Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Conferences

Multiple wavelength reference based on interleaved, sampled fiber gratings and molecular absorption

September 1, 2003

Author(s)

Mary A. Rowe, William C. Swann, Sarah L. Gilbert

We present a wavelength calibration reference based on sampled fiber gratings stabilized to a molecular absorption line. Such a hybrid reference can provide

NEXAFS Measurements of the Surface Chemistry of Chemically Amplified Photoresists

September 1, 2003

Author(s)

E Jablonski, M Angelopoulos, H Ito, Joseph~undefined~undefined~undefined~undefined~undefined Lenhart, S Sambasivan, Daniel A. Fischer, Ronald L. Jones, Eric K. Lin, Wen-Li Wu, D L. Goldfarb, K Temple

Near edge x-ray absorption fine structure (NEXAFS) spectroscopy was used to quantify the surface composition profile (top 1 nm to 6 nm) of model chemically

Development of Metrology at NIST For the Semiconductor Industry

September 1, 2003

Author(s)

Stephen Knight

The National Institute of Standards and Technology metrology development for the semiconductor industry and its supporting infrastructure is a broad set of

Immersive Virtual Reality for Steel Structures

September 1, 2003

Author(s)

Robert R. Lipman

This paper describes an immersive virtual reality system for steel structures. The system integrates standard models and formats for representing structural

Spectral Radiance Comparisons of Two Blackbodies with Temperatures Determined Using Absolute Detectors and ITS-90 Techniques

September 1, 2003

Author(s)

Howard W. Yoon, Charles E. Gibson, J L. Gardner

For calibrations of spectral irradiance standards, a high-temperature blackbody (HTBB) is used as a source of spectral radiance or irradiance as derived from

The IPC-2252, Design Guide for RF/Microwave Circuit Boards

September 1, 2003

Author(s)

Nicholas G. Paulter Jr.

The IPC-2252,'Design Guide for RF/Microwave Circuit Boards,'[1] (superceding the IPC-D-316) was published in July 2002. The IPC-2252 provides information

Measurement of Gate-Oxide Film Thickness by X-ray Photoelectron Spectroscopy

September 1, 2003

Author(s)

Cedric J. Powell, Aleksander Jablonski

X-Ray Photoelectron Spectroscopy (XPS) is being used to an increasing extent for the characterization of new gate-oxide materials, particularly for the

The Development and Characterization of an Absolute Pyrometer Calibrated for Radiance Responsivity

September 1, 2003

Author(s)

David W. Allen, Robert D. Saunders, Bettye C. Johnson, Charles E. Gibson, Howard W. Yoon

The International Temperature Scale of 1990 (ITS-90), for temperatures above the freezing temperature of silver, is defined with pyrometers which rely upon

Bevel Depth Profiling SIMS for Analysis of Layer Structures

September 1, 2003

Author(s)

John G. Gillen, Scott A. Wight, P Chi, Albert J. Fahey, Jennifer R. Verkouteren, Eric S. Windsor, D. B. Fenner

We are evaluating the use of bevel depth profiling Secondary Ion Mass Spectrometry (SIMS) for the characterization of layered semiconductor materials. In this

Characterization and Calibration of Lightpipe Radiation Thermometers for Use in Rapid Thermal Processing

September 1, 2003

Author(s)

Benjamin K. Tsai, D P. DeWitt

Lightpipe radiation thermometers (LPRTs) are the sensor of choice for temperature measurements in Rapid Thermal Processing (RTP) applications. At the National

NIST Calibration Uncertainties of Liquid-in-Glass Thermometers over the Range from 20 C to 400 C

September 1, 2003

Author(s)

C D. Vaughn, Gregory F. Strouse

The NIST Industrial Thermometer Calibration Laboratory (ITCL) is responsible for calibrating several different types of industrial thermometers. One of those

Determination of Pore-Size Distributions in Low-Κ Dielectric Films by Transmission Electron Microscopy

September 1, 2003

Author(s)

B J. Foran, B Kastenmeier, David S. Bright

This paper discusses methods of characterizing pore size distributions in low-k films by transmission electron microscopy (TEM), comparing both conventional TEM

Temperature Metrology and Its Impact on Industry

September 1, 2003

Author(s)

Hratch G. Semerjian, Ellyn S. Beary

Temperature measurement represents one of the most frequently and broadly used measurements, with a majority of products manufactured having temperature

Temperature and Flux Scales for Heat-Flux Sensor Calibration

September 1, 2003

Author(s)

A V. Murthy, D P. DeWitt, Benjamin K. Tsai, Gerald T. Fraser, Robert D. Saunders

Methodologies for calibrating heat-flux sensors designed for direct measurement of heat-transfer at a surface are presented. These sensors, extensively used in

Ground Truth and Benchmarks for Performance Evaluation

September 1, 2003

Author(s)

