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Conferences

An Architecture for Modeling and Simulation for Emergency Response

April 1, 2004

Author(s)

Sanjay Jain, Charles R. McLean

A number of modeling and simulation applications exist for studying individual aspects of emergency response scenarios. The value of these applications can be

Study on an Image Stitching Method for Linewidth Measurement

April 1, 2004

Author(s)

Wei Chu, Xuezeng Zhao, Joseph Fu, Theodore V. Vorburger

The New DOE Dishwasher Test Procedure: Development and First Results

March 29, 2004

Author(s)

Natascha S. Milesi-Ferretti, J Bowman, B Twigg

This paper summarizes the main changes to the test procedure for residential dishwashers and, Department of Energy s (DOE, Department) and industry s

Editorial Knowledge Representation and Ontologies for Autonomous Systems--2004 AAAI Spring Symposium

March 24, 2004

Author(s)

Craig I. Schlenoff, M Uschold

Packet Filtering for Aggregate-based Congestion Control

March 24, 2004

Author(s)

Nicolas Chevrollier, R E. Van Dyck

Simulation of Expansion in Cement Based Materials Subjected to External Sulfate Attack

March 24, 2004

Author(s)

B Mobasher, Chiara C. Ferraris

Sulfate attack in concrete structures is considered to be among the major durability concerns in civil infrastructure systems. Proper modeling techniques can

Knowledge Representation for On-Road Driving

March 24, 2004

Author(s)

Christopher J. Scrapper Jr, Stephen B. Balakirsky

This paper will present a knowledge layer used by a hierarchical on-road driving planner that represents a road network as a discrete set of attributed road

How Task Analysis Can Be Used to Derive and Organize the Knowledge for the Control of Autonomous Vehicles

March 24, 2004

Author(s)

Tony Barbera, James S. Albus, Elena R. Messina, Craig I. Schlenoff, John A. Horst

The Real-time Control System (RCS) Methodology has evolved over a number of years as a technique to capture task knowledge and organize it in a framework

On Competition between Greedy Autonomous Systems in Providing Internet Services: Emergent Behaviour and Stability

March 19, 2004

Author(s)

Vladimir V. Marbukh, R E. Van Dyck

Reliability Implications of Scaling Gate Oxides in Deep Submicron CMOS Technologies

March 18, 2004

Author(s)

John S. Suehle

Decreasing the thickness of the gate insulator in advanced CMOS devices seriously shrinks their reliability margin. Fortunately, dielectric breakdown becomes

Towards Flexible Service Level Agreements

March 17, 2004

Author(s)

Vladimir V. Marbukh

Towards Market Approach to Providing Survivable Services

March 17, 2004

Author(s)

Vladimir V. Marbukh

Pumice Aggregates for Internal Water Curing

March 17, 2004

Author(s)

Pietro Lura, Dale P. Bentz, D Lange, K Kovler, A Bentur

A novel concept in internal curing of High Performance Concrete is based on dispersing very small, saturated lightweight aggregates (LWA) in the concrete

Key metrology considerations for fiber Bragg grating sensors

March 14, 2004

Author(s)

Shellee D. Dyer, Paul A. Williams, Robert J. Espejo, Jonathan D. Kofler, Shelley M. Etzel

We discuss the current status of fiber Bragg grating (FBG) sensor metrology. High-accuracy wavelength measurements are critical for FBG strain sensors, because

The First Measurements with Octave-Spanning Femtosecond Laser Frequency Combs

March 13, 2004

Author(s)

Scott A. Diddams, David J. Jones

Here we describe in a historical manner the first optical frequency measurement measurements with octave-spanning frequency combs and the first measurement and

Nano-Lithography in Ultra-High Vacuum (UHV) for Real World Applications

March 11, 2004

Author(s)

James D. Gilsinn, Hui Zhou, Bradley N. Damazo, Joseph Fu, Richard M. Silver

As nano-lithography technology improves, more companies and research groups have the capability to create nano-scale structures. Scanning tunneling microscopes

Temperature Measurements of Semiconductor Devices-A Review

March 10, 2004

Author(s)

David L. Blackburn

There are numerous methods for measuring the temperature of an operating semiconductor device. The methods can be broadly placed into three generic categories

