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Six-Pack IGBT Dynamic Electro-Thermal Model; Parameter Extraction and Validation

Published

Author(s)

John V. Reichl, David W. Berning, Allen R. Hefner Jr., Jih-Sheng Lai
Proceedings Title
Proceedings of the 2004 IEEE Applied Power Electronics Conference
Conference Location
, US
Conference Title
2004 IEEE Applied Power Electronics Conference

Citation

Reichl, J. , Berning, D. , Hefner Jr., A. and Lai, J. (2004), Six-Pack IGBT Dynamic Electro-Thermal Model; Parameter Extraction and Validation, Proceedings of the 2004 IEEE Applied Power Electronics Conference, , US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=906352 (Accessed February 28, 2024)
Created February 1, 2004, Updated October 12, 2021