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PUBLICATIONS

Development of the NIST Detector-based Color Temperature Scale

Published

Author(s)

George P. Eppeldauer, Yoshihiro Ohno
Proceedings Title
CIE Expert Symposium on 75 Years of the CIE Standard Colorimetric Observer
Conference Dates
May 16-17, 2006
Conference Location
Ottawa, CH
Conference Title
Proc. CIE Expert Symposium on 75 Years of the CIE Standard Colorimetric Observer
Pub Type
Conferences

Citation

Eppeldauer, G. and Ohno, Y. (2006), Development of the NIST Detector-based Color Temperature Scale, CIE Expert Symposium on 75 Years of the CIE Standard Colorimetric Observer , Ottawa, CH (Accessed October 10, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created January 1, 2006, Updated February 17, 2017
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