Quantitative Interpretation of Scanning Capcitance Microscope Images as Two-Dimensional Dopant Profiles

March 10, 2004

Author(s)

Joseph Kopanski, Jay F. Marchiando

Scanning capacitance microscopy (SCM) is used as a qualitative analysis tool with multiple applications for failure analysis. SCM can measure the shape of

PWB Warpage Analysis and Verification using an AP210 Standards-based Engineering Framework and Shadow Moire

March 10, 2004

Author(s)

Dirk Zwemer, Manas Bajaj, Russell Peak, Thomas Thurman, Kevin G. Brady, S McCarron, A Spradling, Mike Dickerson, Lothar Klein, Giedrius Liutkus, John V. Messina

Thermally induced warpage of printed wiring boards (PWB) and printed circuit assemblies (PCA) is an increasingly important issue in managing the manufacturing

Metrology Development for the Nanoelectronics Industry at the National Institute of Standards and Technology

March 7, 2004

Author(s)

Joaquin (. Martinez, John A. Dagata, Curt A. Richter, Richard M. Silver

The National Institute of Standards and Technology has provided and continues to provide critical metrology development for the semiconductor manufacturing

Acoustic Loss in Langasite and Langanite

March 1, 2004

Author(s)

Ward L. Johnson, K Sudook, U Satoshi

Resonant ultrasonic loss 1/Q in plano-convex unplated Y-cut disks of langasite and langanite were measured as a function of freqeuncy and temperature with the

Nano-Lithography in Ultra-High Vacuum (UHV) for Real World Applications

March 1, 2004

Author(s)

James D. Gilsinn, Hui Zhou, Bradley N. Damazo, Joseph Fu, Richard M. Silver

As nano-lithography technology improves, more companies and research groups have the capability to create nano-scale structures. Scanning tunneling microscopes

Comparison of Machining Simulations for 1045 Steel to Experimental Measurements

March 1, 2004

Author(s)

Robert W. Ivester, Michael Kennedy

This paper compares model-based simulations to experimental measurements obtained under the Assessment of Machining Models project at the National Institute of

Pore Size Distributions in Low-k Dielectric Thin Films From SANS Porosimetry

March 1, 2004

Author(s)

R C. Hedden, V. J. Lee, Christopher L. Soles, Barry J. Bauer

A small-angle neutron scattering (SANS) porosimetry technique is presented for characterization of pore structure in nanoporous thin films. Porosimetry

Taming a Wild Workflow and Domesticating our Digital Data

March 1, 2004

Author(s)

Nancy Allmang, P J. Deutsch

This case study of a digital collection illustrates how the Information Services Division of Technology Services at NIST formulated a requirements analysis and

Flow Simulation of a Microfluidic Analog of the Four-Roll Mill

March 1, 2004

Author(s)

Frederick R. Phelan Jr., Steven Hudson

The fluid dynamics of channel geometries for liquid state materials characterization in microfluidic devices are investigated using finite element flow

Synthesis and Characterization of PEG and PEG Urethane Dimethacrylate Hydrogels

March 1, 2004

Author(s)

Sheng Lin-Gibson, S Bencherif, James A. Cooper, N. R. Washburn, Joseph M. Antonucci

A key area in the repair and regeneration of tissues is optimizing the polymeric scaffold-tissue response. This study is designated to better understand the

Energy Analysis of Multi-Lens Adhesion Measurements

March 1, 2004

Author(s)

Aaron M. Forster, Christopher Stafford, Alamgir Karim

The NIST Combinatorial Methods Center (NCMC) has adapted the Johnson Kendall, and Roberts (JKR) adhesive contact test for the development of a high-throughput

An Open Source Informatics System for Combinatorial Materials Research

March 1, 2004

Author(s)

Weiping Zhang, Michael J. Fasolka, Alamgir Karim, Eric J. Amis

Laboratory Research Informatics Systems (LRIS) hold great promise in streamlining research generally, and are particularly necessary for new data-intensive

MALDI of Layered Polymer Films

March 1, 2004

Author(s)

Barry J. Bauer, Kathleen M. Flynn, B D. Vogt

A layered preparation method is introduced that produces structured MALDI targets with well-defined phase sizes and compositions. Tri-a-naphthyl benzene is a

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