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High Sensitivity Measurements of the Scattering Dispersion of Phantoms using Spectral Domain Optical Coherence Tomography

Published

Author(s)

Shellee D. Dyer, Tasshi Dennis, Paul A. Williams, Lara Roberson, Shelley M. Etzel, Robert J. Espejo, Thomas Germer, T E. Milner

Abstract

We demonstrate a novel technique to determine the size of Mie scatterers with high sensitivity. Our technique is based on spectral domain optical coherence tomography measurements of the dispersion that is induced by the scattering process. We use both Mie scattering theory and dispersion measurements of phantoms to show that the scattering dispersion is very sensitive to small changes in the size and/or refractive index of the scatterer.
Volume
6079
Issue
60791Q
Conference Dates
January 21-26, 2006
Conference Location
San Jose, CA, USA
Conference Title
SPIE Coherence Domain Optical Methods and Optical Coherence Tomography in Biomedicine X

Keywords

cancer, dispersion, Mie scattering, optical coherence tomography, spectral domain

Citation

Dyer, S. , Dennis, T. , Williams, P. , Roberson, L. , Etzel, S. , Espejo, R. , Germer, T. and Milner, T. (2006), High Sensitivity Measurements of the Scattering Dispersion of Phantoms using Spectral Domain Optical Coherence Tomography, SPIE Coherence Domain Optical Methods and Optical Coherence Tomography in Biomedicine X, San Jose, CA, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32051 (Accessed May 21, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 25, 2006, Updated October 12, 2021