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Conferences

Technique for AFM Tip Characterization

Author(s)
Ndubuisi G. Orji, Ronald G. Dixson, Hiroshi Itoh, Chumei Wang
In atomic force microscopy (AFM) metrology, the scanning tip is a major source of uncertainty. Images taken with an AFM show an apparent broadening of feature...

PMML in Manufacturing Applications

Author(s)
Yung-Tsun T. Lee, Juyeon Lee
In manufacturing, an enormous amount of data, both real and simulation data, is being continuously generated. The appropriate information, if extracted from big...

Multiscale Correlative Measurements of Nanoparticles in Cells

Author(s)
Aric W. Sanders, Kavita M. Jeerage, Cindi Schwartz, Alexandra E. Curtin, Ann C. Chiaramonti Debay
Nanoparticles are emerging as invaluable tools in disease diagnosis, disease treatment and imaging contrast enhancement agents. The interactions of...

Milligram Mass Metrology Using Electrostatics

Author(s)
Gordon A. Shaw, John A. Kramar
— Although mass has historically been defined using an artifact standard, other means of realization are possible. One alternative approach employs a precision...

A 100 Tohm Guarded Hamon Transfer Standard

Author(s)
Dean G. Jarrett, Edward O'Brien, Marlin E. Kraft
Guarded Hamon transfer standards are used at NIST for scaling to high resistance levels. An improved design for a guarded Hamon transfer standard in the range...

The Design of the NEW NIST-4 Watt Balance

Author(s)
Leon S. Chao, Stephan Schlamminger, Frank C. Seifert, Yusi A. Cao, Darine El Haddad, David B. Newell, Jon R. Pratt
The design of the new permanent-magnet driven watt balance and novel mechanical features will demonstrate the high-precision capabilities of a large complex...
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