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Conferences

Proximity-associated errors in contour metrology

Author(s)
John S. Villarrubia, Ronald G. Dixson, Andras Vladar
In contour metrology the CD-SEM (critical dimension scanning electron microscope) assigns a continuous boundary to extended features in an image. The boundary...

Calibration of 1 nm SiC Step Height Standards

Author(s)
Theodore V. Vorburger, Albert M. Hilton, Ronald G. Dixson, Ndubuisi G. Orji, J. A. Powell, A. J. Trunek, P. G. Neudeck, P. B. Abel
We aim to develop and calibrate a set of step height standards to meet the range of steps useful for nanotechnology. Of particular interest to this community is...

Methods for TEM analysis of NIST’s SWCNT SRM

Author(s)
Roy H. Geiss, Elisabeth Mansfield, Jeffrey A. Fagan
The National Institute of Standards and Technology (NIST) is developing a series of single-walled carbon nanotube, SWCNT, reference materials, RMs, to provide...

Improved NIST Airspeed Calibration Facility

Author(s)
Iosif I. Shinder, J. M. Hall, Michael R. Moldover
The National Institute of Standards and Technology (NIST) uses a laser Doppler anemometer (LDA) as a working standard for airspeed calibrations in the range 0...

NIST Sustainable Infrastructure Material Program

Author(s)
Jonathan W. Martin, Xiaohong Gu, Tinh Nguyen, Joannie W. Chin
NIST has initiated a research program for improving the quality of the data input for making economic sustainability assessments of polymeric infrastructure...

Reflective attenuators for high energy laser measurements

Author(s)
John H. Lehman, David J. Livigni, Christopher L. Cromer, Xiaoyu X. Li, Marla L. Dowell
A high-energy laser attenuator in the range of 250 mJ (20 nsec pulse width, 10 Hz repetition rate, 1064 nm, 1574 nm wavelengths) is described. The optical...

Uncertainties in Electron Probe Microanalysis

Author(s)
Ryna B. Marinenko, Stefan D. Leigh
This tutorial discusses the importance of citing valid uncertainties when reporting analytical results and the need for a universally accepted approach for...

Water based Polyurethane Graphene Oxide Nanocomposites

Author(s)
Coralie Bernard, Tinh Nguyen, Bastien T. Pellegrin, Mat Celina, Alexander J. Shapiro, Deborah Jacobs, Kar T. Tan, Sungjin Park, R. S. Ruoff, Joannie W. Chin
Graphene oxides are potentially a new class of nanomaterial to enhance multifunctional properties of polymers because of their remarkable thermal conductivity...

Thin film morphology of organic electronic materials

Author(s)
Xinran Zhang, Steven Hudson, Dean DeLongchamp, David J. Gundlach
Organic electronic materials are desired for low-cost printed circuits. As expected, the microstructure of these materials is crucial for their performance...

AN AUTOMATIC OVERLAP-BASED CELL TRACKING SYSTEM

Author(s)
Joe Chalfoun, Antonio Cardone, Alden A. Dima, Michael Halter, Daniel P. Allen
In order to facilitate the extraction of quantitative data from live cell image sets, automated image analysis methods are needed. This paper presents an...

Interoperability for Simulation of Sustainable Manufacturing

Author(s)
Guodong Shao, Nils E. Bengtsson, Bjoern J. Johansson
Sustainability has become a very significant research topic, it impacts many different manufacturing industries. To achieve sustainable manufacturing, designing...

Little Things Mean a Lot: Water and the Adhesive Bond

Author(s)
Donald L. Hunston, Kar T. Tan, Bryan D. Vogt, Sushil K. Satija, Cyril Clerici, David E. White
The ability of water to dramatically weaken many types of adhesive bonds has been widely studied. One surprising result is the existence of a critical moisture...

Roles of Adhesive and Interfacial Properties on Humidity-induced Failure

Author(s)
Kar T. Tan, Christopher C. White, Donald L. Hunston, Kristen L. Steffens, Hatlee Timothy, Kristen Hamilton, Vogt D. Bryan
Adhesion loss due to moisture is a fundamental problem in a large diversity of industries ranging from microelectronics and automotive to aerospace. This study...
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