Eppeldauer, G.
and Ohno, Y.
(2006),
Development of the NIST Detector-based Color Temperature Scale, CIE Expert Symposium on 75 Years of the CIE Standard Colorimetric Observer , Ottawa, CH
(Accessed November 30, 2023)
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Development of the NIST Detector-based Color Temperature Scale
Published
Author(s)
,
Proceedings Title
CIE Expert Symposium on 75 Years of the CIE Standard Colorimetric Observer
Conference Dates
May 16-17, 2006
Conference Location
Ottawa, CH
Conference Title
Proc. CIE Expert Symposium on 75 Years of the CIE Standard Colorimetric Observer
Pub Type
Conferences
Citation
Created January 1, 2006, Updated February 17, 2017