Eppeldauer, G.
and Ohno, Y.
(2006),
Development of the NIST Detector-based Color Temperature Scale, CIE Expert Symposium on 75 Years of the CIE Standard Colorimetric Observer , Ottawa, CH
(Accessed May 13, 2025)
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Development of the NIST Detector-based Color Temperature Scale
Published
Author(s)
,
Proceedings Title
CIE Expert Symposium on 75 Years of the CIE Standard Colorimetric Observer
Conference Dates
May 16-17, 2006
Conference Location
Ottawa, CH
Conference Title
Proc. CIE Expert Symposium on 75 Years of the CIE Standard Colorimetric Observer
Pub Type
Conferences
Citation
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Created January 1, 2006, Updated February 17, 2017