Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Conferences

Monitoring I/Q data and pulse carving misalignments in RZ-DQPSK transmitters using a neural network approach

November 1, 2008

Author(s)

Jeffrey A. Jargon, Xiaoxia Wu, Louis Christen, Alan Willner, Loukas Paraschis

We propose a technique using artificial neural networks (ANNs) to simultaneously identify I/Q data misalignment and data/carver misalignment in both parallel...

Local Geometric Projection-Based Noise Reduction for Vibration Signal Analysis in Rolling Bearings

October 31, 2008

Author(s)

Kang B. Lee, Steven E. Fick, Robert Gao, Ruqiang Yan

This paper presents a noise reduction technique for vibration signal analysis in rolling bearings, based on local geometric projection (LGP). LGP is a non...

NIST BusiBEES METRICS AND TOOLS FOR GREEN BUILDINGS

October 31, 2008

Author(s)

Barbara C. Lippiatt, Jennifer Helgeson

Building stakeholders need compelling metrics, tools, data, and case studies supporting major investments in sustainable building technologies. Proponents of...

UV pulse response nonlinearity of two Si photodiodes

October 30, 2008

Author(s)

Shao Yang, Darryl A. Keenan, Marla L. Dowell

We measured the pulse response nonlinearity of two silicon photodiodes at 193 and 248 nm with different measurement conditions. We found large and different...

Vulnerability Scoring for Security Configuration Settings

October 29, 2008

Author(s)

Karen A. Scarfone, Peter M. Mell

The best-known vulnerability scoring standard, the Common Vulnerability Scoring System (CVSS), is designed to quantify the severity of security-related software...

MOLECULAR RELAXATIONS AND MORPHOLOGY OF PERFLUOROSULFONATE IONOMERS FOR FUEL CELL APPLICATIONS

October 28, 2008

Author(s)

Kirt A. Page, Alamgir Karim

Perfluorosulfonate ionomers (PFSIs) are of great importance in polymer electrolyte membrane fuel cell (PEMFC) applications. In order to optimize membrane...

Broadband Dielectric Material Characterization: A Comparison of On-Wafer and Split-Cylinder Resonator Measurements

October 27, 2008

Author(s)

Michael D. Janezic, Uwe Arz

We examine a broadband method to extract the relative permittivity and loss tangent of low-loss dielectric substrates from on-wafer scattering-parameter...

A microfabricated photonic magnetometer

October 26, 2008

Author(s)

Jan Preusser, Vladislav Gerginov, Svenja A. Knappe, John E. Kitching

An integrated optically-controlled sensor, suitable for remote, high-sensitivity detection of magnetic fields is presented. The sensor head is free of...

Characterization and Modeling of Random Vector Network Analyzer Measurement Errors

October 24, 2008

Author(s)

Arkadiusz C. Lewandowski, Dylan F. Williams

We present a technique for characterizing and modeling random vector-network-analyzer measurement errors. These errors manifest themselves as random changes or...

Establishment of the SIM Time Scale

October 22, 2008

Author(s)

Michael A. Lombardi, Nelida Diaz-Munoz, J. Mauricio Lopez-Romero

The SIM time and frequency metrology working group has developed a comparison network for the Americas, with the goals of improving metrology in the SIM region...

Unexpectedly high encapsulation efficiency in nanometer scale liposomes with hydrodynamic focusing using continuous-flow microfluidcs

October 20, 2008

Author(s)

Andreas Jahn

A method is presented for achieving high entrapment efficiencies of a hydrophilic drug simulant, sulforhodamine B (SRB), in nanometer-scale liposomes using a...

Radius Measurement of Spherical Surfaces With Large Radii-of-Curvature Using Dual-Focus Zone Plates

October 20, 2008

Author(s)

Quandou (. Wang, Guangjun Gao, Ulf Griesmann

The measurement of spherical surface radii exceeding a few meters presents a challenge, because the familiar radius-bench method requires large part...

Technical Aspects of the Dissemination of the Air-Kerma Standard from Cs137 Gamma-Ray Beams in the United States

October 20, 2008

Author(s)

Ronaldo Minniti

The national standard for air kerma from gamma-ray beams is maintained in the US by the National Institute of Standards and Technology (NIST), the primary...

Error Motions of a Non-orthogonal Rotary Axis

October 19, 2008

Author(s)

Michael L. McGlauflin, Shawn P. Moylan

Error-motions of rotating axes are one of many sources of imprecision in machining. Accurate determination of axis of rotation error motions of the rotary axes...

A Platform for Observing the Behavior of AFM Cantilevers During Quasi-Static Loading

October 19, 2008

Author(s)

Jon R. Pratt, Lee M. Kumanchik, Tony L. Schmitz

This paper describes a platform for studying the bending behavior of ultra-compliant (stiffness less than 1 N/m) atomic force microscope (AFM) cantilevers. The...

