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Conferences

SCC Evolution of Formwork Hydraulic Pressure and Rheological Properties

April 1, 2004

Author(s)

S Amziane, Chiara C. Ferraris

An experimental investigation was performed to determine the hydraulic pressure variation of cementitious based materials (cement paste, concrete, SCC, etc.)...

Material Modeling and Experimental Study of Serrated Chip Morphology

April 1, 2004

Author(s)

T Mabrouki, Laurent Deshayes, J F. Rigal, Kevin K. Jurrens, Robert W. Ivester

Machining chip morphology stems from mechanical, thermal, and chemical phenomena. Chip morphology prediction depends on a fundamental understanding of these...

Influence of Heating Rate on Flow Stress in High-Speed Machining Processes

April 1, 2004

Author(s)

Timothy J. Burns, Robert W. Ivester, Michael Kennedy, Richard L. Rhorer, Matthew A. Davies, Howard Yoon, Lyle E. Levine, Richard J. Fields, D Basak, Eric P. Whitenton

For several decades, a major focus of machining research has been the measurement and prediction of temperature. Here, the influence of the rate of heating on...

Evaluating Interactive Information Retrieval Systems: Opportunities and Challenges

April 1, 2004

Author(s)

N Belkin, S Dumais, Jean C. Scholtz, R Wilkinson

This special interest group seeks to articulate some of the challenges and designing and evaluating interactive information retrieval systems.

Design Guidelines for Improved Human-Robot Interaction

April 1, 2004

Author(s)

J L. Drury, D Hestand, Holly A. Yanco, Jean C. Scholtz

This poster presents some initial design guidelines for HRI as a result of our analysis of HRI awareness anomalies.

Dynamic Mechanical Analysis of Pure Mg and Mg AZ31 Alloy

April 1, 2004

Author(s)

A -. Munitz, D -. Dayan, David J. Pitchure, Richard E. Ricker

Dynamic mechanical analyses were performed on pure Mg and Mg AZ31 alloy to study the impact of thermo-mechanical state and grain structure on the complex...

X-Ray Reflectivity Porosimetry for the Characterization of Porous Low-K Dielectric Constant Thin Films

April 1, 2004

Author(s)

Christopher Soles, V. J. Lee, R C. Hedden, D W. Liu, Barry J. Bauer, Wen-Li Wu

X-ray reflectivity porosimetry is a highly sensitive measurement method used to quantify the capillary condensation of a solvent vapor inside porous low-k...

Testing Requirements to Manage Data Exchange Specifications in Enterprise Integration - A Schema Design Quality Focus

April 1, 2004

Author(s)

Boonserm Kulvatunyou, Nenad Ivezic, Jeong Buhwan

In this paper, we describe the requirements to test W3C XML Schema usage when defining message schemas for data exchange in any large and evolving enterprise...

An Architecture for Modeling and Simulation for Emergency Response

April 1, 2004

Author(s)

Sanjay Jain, Charles R. McLean

A number of modeling and simulation applications exist for studying individual aspects of emergency response scenarios. The value of these applications can be...

Study on an Image Stitching Method for Linewidth Measurement

April 1, 2004

Author(s)

Wei Chu, Xuezeng Zhao, Joseph Fu, Theodore V. Vorburger

The New DOE Dishwasher Test Procedure: Development and First Results

March 29, 2004

Author(s)

Natascha S. Milesi-Ferretti, J Bowman, B Twigg

This paper summarizes the main changes to the test procedure for residential dishwashers and, Department of Energy s (DOE, Department) and industry s...

Editorial Knowledge Representation and Ontologies for Autonomous Systems--2004 AAAI Spring Symposium

March 24, 2004

Author(s)

Craig I. Schlenoff, M Uschold

Packet Filtering for Aggregate-based Congestion Control

March 24, 2004

Author(s)

Nicolas Chevrollier, R E. Van Dyck

Simulation of Expansion in Cement Based Materials Subjected to External Sulfate Attack

March 24, 2004

Author(s)

B Mobasher, Chiara C. Ferraris

Sulfate attack in concrete structures is considered to be among the major durability concerns in civil infrastructure systems. Proper modeling techniques can...

Knowledge Representation for On-Road Driving

March 24, 2004

Author(s)

Christopher J. Scrapper Jr, Stephen B. Balakirsky

This paper will present a knowledge layer used by a hierarchical on-road driving planner that represents a road network as a discrete set of attributed road...

