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Conferences

Estimation of uncertainty in application profiles

Author(s)
David W. Flater
Performance is an important facet of software quality, and application profiling tools are the instruments used to measure software performance at the function...

Differential Properties of the HFE Cryptosystem

Author(s)
Taylor Daniels, Daniel Smith-Tone
Multivariate Public Key Cryptography (MPKC) has been put forth as a possible post-quantum family of cryptographic schemes. These schemes lack provable security...

CURVED-WIDE PLATE TESTING OF X100 GIRTH WELDS

Author(s)
Timothy S. Weeks, Joseph D. McColskey, Mark D. Richards, Yong-Yi Wang, Marie A. Quintana
The curved-wide plate (CWP) tests are frequently used for assessing the quality of pipeline girth welds. Despite a large number of CWP tests having been...

Generalizing Face Quality and Factor Measures to Video

Author(s)
Yooyoung Lee, P. Jonathon Phillips, James Filliben, J. R. Beveridge, Hao H. Zhang
Methods for assessing the impact of factors and image-quality metrics for still face images are well-understood. The extension of these factors and quality...

Technique for AFM Tip Characterization

Author(s)
Ndubuisi G. Orji, Ronald G. Dixson, Hiroshi Itoh, Chumei Wang
In atomic force microscopy (AFM) metrology, the scanning tip is a major source of uncertainty. Images taken with an AFM show an apparent broadening of feature...

PMML in Manufacturing Applications

Author(s)
Yung-Tsun T. Lee, Juyeon Lee
In manufacturing, an enormous amount of data, both real and simulation data, is being continuously generated. The appropriate information, if extracted from big...
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