1999

Author(s)

Ronald H. Ono, Samuel Benz

We present design criteria for arrays of Josephson junctions optimized for use in the Josephson digital-analog converter and for a THz oscillator. We will...

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