How Task Analysis Can Be Used to Derive and Organize the Knowledge for the Control of Autonomous Vehicles

March 24, 2004

Author(s)

Tony Barbera, James S. Albus, Elena R. Messina, Craig I. Schlenoff, John A. Horst

The Real-time Control System (RCS) Methodology has evolved over a number of years as a technique to capture task knowledge and organize it in a framework...

On Competition between Greedy Autonomous Systems in Providing Internet Services: Emergent Behaviour and Stability

March 19, 2004

Author(s)

Vladimir V. Marbukh, R E. Van Dyck

Reliability Implications of Scaling Gate Oxides in Deep Submicron CMOS Technologies

March 18, 2004

Author(s)

John S. Suehle

Decreasing the thickness of the gate insulator in advanced CMOS devices seriously shrinks their reliability margin. Fortunately, dielectric breakdown becomes...

Towards Flexible Service Level Agreements

March 17, 2004

Author(s)

Vladimir V. Marbukh

Towards Market Approach to Providing Survivable Services

March 17, 2004

Author(s)

Vladimir V. Marbukh

Pumice Aggregates for Internal Water Curing

March 17, 2004

Author(s)

Pietro Lura, Dale P. Bentz, D Lange, K Kovler, A Bentur

A novel concept in internal curing of High Performance Concrete is based on dispersing very small, saturated lightweight aggregates (LWA) in the concrete...

Key metrology considerations for fiber Bragg grating sensors

March 14, 2004

Author(s)

Shellee D. Dyer, Paul A. Williams, Robert J. Espejo, Jonathan D. Kofler, Shelley M. Etzel

We discuss the current status of fiber Bragg grating (FBG) sensor metrology. High-accuracy wavelength measurements are critical for FBG strain sensors, because...

The First Measurements with Octave-Spanning Femtosecond Laser Frequency Combs

March 13, 2004

Author(s)

Scott A. Diddams, David J. Jones

Here we describe in a historical manner the first optical frequency measurement measurements with octave-spanning frequency combs and the first measurement and...

Nano-Lithography in Ultra-High Vacuum (UHV) for Real World Applications

March 11, 2004

Author(s)

James D. Gilsinn, Hui Zhou, Bradley N. Damazo, Joseph Fu, Richard M. Silver

As nano-lithography technology improves, more companies and research groups have the capability to create nano-scale structures. Scanning tunneling microscopes...

Temperature Measurements of Semiconductor Devices-A Review

March 10, 2004

Author(s)

David L. Blackburn

There are numerous methods for measuring the temperature of an operating semiconductor device. The methods can be broadly placed into three generic categories...

Quantitative Interpretation of Scanning Capcitance Microscope Images as Two-Dimensional Dopant Profiles

March 10, 2004

Author(s)

Joseph Kopanski, Jay F. Marchiando

Scanning capacitance microscopy (SCM) is used as a qualitative analysis tool with multiple applications for failure analysis. SCM can measure the shape of...

PWB Warpage Analysis and Verification using an AP210 Standards-based Engineering Framework and Shadow Moire

March 10, 2004

Author(s)

Dirk Zwemer, Manas Bajaj, Russell Peak, Thomas Thurman, Kevin G. Brady, S McCarron, A Spradling, Mike Dickerson, Lothar Klein, Giedrius Liutkus, John V. Messina

Thermally induced warpage of printed wiring boards (PWB) and printed circuit assemblies (PCA) is an increasingly important issue in managing the manufacturing...

Metrology Development for the Nanoelectronics Industry at the National Institute of Standards and Technology

March 7, 2004

Author(s)

Joaquin (. Martinez, John A. Dagata, Curt A. Richter, Richard M. Silver

The National Institute of Standards and Technology has provided and continues to provide critical metrology development for the semiconductor manufacturing...

Acoustic Loss in Langasite and Langanite

March 1, 2004

Author(s)

Ward L. Johnson, K Sudook, U Satoshi

Resonant ultrasonic loss 1/Q in plano-convex unplated Y-cut disks of langasite and langanite were measured as a function of freqeuncy and temperature with the...

Nano-Lithography in Ultra-High Vacuum (UHV) for Real World Applications

March 1, 2004

Author(s)

James D. Gilsinn, Hui Zhou, Bradley N. Damazo, Joseph Fu, Richard M. Silver

As nano-lithography technology improves, more companies and research groups have the capability to create nano-scale structures. Scanning tunneling microscopes...

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