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Conferences

The NIST Process Control Security Requirements Forum (PCSRF) and the Future of Industrial Control System Security

May 5, 2004

Author(s)

Keith A. Stouffer, Joseph Falco, Frederick M. Proctor

This paper will provide an overview of the Process Control Security Requirements Forum (PCSRF) and the System Protection Profile for Industrial Control Systems...

Comparison Testing in a Simulated Data Processing/Telecommunications Facility: FM-200 and Automatic Sprinkler Systems.

May 4, 2004

Author(s)

M L. Robin, E W. Forssell

Combustion Suppression of Methane by CO2/CF3Br, CO2/C2F4Br2 AND N2/CF3I.

May 4, 2004

Author(s)

Y A. Lisochkin, V I. Poznyak, E G. Belevtsev, L N. Kunina

Clean Agent Systems Testing Using a Sustainable Halon Replacement Alternative to HFCs.

May 4, 2004

Author(s)

J Perko

Aircraft Cargo Fire Suppression Using Low Pressure Dual Fluid Water Mist and Hypoxic Air

May 4, 2004

Author(s)

J Brooks

Water mist is gaining acceptance as a substitute for gaseous fire suppression agents worldwide. In commercial aircraft applications the FAA/CAA have adopted a...

IPPS: An Integrated Process Planning System

May 4, 2004

Author(s)

Suber Huang, J Mei, Xuhang Tong, Steven R. Ray

The past two decades have witnessed the development of many CAPP (Computer-Aided Process Planning) systems. From variant process planning to generative process...

The NIST Meeting Room Pilot Corpus

May 1, 2004

Author(s)

John S. Garofolo, Christophe Laprun, Martial Michel, Vincent M. Stanford, Elham Tabassi

Fundamentals of Developer-Resist Interactions for Line-Edge Roughness and Critical Dimension Control in Model 248 nm and 157 nm Photoresists

May 1, 2004

Author(s)

Vivek M. Prabhu, M Wang, E Jablonski, B D. Vogt, Eric K. Lin, Wen-Li Wu, D L. Goldfarb, M Angelopoulos, H Ito

Organic polar solvent (1-butanol) versus aqueous base (tetramethylammonium hydroxide, (TMAH)) development quality are distinguished by neutral versus charged...

DEVELOPING METROLOGY FOR TISSUE ENGINEERING: COLLINEAR OPTICAL COHERENCE AND CONFOCAL FLUORESCENCE MICROSCOPIES

May 1, 2004

Author(s)

Joy P. Dunkers, Marcus T. Cicerone, James Cooper, Forrest A. Landis, N Washburn

We present a novel application of optical coherence microscopy (OCM) by combining it with confocal fluorescence microscopy (CFM) to gather simultaneous...

Fluorescent Probes for Monitoring Microstructure of Polymer/Clay Nanocomposites

May 1, 2004

Author(s)

Anthony J. Bur, S C. Roth, P R. Start, P H. Maupin

On Route Exploration Capabilities of Multi-Path Routing in Variable Topology Ad Hoc Networks

May 1, 2004

Author(s)

S P. Kumar, Vladimir V. Marbukh

Evaluation of Human-Robot Interaction Awareness in Search and Rescue

May 1, 2004

Author(s)

Jean C. Scholtz, J D. Young, H A. Yanco, J L. Drury

The paper describes human-robot awareness and analyzes violations of awareness in a search and rescue competition. The critical incidents that arise from these...

On the Scalability of Ad Hoc Networks: A Traffic Analysis at the Center of a Network

May 1, 2004

Author(s)

B-J Kwak, N-O Song, Leonard E. Miller

We investigate the inherent scalability problem of ad hoc networks originated from the nature of multi-hop networks. First, the expected packet traffic at the...

Multiscale Modeling of Mechanical Response of Quantum Nanostructures

May 1, 2004

Author(s)

Vinod K. Tewary, B Yang

A multiscale Green's function method is described for modeling the mechanical response of quantum nanostructures in semiconductors. The method accounts for the...

Correlation Between Degree of Exfoliation, Dielectric Properties, and Light Transmission of Nylon 11/Clay Nanocomposites Probed by an Online Dielectric Slit Die

May 1, 2004

Author(s)

T Y. Lee, Anthony J. Bur, S C. Roth

Rheology, Processing and Electrical Properties of Multiwall Carbon Nanotube/Polypropylene Nanocomposites

May 1, 2004

Author(s)

S B. Kharchenko, Kalman D. Migler, Jack F. Douglas, Jan Obrzut, E A. Grulke

Dispersal of a relatively small concentration [O (1 %) volume fraction] of multiwall carbon nanotubes (MWNT) into polypropylene (PP) is found to cause large and...

