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Development of the NIST Detector-based Color Temperature Scale

Published

Author(s)

George P. Eppeldauer, Yoshihiro Ohno
Proceedings Title
CIE Expert Symposium on 75 Years of the CIE Standard Colorimetric Observer
Conference Dates
May 16-17, 2006
Conference Location
Ottawa, CH
Conference Title
Proc. CIE Expert Symposium on 75 Years of the CIE Standard Colorimetric Observer

Citation

Eppeldauer, G. and Ohno, Y. (2006), Development of the NIST Detector-based Color Temperature Scale, CIE Expert Symposium on 75 Years of the CIE Standard Colorimetric Observer , Ottawa, CH (Accessed May 23, 2024)

Issues

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Created January 1, 2006, Updated February 17, 2017