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Conferences

Establishment of the SIM Time Scale

October 22, 2008

Author(s)

Michael A. Lombardi, Nelida Diaz-Munoz, J. Mauricio Lopez-Romero

The SIM time and frequency metrology working group has developed a comparison network for the Americas, with the goals of improving metrology in the SIM region...

Unexpectedly high encapsulation efficiency in nanometer scale liposomes with hydrodynamic focusing using continuous-flow microfluidcs

October 20, 2008

Author(s)

Andreas Jahn

A method is presented for achieving high entrapment efficiencies of a hydrophilic drug simulant, sulforhodamine B (SRB), in nanometer-scale liposomes using a...

Radius Measurement of Spherical Surfaces With Large Radii-of-Curvature Using Dual-Focus Zone Plates

October 20, 2008

Author(s)

Quandou (. Wang, Guangjun Gao, Ulf Griesmann

The measurement of spherical surface radii exceeding a few meters presents a challenge, because the familiar radius-bench method requires large part...

Technical Aspects of the Dissemination of the Air-Kerma Standard from Cs137 Gamma-Ray Beams in the United States

October 20, 2008

Author(s)

Ronaldo Minniti

The national standard for air kerma from gamma-ray beams is maintained in the US by the National Institute of Standards and Technology (NIST), the primary...

Error Motions of a Non-orthogonal Rotary Axis

October 19, 2008

Author(s)

Michael L. McGlauflin, Shawn P. Moylan

Error-motions of rotating axes are one of many sources of imprecision in machining. Accurate determination of axis of rotation error motions of the rotary axes...

A Platform for Observing the Behavior of AFM Cantilevers During Quasi-Static Loading

October 19, 2008

Author(s)

Jon R. Pratt, Lee M. Kumanchik, Tony L. Schmitz

This paper describes a platform for studying the bending behavior of ultra-compliant (stiffness less than 1 N/m) atomic force microscope (AFM) cantilevers. The...

OPTIMIZING GAUSSIAN FILTER LONG WAVELENGTH CUTOFF »c FOR IMPROVING 3D BALLISTICS SIGNATURE CORRELATIONS

October 19, 2008

Author(s)

Jun-Feng Song, Li Ma, Theodore V. Vorburger, Susan M. Ballou

In the ballistics measurements and correlations, optimum selection of c has particular importance for an unambiguous extraction of Individual Characteristics...

Comparison of NIST SI Force Scale to NPL SI Mass Scale

October 19, 2008

Author(s)

Christopher W. Jones, John A. Kramar, Stuart Davidson, Richard Leach, Jon R. Pratt

Small masses in the 1.0 mg to 0.1 mg range were developed and calibrated at NPL with traceability to the IPK. These masses were transported to NIST at...

A COMPACT, COMPOUND ACTUATOR FOR THE MOLECULAR MEASURING MACHINE

October 19, 2008

Author(s)

Jing Li, Yin-Lin Shen, Jaehwa Jeong, Fredric Scire, John A. Kramar

A compact, two-stage, vertical actuator with built-in sensors has been developed for the Molecular Measuring Machine (M3) and other potential precision...

High Performance Organic Thin-Film Transistors Made Simple Through Molecular Design and Processing

October 17, 2008

Author(s)

Oana Jurchescu, Marina Feric, Behrang H. Hamadani, M. Devin, Sankar Subramanian, Balaji Purushothamanc, John E. Anthony, Thomas Jackson, David J. Gundlach

We report on a simple a method of inducing self-isolation of the thin film transistors via manipulation of the chemical interactions between the organic...

The Origins of Random Telegraph Noise in Highly Scaled SiON nMOSFETs

October 17, 2008

Author(s)

Jason P. Campbell, Jin Qin, Kin P. Cheung, Liangchun (. Yu, John S. Suehle, A Oates, Kuang Sheng

Random telegraph noise (RTN) has recently become an important issue in advanced circuit performance. It has also recently been used as a tool for gate...

The transient behavior of NBTI - A new prospective

October 17, 2008

Author(s)

Kin P. Cheung, Jason P. Campbell

The Negative-Bias-Temperature-Instability (NBTI) is currently one of the most serious reliability issues in advanced CMOS technology. Specifically, the fast...

Re-calibration of the NIST SRM 2059 Master Standard using Traceable Atomic Force Microscope Metrology

October 17, 2008

Author(s)

Ronald G. Dixson, James E. Potzick, Ndubuisi G. Orji

The National Institute of Standards and Technology (NIST) has had a robust program in photomask dimensional metrology since the late 70s when the late Diana...