Eliminating Surface Melt Fracture Using PPA: The Role of PPA Domain Size

May 1, 2004

Author(s)

Mathurin G. Meillon, David C. Morgan, D Bigio, S B. Kharchenko, Kalman D. Migler, S Oriani

The investigation of the elimination of sharkskin using polymer processing aids (PPA) requires the consideration of factors such as: PPA domain size...

High-Resolution Optical Overlay Metrology

May 1, 2004

Author(s)

Richard M. Silver, Ravikiran Attota, M R. Bishop, Jay S. Jun, Egon Marx, M P. Davidson, Robert D. Larrabee

Optical methods are often thought to lose their effectiveness as a metrology tool beyond the Rayleigh criterion. However, using advanced modeling methods, the...

Flat-Panel-Display Measurement Techniques and Concerns

May 1, 2004

Author(s)

Edward F. Kelley

We explore the problems that can be encountered in making common measurements on flat panel displays. Equipment usage techniques are reviewed and coordinated...

Plotting the Course of the Next VESA Flat Panel Display Measurements Standard

May 1, 2004

Author(s)

Edward F. Kelley

The Display Metrology Committee of the Video Electronics Standards Association is developing the next Flat Panel Display Measurements Standard. The document's...

Conversational Telephone Speech Corpus Collection for the NIST Speaker Recognition Evaluation 2004

May 1, 2004

Author(s)

Alvin F. Martin, D J. Miller, Mark A. Przybocki, Joe Campbell, H Nakasone

This paper discusses some of the factors that should be considered when designing a speech corpus collection to be used for text-independent speaker recognition...

Overview of TREC 2003

May 1, 2004

Author(s)

Ellen M. Voorhees

Mapping Polymeric Properties Using Combinatorial and High-Throughput Methods: Adhesion and Mechanical Properties

May 1, 2004

Author(s)

Aaron M. Forster, A Chiche, Martin Chiang, Christopher Stafford, Alamgir Karim

High-throughput and combinatorial methods unlock novel approaches to investigations of new materials, allowing the materials community to carry out studies that...

Optical Coherence Microscopy for in-situ Monitoring of Cell Growth in Scaffold Constructs

May 1, 2004

Author(s)

Marcus T. Cicerone, Joy Dunkers, N. R. Washburn, Forrest A. Landis, James A. Cooper

Tissue scaffold morphological properties are determined and correlated with osteoblast proliferation and ingrowth. Scaffold pore size and connectivity were...

Evaluation of New In-Chip and Arrayed Line Overlay

May 1, 2004

Author(s)

Ravikiran Attota, Richard M. Silver, M R. Bishop, Egon Marx, Jay S. Jun, Michael T. Stocker, M P. Davidson, Robert D. Larrabee

Two types of overlay targets have been designed and evaluated for the study of optical overlay metrology. They are in-chip and arrayed overlay targets. In-chip...

A chromium surface magneto-optical trap for magnetic microtrap studies

May 1, 2004

Author(s)

M Pichler, S Hill, Jabez J. McClelland

A surface magneto-optical trap for chromium atoms is demonstrated as a first step toward loading atoms into microscopic magnetic traps. Characteristics of the...

Temporal Range Registration for Unmanned Ground and Aerial Vehicles

May 1, 2004

Author(s)

Rajmohan (. Madhavan, Tsai H. Hong, Elena R. Messina

An iterative temporal registration algorithm is presented in this paper1 for registering 3D range images obtained from unmanned ground and aerial vehicles...

Effects of Laterally and Vertically Neighboring Quantum Dots on Formation of a New Quantum Dot

May 1, 2004

Author(s)

B. Yang, Vinod Tewary

We apply the elastic energy release rate (EERR) to identify the favored location ofquantum dot (QD) formation in the presense of a laterally or vertically...

Modeling of a Microfluidic Analog of the Four-Roll Mill for Materials Characterization

May 1, 2004

Author(s)

Frederick R. Phelan Jr., Steven Hudson

The fluid dynamics of channel geometries for liquid state materials characterization in microfluidic devices are investigated. A pressure driven microchannel...

Measurement of Complex Impedance at High AC Voltages Using Waveforms

May 1, 2004

Author(s)

Jan Obrzut, K Kano

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