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Conferences

Privacy-Preserving DRM

Author(s)
Radia Perlman, Charles Kaufman, Ray Perlner
This paper describes and contrasts two families of schemes that enable a user to purchase digital content without revealing to anyone what item he has purchased...

Significance Test in Operational ROC Analysis

Author(s)
Jin Chu Wu, Alvin F. Martin, Raghu N. Kacker, Robert C. Hagwood
To evaluate the performance of fingerprint-image matching algorithms on large datasets, a receiver operating characteristic (ROC) curve is applied. From the...

The Limits and Extensibility of Optical Patterned Defect Inspection

Author(s)
Richard M. Silver, Bryan M. Barnes, Martin Y. Sohn, Richard Quintanilha, Hui Zhou, Chris Deeb, Mark Johnson, Milton Goodwin, Dilip Patel
New techniques recently developed at the National Institute of Standards and Technology using bright field optical tools are applied to signal-based defect...

Multiwalled carbon nanotubes coated with silicon carbonitride (SiCN)

Author(s)
Katie Hurst, Christopher L. Cromer, Elisabeth Mansfield, Roop Mahajan, John H. Lehman, Gurpreet Singh
We describe the development of two next-generation optical coatings; amorphous polymer-derived silicon carbonitride (SiCN) particles and a composite consisting...

Proximity-associated errors in contour metrology

Author(s)
John S. Villarrubia, Ronald G. Dixson, Andras Vladar
In contour metrology the CD-SEM (critical dimension scanning electron microscope) assigns a continuous boundary to extended features in an image. The boundary...

Calibration of 1 nm SiC Step Height Standards

Author(s)
Theodore V. Vorburger, Albert M. Hilton, Ronald G. Dixson, Ndubuisi G. Orji, J. A. Powell, A. J. Trunek, P. G. Neudeck, P. B. Abel
We aim to develop and calibrate a set of step height standards to meet the range of steps useful for nanotechnology. Of particular interest to this community is...

Methods for TEM analysis of NIST’s SWCNT SRM

Author(s)
Roy H. Geiss, Elisabeth Mansfield, Jeffrey A. Fagan
The National Institute of Standards and Technology (NIST) is developing a series of single-walled carbon nanotube, SWCNT, reference materials, RMs, to provide...

Improved NIST Airspeed Calibration Facility

Author(s)
Iosif I. Shinder, J. M. Hall, Michael R. Moldover
The National Institute of Standards and Technology (NIST) uses a laser Doppler anemometer (LDA) as a working standard for airspeed calibrations in the range 0...
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