Noise model for polarization-sensitive Optical Coherence Tomography

Published

January 26, 2006

Author(s)

Paul A. Williams, Nate J. Kemp, David Ives, Jesung Park, Dwelle C. Jordan, H. Grady Rylander, Thomas E. Milner

Abstract

Characterizing and quantifying noise sources in birefringence imaging with polarization-sensitive optical coherence tomography (PS-OCT) is necessary for the development of efficient noise reduction techniques for real-time clinical PS-OCT imaging. We propose three noise regimes based on the strength of specimen backscattering and dominated by different sources. We introduce a model that predicts noise effects in two regimes. The model includes source/detector intensity noise, and couples speckle effects with the longitudinal delays due to instrument and specimen birefringence to create realistic noise on simulated simulated orthogonal interference fringe amplitudes and on their relative phases. Experimental examples of the three regimes are presented and in two of them, qualitative agreement between the model and experimental data is demonstrated.

Proceedings Title

Proc. SPIE, Biomedical Optics, 2006

Conference Dates

January 21-26, 2006

Conference Location

San Jose, CA, USA

Pub Type

Conferences

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Keywords

birefringence, OCT, Optical coherence tomography, PS-OCT, RNFL, noise, speckle, polarization speckle

Citation

Williams, P. , Kemp, N. , Ives, D. , Park, J. , Jordan, D. , Rylander, H. and Milner, T. (2006), Noise model for polarization-sensitive Optical Coherence Tomography, Proc. SPIE, Biomedical Optics, 2006, San Jose, CA, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32190 (Accessed December 15, 2024)