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Conferences

Physical Model for Random Telegraph Noise Amplitudes and Implications

Author(s)
Richard G. Southwick, Kin P. Cheung, Jason P. Campbell, Serghei Drozdov, Jason T. Ryan, John S. Suehle, Anthony Oates
Random Telegraph Noise (RTN) has been shown to surpass random dopant fluctuations as a cause for decananometer device variability, through the measurement of a...

Channel Length-Dependent Series Resistance?

Author(s)
Jason P. Campbell, Kin P. Cheung, Serghei Drozdov, Richard G. Southwick, Jason T. Ryan, Tony Oates, John S. Suehle
A recently developed series resistance (RSD) extraction procedure from a single nanoscale device is shown to be highly robust. Despite these virtues, the...

Detection of Cutting Phenomena Using Sensor Fusion

Author(s)
John A. Slotwinski, Gregory W. Vogl, Robert W. Ivester, Ian Younker
This paper presents an investigation of the application of a suite of sensors for simultaneous in-situ measurements of machining processes. While not every...

Enabling Machining Vision Using STEP-NC

Author(s)
Martin Hardwick, Frederick M. Proctor, David Loffredo, Sid Venkatesh
STEP-NC is a new data format for manufacturing control. One of its applications is to enable integrated on machine measurement of machining processes using...

Synthesis of Manufacturing and Facility Data for Sustainability Analysis

Author(s)
John L. Michaloski, Guodong Shao, Swee K. Leong, Frank H. Riddick, Jonatan Berglund, Jorge Arinez, Stephan Biller
This paper discusses data synthesis of production and facility knowledge for sustainability analysis by applying the ISA 95 "Activity Models of Manufacturing...

A novel solar simulator based on a super-continuum laser

Author(s)
Tasshi Dennis, John B. Schlager, Hao-Chih Yuan, Qi Wang, Daniel Friedman
The design and operation of a novel solar simulator based on a high-power, super-continuum fiber laser is described in this work. The simulator features a multi...

Characteristics of Graphene for Quantized Hall Effect Measurements

Author(s)
Randolph E. Elmquist, Mariano A. Real, Irene G. Calizo, Brian G. Bush, Tian T. Shen, Nikolai N. Klimov, David B. Newell, Angela R. Hight Walker, Randall M. Feenstra
This paper describes concepts and measurement techniques necessary for characterization of graphene in the development of graphene-based quantized Hall effect...

Nanoparticle Size and Shape Evaluation Using the TSOM Method

Author(s)
Bradley N. Damazo, Ravikiran Attota, Premsagar P. Kavuri, Andras Vladar
A novel through-focus scanning optical microscopy (TSOM) method that yields nanoscale information from optical images obtained at multiple focal planes will be...

Graphene Epitaxial Growth on SiC(0001) for Resistance Standards

Author(s)
Mariano A. Real, Tian T. Shen, George R. Jones Jr., Randolph Elmquist, Johannes A. Soons, Albert Davydov
Epitaxial growth of graphene layers on 6H-SiC(0001) substrates have been studied in order to improve graphene's performance for metrological applications. A...

SIM.EM-S5 Voltage, Current and Resistance Comparison

Author(s)
Harold Sanchez, Lucas Di Lillo, Gregory Kyriazis, Rodrigo Ramos, Randolph Elmquist, Nien F. Zhang
This paper reports the results of the second Interamerican Metrology System (SIM) comparison on calibration of digital multimeters, performed for strengthening...

Modeling Gaps and Overlaps of Sustainability Standards

Author(s)
Paul W. Witherell, Sudarsan Rachuri, Anna D'Alessio
Organizational and production dispersions in manufacturing enterprises can create situations where manufacturers are asked to conform to multiple sustainability...

Quality Information Framework - Integrating Metrology Processes

Author(s)
Fiona Zhao, Thomas Kramer, John A. Horst, William G. Rippey, Robert Brown
As defined by major dimensional metrology system users and suppliers, the Quality Information Framework (QIF) is an integrated and holistic set of information...

Blackbody effects in the Yb optical lattice clock

Author(s)
Andrew D. Ludlow, Jeffrey A. Sherman, Nathan D. Lemke, Kyle P. Beloy, Nathan M. Hinkley, M. Pizzocaro, Richard W. Fox, Christopher W. Oates
We report a high accuracy measurement of the differential static polarizability for the clock transition in a Yb lattice clock, a key parameter for determining...

Phase-Noise Measurement of a 670 GHz Source

Author(s)
Jason A. DeSalvo, Archita Hati, Craig W. Nelson, David A. Howe
We present phase-noise measurements in support of terahertz electronics. Using digital phase-noise measurement techniques and an even-harmonic mixer, we achieve...
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