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Xiao Zhu, Dhananjay Anand, Sulaiman Hussain, Ya-Shian Li-Baboud, James Moyne
Realizing benefits from real-time process control requires in-situ monitoring of process environment, equipment, and the wafer to maximize opportunities for
Un dispositif de conception assez simple a été développé pour mesurer directement le seuil de cisaillement de diverses suspensions concentrées. Il consiste en
The mismatch of spectral responsivity to the CIE V(lambda) function, i. e., the f1' index, is the most critical characteristic of photometers and tristimulus
P J. Phillips, Kevin W. Bowyer, Patrick J. Flynn, Xiaomei Liu, W T. Scruggs
This paper describes the Iris Challenge Evaluation (ICE) 2005. The ICE 2005 contains a dataset of 2953 iris images from 132 subjects. The data is organized into
This paper introduces an application framework for the Institute of Electrical and Electronics Engineers (IEEE) 1588 standard. This application framework
John M. Treinen, Philippe P. Darcis, Joseph D. McColskey, R. Smith, J. Merritt
In this study, the effect of specimen geometry on the fatigue crack growth rates (FCGR) in API X65 and X100 pipeline steels was explored using the middle
Nathan D. Marsh, Richard G. Gann, Jason D. Averill, Marc R. Nyden
Experiments have been conducted in the NFPA 269/ASTM E 1678 radiant apparatus to determine the sensitivity of toxic gas generation to atmospheric oxygen
The Joint NIST/AFRL Workshop on Rocket Propellants and Hypersonic Vehicle Fuels was held on September 25 and 26, 2008 at the Boulder, Colorado laboratories of
Fluorinated and acrylic coatings are commonly used as binders for exterior coatings because of their excellent resistance to UV radiation and many corrosive
This paper presents an experimental investigation of the dynamics of a custom-designed spindle test system under different operation conditions and at various
Nicholas G. Paulter Jr., Thomas E. Linnenbrink, W. B. Boyer, Robert Graham, S. J. Tilden
There is a world-wide need to standardize terms, test methods, and the computation of performance parameters for devices that generate, measure, and analyze
Mary F. Theofanos, Ross J. Micheals, Shahram Orandi, Brian C. Stanton, Nien F. Zhang, Charles L. Sheppard
As the deployment of biometric technologies such as fingerprints has become more widespread in government applications there is an increased awareness of the
James Moyne, Ya-Shian Li-Baboud, Xiao Zhu, Dhananjay Anand, Sulaiman Hussain
The ability to acquire quality equipment and process data is pertinent for future real-time process control systems to maximize opportunities for semiconductor
We present a synopsis of results comparing the performance of humans with face recognition algorithms tested in the Face Recognition Vendor Test (FRVT) 2006 and
P J. Phillips, J. R. Beveridge, Geof H. Givens, Bruce A. Draper, Yui M. Lui
This paper summarizes a study carried out on data from the Face Recognition Vendor Test 2006 (FRVT 2006). The finding of greatest practical importance is the
Eric P. Whitenton, Jarred C. Heigel, Robert W. Ivester
Comparing measured chip formation characteristics to those predicted by machining models is an important technique for testing the validity of those models
Jarred C. Heigel, Robert W. Ivester, Eric P. Whitenton
This paper presents a method of implementing dynamic material properties obtained through pulse-heated Kolsky Bar (Split-Hopkinson Bar) experimentation into
Lorelle Mansfield, Paul T. Blanchard, Devin M. Rourke, Aric W. Sanders, Norman A. Sanford, Kristine A. Bertness
GaN nanowires doped with silicon were grown on Si(111) substrates by catalyst-free molecular beam epitaxy (MBE). Contacts were fabricated to single nanowires
In the hp-adaptive version of the finite element method for solving partial differential equations, the grid is adaptively refined in both h, the size of the
As part of the optical detector characterization program at the Optical Technology Division at NIST, we have established a capability for the calibration of
Richard A. Rouil, Nada T. Golmie, Nicolas Montavont
The Media Independent Handover (MIH) architecture is designed to facilitate the signaling and enable seamless handovers in heterogeneous networks. In this paper
An instrument, the Complete Hemispherical Infrared Laser-based Reflectometer (CHILR), has been designed and built for the accurate characterization of the total
Channel scanning is an important aspect of seamless handovers since it is required in order to find a target point of attachment (PoA). In the IEEE 802.11 WLAN
Balasubramanian Muralikrishnan, Daniel S. Sawyer, Christopher J. Blackburn, Steven D. Phillips, Bruce R. Borchardt, William T. Estler
The American Society for Mechanical Engineers (ASME) recently released the ASME B89.4.19 Standard [1] on performance evaluation of spherical coordinate
George P. Eppeldauer, Carl C. Miller, Yoshihiro Ohno
Two reference and three working standard tristimulus colorimeters have been developed at the National Institute of Standards and Technology (NIST) to utilize