A Takeucki, Michael O. Shneier, Tsai H. Hong, Tommy Chang, Christopher J. Scrapper Jr, Geraldine Cheok

Stability of fiber Bragg grating wavelength calibration references

September 1, 2003

Author(s)

Shellee D. Dyer, Jonathan D. Kofler, Robert J. Espejo, Shelley M. Etzel

We discuss the key considerations necessary to create stable fiber Bragg grating (FBG) wavelength references. We describe two high-accuracy measurements to

Generating quiet continua: noise limitations to supercontinuum generation in photonic crystal fiber

September 1, 2003

Author(s)

J M. Dudley, S. Coen, Nathan R. Newbury, Kristan L. Corwin, Scott Diddams, Brian Washburn, R Windeler

SC generation in photonic crystal fiber can be associated with intensity fluctuations arising from the nonlinear amplification of input pulse noise. Experiments

Active millimeter-wave imaging for concealed weapons detection

September 1, 2003

Author(s)

Erich N. Grossman, Aaron J. Miller

Actively illuminated mm-wave imaging systems for concealed weapons detection offer the possibility of much higher sensitivity than with passive systems. We

Temperature Scales Using Radiation Thermometers Calibratied From Absolute Irradiance and Radiance Responsivity

August 21, 2003

Author(s)

Howard W. Yoon, David W. Allen, Charles E. Gibson, Robert D. Saunders, Bettye C. Johnson, Steven W. Brown, Keith R. Lykke

In the International Temperature Scale of 1990 (ITS-90), temperatures above the freezing temperature of silver are defined with radiation thermometers

A Bridge for Scaling to Higher Resistance from the QHR

August 21, 2003

Author(s)

Randolph Elmquist, Dean G. Jarrett

A two-terminal bridge for resistance scaling directly from the quantum Hall resistance (QHR) to higher-resistance values now provides a secondary starting point

Expanding the Role of Finite State Machine Technology in Open Architecture Control

August 21, 2003

Author(s)

John L. Michaloski, Frederick M. Proctor, William G. Rippey, S Kolla

Modern machine control systems rely heavily on software to achieve system functionality. Until recently, control software?s primary purpose was to provide logic

Changes and Improvements in the 10 k-ohm Special Calibration Service

August 21, 2003

Author(s)

George R. Jones Jr., Marlin E. Kraft, Randolph Elmquist

The 1(ohm) level of resistance has been the source of the lowest standard uncertainties for d.c. resistance calibrations. At the 10 k(ohm) level, equally good

Induced Currents on an EUT in a Free-Space and a Modified TEM Cell Environment

August 19, 2003

Author(s)

Per E. Fornberg, Christopher L. Holloway, Perry F. Wilson

The finite-difference time-domain method is used to investigate whether the currents induced on an equipment under test (EUT) in a TEM cell are similar to those

Performance Measures for Intelligent Systems: Measures of Technology Readiness PerMIS 03 White Paper

August 18, 2003

Author(s)

Elena R. Messina, James S. Albus, Alex Meystel

NOT (Faster Implementation ==>Better Algorithm), A Case Study

August 18, 2003

Author(s)

Stephen B. Balakirsky, Thomas R. Kramer

Given two algorithms that perform the same task, one may ask which is better. One simple answer is that the algorithm that delivers the ?best? answer is the

Exercising a Native Intelligence Metric on an Autonomous On-Road Driving System

August 18, 2003

Author(s)

John A. Horst

The intelligence of artificial systems is well quantified by the amount of specified complexity inherent in the system representation, provided we have tools to

Assessing A Loaded Reverberation Chamber: Calculating Threshold Metrics

August 18, 2003

Author(s)

Christopher L. Holloway, David A. Hill, John M. Ladbury, Todd M. Lammers

In this paper we present an expression for two threshold metrics of a loaded reverberation chamber. One metric is based on the chamber quality factor (Q) and

Total Radiated Power Limits for Emission Measurements in a Reverberation Chamber

August 18, 2003

Author(s)

Christopher L. Holloway, Perry F. Wilson, Galen H. Koepke, Marco Candidi

In this paper we present a total radiated power limit for emission measurements in reverberation chambers. This total radiation power limit is intended to be

Toward a Generic Model for Autonomy Levels for Unmanned Systems (ALFUS)

August 18, 2003

Author(s)

Hui-Min Huang, Elena R. Messina, James S. Albus

Unmanned systems (UMSs) have been deployed to military and civilian operations. UMSs vary widely in their capabilities andcivilian operations. UMSs vary widely

Performance Evaluation of Tools and Techniques for Representing Cost-Based Decision Criteria for On-Road Autonomous Navigation

August 18, 2003

Author(s)

N H. Zimmerman, Craig I. Schlenoff, Stephen B. Balakirsky

The purpose of the work described in this paper is to analyze rule-based and functional tools to determine which are best suited for cost generation in an

Was this page helpful?