High Sensitivity Measurements of the Scattering Dispersion of Phantoms using Spectral Domain Optical Coherence Tomography

Published

January 26, 2006

Author(s)

Shellee D. Dyer, Tasshi Dennis, Paul A. Williams, Lara Roberson, Shelley M. Etzel, Robert J. Espejo, Thomas Germer, T E. Milner

Abstract

We demonstrate a novel technique to determine the size of Mie scatterers with high sensitivity. Our technique is based on spectral domain optical coherence tomography measurements of the dispersion that is induced by the scattering process. We use both Mie scattering theory and dispersion measurements of phantoms to show that the scattering dispersion is very sensitive to small changes in the size and/or refractive index of the scatterer.

Volume

6079

Issue

60791Q

Conference Dates

January 21-26, 2006

Conference Location

San Jose, CA, USA

Conference Title

SPIE Coherence Domain Optical Methods and Optical Coherence Tomography in Biomedicine X

Pub Type

Conferences

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Keywords

cancer, dispersion, Mie scattering, optical coherence tomography, spectral domain

Citation

Dyer, S. , Dennis, T. , Williams, P. , Roberson, L. , Etzel, S. , Espejo, R. , Germer, T. and Milner, T. (2006), High Sensitivity Measurements of the Scattering Dispersion of Phantoms using Spectral Domain Optical Coherence Tomography, SPIE Coherence Domain Optical Methods and Optical Coherence Tomography in Biomedicine X, San Jose, CA, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32051 (Accessed September 20, 2024)