International photomask linewidth comparison by NIST and PTB

October 17, 2008

Author(s)

James E. Potzick, Ronald G. Dixson, Richard Quintanilha, Michael T. Stocker, Andras Vladar, Egbert Buhr, Bernd Bodermann, Wolfgang Hassler-Grohne, Harald Bosse, C.G. Frase

In preparation of the international Nano1 linewidth comparison on photomasks between 8 national metrology institutes, NIST and PTB have started a bilateral...

Standardization of Auxiliary Equipment for Next Generation CNC Machining

October 17, 2008

Author(s)

David Odendahl, Sid Venkatesh, John L. Michaloski, Frederick M. Proctor

This paper presents the recent work of the Open Modular Architecture Control (OMAC) Machine Tool Working Group to support STEP-NC, which is a new standard for...

Dielectric Measurement Methods at Millimeter Wave Frequencies

October 16, 2008

Author(s)

Michael D. Janezic

We review several techniques for making accurate relative permittivity and loss tangent measurements of low-loss dielectric materials at frequencies between 30...

New Approaches to Serving Library Users

October 16, 2008

Author(s)

C L. Clark

The NIST Research Library serves over 3,000 Science & Technology customers; provides access to 200,000 items, 1,000 journal subscriptions, 700 databases...

Overview of the Development of Technical Infrastructure in the Asia-Pacific Region: the Work of the Asia-Pacific Economic Cooperation (APEC) Sub-Committee on Standards and Conformance (SCSC) and the Specialist Regional Body

October 16, 2008

Author(s)

C R. DeVaux

The development and maintenance of an economy's standards and conformance technical infrastructure is critical to its economic health. By increasing the...

NCWM Publication 5, National Type Evaluation Program - Index of Device Evaluationa, Tenth Edition, Supplement 1

October 16, 2008

Author(s)

L T. Sebring

This publication contains index listings and copies of Certificates of conformance for all devices that have been type evaluated under the National Type...

The Customer Speaks: Satisfaction With and Use of Library Resources

October 16, 2008

Author(s)

Barbara P. Silcox

The Research Advisory Committee (RAC) at the National Institute of Standards and Technology in its 2000 Annual Report to the NIST Director expressed concern...

Milk: Does it Measure Up? - One Year Later - A Report on the Accuracy of Net Content Labeling of Milk

October 16, 2008

Author(s)

Lena Jung

This federal/state study follows up on a study conducted last year on the accuracy of net content labeling of milk and other products. The 1997 study found that...

From Desktop to Hand-Held Devices: Are e-books a Viable Mechanism for Distributing Resources From the NIST Virtual Library (NVL)?

October 16, 2008

Author(s)

Barbara P. Silcox

The burgeoning electronic book (e-book) trend offers a new concept on how information is transmitted and utilized. NIST's Office of Information Services (OIS)...

Globalization of Technical and Safety Standards

October 16, 2008

Author(s)

H V. Oppermann

Standards and conformity assessment practices can have a major impact on competitiveness and ease of access to the international market. Even if companies are...

Using Outcome Tracking to Plan Our E-Journal Future

October 16, 2008

Author(s)

Barbara P. Silcox

This session will address how the NIST Research Library uses customer data to make collection development decisions. The presentation will briefly describe the...

Views and Experience on Quality Assurance & Quality Control and Comments and Suggestions on Consultants' Meeting Report Quality Control and Quality Assurance of Nuclear Analytical Techniques

October 16, 2008

Author(s)

C S. Brickenkamp

The IAEA is convening an Advisory Group Meeting of 5 experts from around the globe to advise the Agency on the content of training courses, and estimates of...

The Corporate Structure of an AB - How Pure is Pure Enough? From an MRA Evaluator's Point of View

October 16, 2008

Author(s)

Jeffrey Horlick

This brief presentation defines independence as it relates to the corporate structure of a laboratory accreditation body. Requirements are referenced from ISO...

Materials Processing in the Advanced Technology Program

October 16, 2008

Author(s)

Clare M. Allocca

The NIST Advanced Technology Program is a unique partnership between government and private industry to accelerate the development of high-risk technologies...

Small-Firm Experience in the Advanced Technology Program

October 16, 2008

Author(s)

J Powell

This paper assesses plans and progress of high technology small firms (HTSF) funded by the Advanced Technology Program (ATP), a U.S. civilian science and...

Robustness Experiments with Two Variance Components

October 16, 2008

Author(s)

A Aviles

In many experimental settings, different types of factors affect the measured response. The factors that can be set independently of each other are called...

AutoMap et AutoLink: Outils aidant a la gestion de types de donnes avec MPI [AutoMap and AutoLink: Tools for Communicating Complex and Dynamic Data Structures Using MPI]

October 16, 2008

Author(s)

Martial Michel, J E. Devaney

This article describes two software tools, AutoMap and AutoLink, that facilitate the use of data structures in MPI. AutoMap is a program that parses a file of...

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