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Conferences

Measuring optical waveforms with fiber frequency combs

Author(s)
Ian R. Coddington, William C. Swann, Nathan R. Newbury
A stabilized frequency comb provides a broadband array of highly resolved comb lines. Using a multiheterodyne technique, we measure the amplitude and phase of

Droplet Formation at Microfluidic T-junctions

Author(s)
David A. LaVan, Xiang Xu
Analysis of droplet formation in microfluidic systems is important to understand the operation of these devices, and to permit optimal design and process

Facility Interface to the Smart Grid

Author(s)
David G. Holmberg
Homes, commercial buildings and the industrial sector together represent 100 percent of the load on the electric grid. Beyond load, these facilities provide a

A Standard Method for Measuring Wafer Bond Strength for MEMS Applications

Author(s)
Richard A. Allen, Janet M. Cassard, Winthrop A. Baylies, David T. Read, George D. Quinn, Frank W. DelRio, Kevin T. Turner, Michael Bernasch, Joerg Bagdahn
A round robin, to provide precision and bias data for SEMI standard MS5-1107, Test Method for Wafer Bond Strength Measurements Using Micro-Chevron Test

Property Verification for Generic Access Control Models

Author(s)
Chung Tong Hu, David R. Kuhn, Tao Xie
To formally and precisely capture the security properties that access control should adhere to, access control models are usually written to bridge the rather

HCI Reduced Barriers in Magnetic Tunnel Junctions

Author(s)
Joshua M. Pomeroy, Holger Grube
In this paper, the use of tunnel junctions as sensors for determining the interaction strength between highly charged ions (HCIs) and ultra-thin insulating

A New Shape Benchmark for 3D Object Retrieval

Author(s)
Rui Fang, Afzal A. Godil, Xiaolan Li, Asim Wagan
Recently, content based 3D shape retrieval has drawn more and more attention by researchers. How to properly evaluate the result of shape searching algorithms

Time and Frequency Transfer Activities at NIST

Author(s)
Victor S. Zhang, Michael A. Lombardi
The National Institute of Standards and Technology (NIST) maintains one of the world s most accurate and stable time scales, and also developed and maintains
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