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Conferences

Comparison of scanning capacitance microscopy and scanning Kelvin probe microscopy in determining two-dimensional doping profiles of Si homostructures

February 1, 2006

Author(s)

Seong-Eun Park, Nhan V. Nguyen, Joseph J. Kopanski, John S. Suehle, Eric M. Vogel

Two-dimensional (2-D) doping profiles of differently doped Si homostructures were investigated by scanning capacitance microscopy (SCM) and scanning Kelvin

Compilation of Wavelengths and Energy Levels of Tungsten, W III Through W LXXIV

February 1, 2006

Author(s)

Alexander Kramida, T Shirai

The methods used to critically evaluate and compile the data on energy levels, wavelengths, and ionization potentials of multiply ionized tungsten and other

The development of procedures for impact testing

February 1, 2006

Author(s)

Thomas A. Siewert, Christopher N. McCowan

This report provides a broad overview of the progress in procedural improvements for impact testing. It includes a short summary of early developments, a

High spatial resolution measurements of transverse stress in a fiber Bragg grating using four-state analysis low-coherence interferometry and layer-peeling

February 1, 2006

Author(s)

Robert J. Espejo, Shellee D. Dyer

Fiber Bragg grating (FBG) sensors have been shown to be a good means of non-destructive monitoring of the stress and/or strain of the materials in which they

Overview of the First Advanced Technology Evaluations for ASSIST

January 31, 2006

Author(s)

Craig I. Schlenoff, Brian A. Weiss, Michelle P. Steves, Ann M. Virts, Michael O. Shneier, Michael Linegang

ASSIST (Advanced Soldier Sensor Information Systems Technology) is a DARPA-funded effort whose goal is to exploit soldier-worn sensors to augment the soldier s

USARSim: Providing a Framework for Multi-Robot Performance Evaluation

January 31, 2006

Author(s)

Stephen B. Balakirsky, Christopher J. Scrapper Jr, Stefano Carpin, M L. Lewis

Research efforts in urban search and rescue robotics have grown substantially in recent years. Two important robotic competitions (a robot physical league and a

High Sensitivity Measurements of the Scattering Dispersion of Phantoms using Spectral Domain Optical Coherence Tomography

January 26, 2006

Author(s)

Shellee D. Dyer, Tasshi Dennis, Paul A. Williams, Lara Roberson, Shelley M. Etzel, Robert J. Espejo, Thomas Germer, T E. Milner

We demonstrate a novel technique to determine the size of Mie scatterers with high sensitivity. Our technique is based on spectral domain optical coherence

Noise model for polarization-sensitive Optical Coherence Tomography

January 26, 2006

Author(s)

Paul A. Williams, Nate J. Kemp, David Ives, Jesung Park, Dwelle C. Jordan, H. Grady Rylander, Thomas E. Milner

Characterizing and quantifying noise sources in birefringence imaging with polarization-sensitive optical coherence tomography (PS-OCT) is necessary for the

A Novel Hemispherical Spectro-Polarimetric Scattering Instrument for Skin Lesion Imaging

January 22, 2006

Author(s)

Bruno Boulbry, Thomas A. Germer, J C. Ramella-Roman

We present a novel spectro-polarimetric instrument based on hemispherical backscattering for the assessment of superficial skin lesions. The system is capable

Development of a solid-state 100 mK refrigerator for user-supplied microelectronics

January 4, 2006

Author(s)

Nathan A. Tomlin, William Duncan, James A. Beall, Gene C. Hilton, Kent D. Irwin, Dan Schmidt, Joel Ullom

Solid-state refrigerators based on normal metal/insulator/superconductor tunnel junctions are now a practical means of cooling from pumped 3He bath temperatures

Discrete Fourier Series Approximation to Periodic Solutions of Autonomous Delay Differential Equations

January 2, 2006

Author(s)

David E. Gilsinn

We begin this expository essay by reviewing with examples what a typical engineer already knows about statistics. We then consider a central question in

A Single Discharge Study of Micro-EDM

January 1, 2006

Author(s)

Shawn P. Moylan

Micro-Electro-Discharge Machining (micro-EDM) is gaining in popularity within the micro- and meso-scale machining community. The process is very well suited to

