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Conferences

Evaluation of 3D Interest Point Detection Techniques

Author(s)
Helin Dutagaci, Chun Pan (Benny) Cheung, Afzal A. Godil
In this paper, we compare the results of five 3D interest point detection techniques to the interest points marked by human subjects. This comparison is used to...

Optics contamination studies in support of high-throughput EUV lithography tools

Author(s)
Shannon B. Hill, Fardina Asikin, Lee J. Richter, Steven E. Grantham, Charles S. Tarrio, Thomas B. Lucatorto, Sergiy Yulin, Mark Schurmann, Viatcheslav Nesterenko, Torsten Feigl
We report on optics contamination rates induced by exposure to broad-bandwidth, high-intensity EUV radiation peaked near 8 nm in a new beamline at the NIST...

Distinguishing Identical Twins by Face Recognition

Author(s)
P Phillips, Patrick J. Flynn, Kevin W. Bowyer, Richard W. Vorder Bruegge, Patrick Grother, George W. Quinn, Matthew Pruitt
The paper measures the ability of face recognition algorithms to distinguish between identical twin siblings. The experimental dataset consists of images taken...

Innovative Marketing Tools and Strategies

Author(s)
Stacy M. Bruss, Nancy Allmang
Tipsheet to be handed out at following talk: In an increasingly digital world, the ways that customers interact with their library and recognize the services...

An Introduction to the Good, the Bad, & the Ugly Face Recognition Challenge Problem

Author(s)
P J. Phillips, J. R. Beveridge, Bruce A. Draper, Geof H. Givens, Alice J. O'Toole, David Bolme, Joseph Dunlop, Yui M. Lui, Hassan A. Sahibzada, Samuel Weimer
The Good, the Bad, & the Ugly Face Challenge Problem was created to encourage the development of algorithms that are robust to recognition across changes that...

When High-Quality Face Images Match Poorly

Author(s)
J. R. Beveridge, P. Jonathon Phillips, Geof H. Givens, Bruce A. Draper, Mohammad N. Teli, David Bolme
In face recognition, quality is typically thought of as a property of individual images, not image pairs. The implicit assumption is that high-quality images...

A Component-based Approach for Manufacturing Simulation

Author(s)
Frank H. Riddick, Yung-Tsun T. Lee, Deogratias Kibira, Stephen B. Balakirsky
Manufacturing systems can be very complex and are often costly to develop and operate. Simulation technology has been shown to be an effective tool for...
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