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Conferences

Focus: Augmented Reality for Standards Development

Author(s)
Matthew L. Aronoff, John V. Messina
The next generation of Product Data Exchange (PDE) standards will require the active participation of domain experts in the standards development process. Due

Recovering Spheres from 3D Point Data

Author(s)
Christoph J. Witzgall, Geraldine Cheok, Anthony J. Kearsley
The National Institute of Standards and Technology is involved in developing standard protocols for the performance evaluation of 3D imaging systems, which

Migrating Legacy Data in the PCB Industry

Author(s)
Matthew L. Aronoff, John V. Messina
The printed circuit board (PCB) industry has been using the Gerber (RS-274) file format for decades, resulting in a substantial library of legacy designs. One

Blackbody radiation shift of the 27Al+ 1S0 - 3P0 transition

Author(s)
Till P. Rosenband, Wayne M. Itano, Piet Schmidt, David Hume, Jeroen Koelemeij, James C. Bergquist, David J. Wineland
The differential polarizability, due to near-infrared light at 1126 nm, of the 27Al + 1S 0 – 3P 0 transition is measured to be {Δ}α = (1.6 ± x 10 -31 m 3, where

Atom-based stabilization for laser-pumped atomic clocks

Author(s)
Vladislav Gerginov, V Shah, Svenja A. Knappe, Leo W. Hollberg, John E. Kitching
Progress towards simplification and improvement of the long-term stability of chip-scale atomic clocks is presented. The conventional technique of laser optical

Spectroscopy of neutral 174Yb in a one-dimensional optical lattice

Author(s)
C Hoyt, Zeb Barber, Christopher W. Oates, A. V. Taichenachev, V. I. Yudin, Leo W. Hollberg
We report spectroscopy of the 1S 0 - 3P 0 clock transition in neutral 174Yb atoms confined to a one- dimensional optical lattice at the ac Stark shift-canceling

RFID-Assisted Indoor Localization and Communication for First Responders

Author(s)
Leonard E. Miller, Perry F. Wilson, Nelson P. Bryner, Michael H. Francis, Jeffrey R. Guerrieri, D W. Stroup, Luke Klein-Berndt
An indoor localization and communication project is described that proposes to use RFID tags, placed in the building beforehand, as navigation waypoints for an

Traceable Atomic Force Microscope Dimensional Metrology at NIST

Author(s)
Ronald G. Dixson, Ndubuisi G. Orji, Joseph Fu, Michael W. Cresswell, Richard A. Allen, William F. Guthrie
The National Institute of Standards and Technology (NIST) has a multifaceted program in atomic force microscope (AFM) dimensional metrology. There are two major

Koehler Illumination for High-Resolution Optical Metrology

Author(s)
Martin Y. Sohn, Bryan M. Barnes, Lowell P. Howard, Richard M. Silver, Ravikiran Attota, Michael T. Stocker
Accurate preparation of illumination is critical for high-resolution optical metrology applications such as line width and overlay measurements. To improve the

The Limits of Image-Based Optical Metrology

Author(s)
Richard M. Silver, Bryan M. Barnes, Ravikiran Attota, Jay S. Jun, James J. Filliben, Juan Soto, Michael T. Stocker, P Lipscomb, Egon Marx, Heather J. Patrick, Ronald G. Dixson, Robert D. Larrabee
An overview of the challenges encountered in imaging device-sized features using optical techniques recently developed in our laboratories is presented in this
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