Active light shift stabilization in modulated CPT clocks

January 1, 2006

Author(s)

V Shah, Peter D. Schwindt, Vladislav Gerginov, Svenja A. Knappe, Leo W. Hollberg, John E. Kitching

Optical Metrology for LEDs and Solid State Lighting

January 1, 2006

Author(s)

Yoshihiro Ohno

The Effect of Gaussian Filter Long Wavelength Cutoff in Topography Comparisons and Measurements

January 1, 2006

Author(s)

Jun-Feng Song, Lijun Ma, Theodore V. Vorburger

Five parameters are used for 2D and 3D topography comparisons and measurements, those include two correlation parameters Ds and CCFmax , and three surface

Spectroscopy of atomic and molecular ions using quantum logic

January 1, 2006

Author(s)

P Schwindt, Jeroen Koelemeij, David Hume, Wayne M. Itano, James C. Bergquist, David J. Wineland

A Spectrally Tunable LED Sphere Source Enables Accurate Calibration of Tristimulus Colorimeters

January 1, 2006

Author(s)

Irena Fryc, Steven W. Brown, Yoshihiro Ohno

Recent Developments in the Standardization and Testing of Laser Trackers

January 1, 2006

Author(s)

Daniel S. Sawyer, Steven D. Phillips, Bruce R. Borchardt, William T. Estler

Blackbody radiation shift of the ²⁷Al⁺ ¹S₀ - ³P₀0 transition

January 1, 2006

Author(s)

Till P. Rosenband, Wayne M. Itano, P. O. Schmidt, David Hume, Jeroen Koelemeij, James C. Bergquist, David J. Wineland

Uncertainties of Spectral Responsivity Measurements

January 1, 2006

Author(s)

George P. Eppeldauer, G Sauter, J L. Gardner

Calibration Reproductibility Test for NIST's No. 3581 Standard Rockwell Diamond Indenter

January 1, 2006

Author(s)

Jun-Feng Song, Samuel R. Low III, A Zheng

Standard Rockwell diamond indenter plays an important role for a worldwide unified Rockwell hardness scale. In 1994, NIST established a microform calibration

A Compact High Stability Optical Clock Based on Laser-Cooled Ca

January 1, 2006

Author(s)

Christopher W. Oates, Yann Le Coq, G Wilpers, Leo W. Hollberg

Development of the NIST Detector-based Color Temperature Scale

January 1, 2006

Author(s)

George P. Eppeldauer, Yoshihiro Ohno

Optimizing Machining Processes for Precision: An Example using calculated cutting forces

January 1, 2006

Author(s)

Richard L. Rhorer

A common machining problem is to find the maximum material rate possible by adjusting the cutting speed, width of cut, and depth of cut for a given process

Stability Measurements of the Ca and Yb Optical Frequency Standards

January 1, 2006

Author(s)

Christopher W. Oates, Hoyt c, Yann Le Coq, Zeb Barber, Tara M. Fortier, Jason Stalnaker, Scott A. Diddams, Leo W. Hollberg

Measuring Color Quality of Light Sources

January 1, 2006

Author(s)

Wendy L. Davis

Mini-Fizeau Interferometer for Curvature Sensing in the NIST Geometry Measuring Machine

January 1, 2006

Author(s)

Quandou (. Wang, Ulf Griesmann

We describe the design of a miniature Fizeau interferometer, which is intended to be an accurate curvature sensor for the NIST Geometry Measuring (GEMM), which

Increasing the Modulation Depth of the WWVB Time Code to Improve the Performance of Radio Controlled Clocks

January 1, 2006

Author(s)

John P. Lowe, Ken C. Allen

Evaluation of Colour Difference Formulae for Colour Rendering Metrics

January 1, 2006

Author(s)

Wendy L. Davis, Yoshihiro Ohno

Calibration of Microfabricated Cantilevers for SI-Traceable Small Force Measurement

January 1, 2006

Author(s)

Gordon A. Shaw, Jon R. Pratt, John A. Kramar

A procedure is described by which the spring constant of a microfabricated cantilever beam can be calibrated for the measurement of small forces in an atomic

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