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Noise model for polarization-sensitive Optical Coherence Tomography

Published

Author(s)

Paul A. Williams, Nate J. Kemp, David Ives, Jesung Park, Dwelle C. Jordan, H. Grady Rylander, Thomas E. Milner

Abstract

Characterizing and quantifying noise sources in birefringence imaging with polarization-sensitive optical coherence tomography (PS-OCT) is necessary for the development of efficient noise reduction techniques for real-time clinical PS-OCT imaging. We propose three noise regimes based on the strength of specimen backscattering and dominated by different sources. We introduce a model that predicts noise effects in two regimes. The model includes source/detector intensity noise, and couples speckle effects with the longitudinal delays due to instrument and specimen birefringence to create realistic noise on simulated simulated orthogonal interference fringe amplitudes and on their relative phases. Experimental examples of the three regimes are presented and in two of them, qualitative agreement between the model and experimental data is demonstrated.
Proceedings Title
Proc. SPIE, Biomedical Optics, 2006
Conference Dates
January 21-26, 2006
Conference Location
San Jose, CA, USA

Keywords

birefringence, OCT, Optical coherence tomography, PS-OCT, RNFL, noise, speckle, polarization speckle

Citation

Williams, P. , Kemp, N. , Ives, D. , Park, J. , Jordan, D. , Rylander, H. and Milner, T. (2006), Noise model for polarization-sensitive Optical Coherence Tomography, Proc. SPIE, Biomedical Optics, 2006, San Jose, CA, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32190 (Accessed June 15, 2024)

Issues

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Created January 25, 2006, Updated October 12, 2021