OPTIMIZING GAUSSIAN FILTER LONG WAVELENGTH CUTOFF »c FOR IMPROVING 3D BALLISTICS SIGNATURE CORRELATIONS

October 19, 2008

Author(s)

Jun-Feng Song, Li Ma, Theodore V. Vorburger, Susan M. Ballou

In the ballistics measurements and correlations, optimum selection of c has particular importance for an unambiguous extraction of Individual Characteristics...

Comparison of NIST SI Force Scale to NPL SI Mass Scale

October 19, 2008

Author(s)

Christopher W. Jones, John A. Kramar, Stuart Davidson, Richard Leach, Jon R. Pratt

Small masses in the 1.0 mg to 0.1 mg range were developed and calibrated at NPL with traceability to the IPK. These masses were transported to NIST at...

A COMPACT, COMPOUND ACTUATOR FOR THE MOLECULAR MEASURING MACHINE

October 19, 2008

Author(s)

Jing Li, Yin-Lin Shen, Jaehwa Jeong, Fredric Scire, John A. Kramar

A compact, two-stage, vertical actuator with built-in sensors has been developed for the Molecular Measuring Machine (M3) and other potential precision...

High Performance Organic Thin-Film Transistors Made Simple Through Molecular Design and Processing

October 17, 2008

Author(s)

Oana Jurchescu, Marina Feric, Behrang H. Hamadani, M. Devin, Sankar Subramanian, Balaji Purushothamanc, John E. Anthony, Thomas Jackson, David J. Gundlach

We report on a simple a method of inducing self-isolation of the thin film transistors via manipulation of the chemical interactions between the organic...

The Origins of Random Telegraph Noise in Highly Scaled SiON nMOSFETs

October 17, 2008

Author(s)

Jason P. Campbell, Jin Qin, Kin P. Cheung, Liangchun (. Yu, John S. Suehle, A Oates, Kuang Sheng

Random telegraph noise (RTN) has recently become an important issue in advanced circuit performance. It has also recently been used as a tool for gate...

The transient behavior of NBTI - A new prospective

October 17, 2008

Author(s)

Kin P. Cheung, Jason P. Campbell

The Negative-Bias-Temperature-Instability (NBTI) is currently one of the most serious reliability issues in advanced CMOS technology. Specifically, the fast...

Re-calibration of the NIST SRM 2059 Master Standard using Traceable Atomic Force Microscope Metrology

October 17, 2008

Author(s)

Ronald G. Dixson, James E. Potzick, Ndubuisi G. Orji

The National Institute of Standards and Technology (NIST) has had a robust program in photomask dimensional metrology since the late 70s when the late Diana...

International photomask linewidth comparison by NIST and PTB

October 17, 2008

Author(s)

James E. Potzick, Ronald G. Dixson, Richard Quintanilha, Michael T. Stocker, Andras Vladar, Egbert Buhr, Bernd Bodermann, Wolfgang Hassler-Grohne, Harald Bosse, C.G. Frase

In preparation of the international Nano1 linewidth comparison on photomasks between 8 national metrology institutes, NIST and PTB have started a bilateral...

Standardization of Auxiliary Equipment for Next Generation CNC Machining

October 17, 2008

Author(s)

David Odendahl, Sid Venkatesh, John L. Michaloski, Frederick M. Proctor

This paper presents the recent work of the Open Modular Architecture Control (OMAC) Machine Tool Working Group to support STEP-NC, which is a new standard for...

Dielectric Measurement Methods at Millimeter Wave Frequencies

October 16, 2008

Author(s)

Michael D. Janezic

We review several techniques for making accurate relative permittivity and loss tangent measurements of low-loss dielectric materials at frequencies between 30...

Milk: Does it Measure Up? - One Year Later - A Report on the Accuracy of Net Content Labeling of Milk

October 16, 2008

Author(s)

Lena Jung

This federal/state study follows up on a study conducted last year on the accuracy of net content labeling of milk and other products. The 1997 study found that...

Overview of the Development of Technical Infrastructure in the Asia-Pacific Region: the Work of the Asia-Pacific Economic Cooperation (APEC) Sub-Committee on Standards and Conformance (SCSC) and the Specialist Regional Body

October 16, 2008

Author(s)

C R. DeVaux

The development and maintenance of an economy's standards and conformance technical infrastructure is critical to its economic health. By increasing the...

New Approaches to Serving Library Users

October 16, 2008

Author(s)

C L. Clark

The NIST Research Library serves over 3,000 Science & Technology customers; provides access to 200,000 items, 1,000 journal subscriptions, 700 databases...

NCWM Publication 5, National Type Evaluation Program - Index of Device Evaluationa, Tenth Edition, Supplement 1

October 16, 2008

Author(s)

L T. Sebring

This publication contains index listings and copies of Certificates of conformance for all devices that have been type evaluated under the National Type...

The Customer Speaks: Satisfaction With and Use of Library Resources

October 16, 2008

Author(s)

Barbara P. Silcox

The Research Advisory Committee (RAC) at the National Institute of Standards and Technology in its 2000 Annual Report to the NIST Director expressed concern...

Was this page helpful?