NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Conferences

Generalizing Face Quality and Factor Measures to Video

Author(s)
Yooyoung Lee, P. Jonathon Phillips, James Filliben, J. R. Beveridge, Hao H. Zhang
Methods for assessing the impact of factors and image-quality metrics for still face images are well-understood. The extension of these factors and quality

Technique for AFM Tip Characterization

Author(s)
Ndubuisi G. Orji, Ronald G. Dixson, Hiroshi Itoh, Chumei Wang
In atomic force microscopy (AFM) metrology, the scanning tip is a major source of uncertainty. Images taken with an AFM show an apparent broadening of feature

PMML in Manufacturing Applications

Author(s)
Yung-Tsun T. Lee, Juyeon Lee
In manufacturing, an enormous amount of data, both real and simulation data, is being continuously generated. The appropriate information, if extracted from big
Was this page helpful?