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Conferences

An Overview of the NTIA/NIST Spectrum Monitoring Pilot Program

Author(s)
Michael Cotton, Michael R. Souryal, Mudumbai Ranganathan, Jeff Wepman, Julie Kub, Steve Engelking, Yeh Lo, Heather Ottke, Raian Kaiser, Douglas Anderson
This paper provides an overview of a Spectrum Monitoring Pilot Program within the U.S. Department of Commerce. It provides background, motivation, goals...

Proceedings of SPIE

Author(s)
Maritoni A. Litorja, Aaron A. Urbas, Yuqin Zong
The fluorescent light detected by a clinical imager is assumed to be proportional to the amount of fluorescent substance present in the sample. Unfortunately...

Optimizing the Location Deployment of Dynamic Mobile Base Stations

Author(s)
Sulabh Bhattarai, Sixiao Wei, Stephen Rook, Wei Yu, David W. Griffith, Nada T. Golmie
There has been growing interest over the past few years in the US and around the world to build reliable, robust, and interoperable public safety broadband...

Mobile Device Tool Testing

Author(s)
Richard Ayers
The Computer Forensic Tool Testing program at NIST has spent several years researching and testing forensic tools capable of acquiring data from the internal...

How Random is Your RNG?

Author(s)
Meltem Sonmez Turan, John M. Kelsey, Kerry A. McKay
Cryptographic primitives need random numbers to protect your data. Random numbers are used for generating secret keys, nonces, random paddings, initialization...

A 4D Immersive Platform to Visualize RF Propagation in BAN

Author(s)
John G. Hagedorn, Kamran Sayrafian, Judith E. Terrill, Kamya Yekeh Yazdandoost
Recent advances in micro-electronics technology to build small radio-enabled implantable and wearable medical sensors have sparked considerable interest in body...

Dynamic Flow Stress Measurements for Machining Applications

Author(s)
Steven P. Mates, Eran Vax, Richard Rhorer, Michael B. Kennedy, Eric P. Whitenton, Stephen W. Banovic, Timothy J. Burns
Metals undergo a combination of rapid loading and rapid heating during normal and high speed machining processes. Constitutive models for these materials...

193 nm scatterfield microscope illumination optics

Author(s)
Martin Y. Sohn, Richard M. Silver
A scatterfield microscope for deep sub-wavelength semiconductor metrology using 193 nm light has been designed. In addition to accommodating the fixed numerical...

Cryocooled 10 V Programmable Josephson Voltage Standard

Author(s)
Alain Rufenacht, Logan A. Howe, Anna E. Fox, Robert E. Schwall, Paul D. Dresselhaus, Charles J. Burroughs, Samuel P. Benz
Improvements in fabrication and packaging of our 10 V Programmable Josephson Voltage Standard circuits have enabled the successful operation of these devices on...

Ignition of Mulch beds exposed to firebrand showers

Author(s)
Samuel Manzello, Sayaka Suzuki
Mulch is commonly found near buildings and is a useful surrogate to study various fuels that may be present near buildings. To this end, mulch beds were exposed...
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