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A Padilla, Alex Watson, Christopher L. Holloway, James Booth
This work presents the design, fabrication and characterization results for a thick film (6µm Cu), coplanar waveguide (CPW) resonator operating at 2.2GHz with a...
Tasshi Dennis, Brent Fisher, Matt Meitl, John Wilson
We describe the design and operation of a spectrally programmable solar simulator capable of being concentrated to very high irradiance for the testing of multi...
Only a few years ago, librarians in the Information Services Office (ISO) of the National Institute of Standards and Technology (NIST) were providing a single...
Joseph J. Kopanski, Lin You, Jungjoon Ahn, Yaw S. Obeng
Scanning probe microscope (SPM) based methods to obtain subsurface structural information about nano-structured materials are described. A test structure chip...
With the increasing attention directed to sustainable manufacturing, systematic methodologies and tools are needed for not only incorporating the traditional...
Simulation is an indispensable part of design and analysis in a near infinite space of applications. Every day, simulation is applied to new problems as well as...
Aaron Forster, Wei-Lun Ho, Kar T. Tan, Donald Hunston
Polyethylene is an advantageous material for the construction of buried pipelines. It is corrosion resistant, seismic tolerant, and utilizes low cost...
The atomic force microscope (AFM) is a widely utilized instrument for measuring nanometer-scale variations in mechanical properties. Most AFM techniques only...
A method to measure the displacement uncertainty increase, due in part to pattern breakdown at large strains is described. The method is similar to rigid body...
There has been a growing interest in the deployment of Phasor Measurement Units (PMUs) in a Distributed Generation (DG) grid system. The main obstacle is the...
Shaw C. Feng, Paul W. Witherell, Gaurav Ameta, Duck B. Kim
Additive Manufacturing (AM) processes intertwine aspects of many different engineering-related disciplines, such as powder material metrology, design, in-situ...
Effective computational tools for shape analysis are needed in many areas of science and engineering. We address this and propose a fast algorithm to compute...
Smart manufacturing technologies require a cyber-physical infrastructure to collect and analyze data and information across the manufacturing enterprise. This...
Jinkyoo Park, Raunak Bhinge, Nishant Biswas, Amrita Srinivasan, Kincho H. Law, David Dornfeld, Moneer Helu, Sudarsan Rachuri
Using a machine learning approach, this study investigates the effects of machining parameters on the energy consumption of a milling machine tool, which would...
Yaghoob Farnam, Hadi S. Esmaeeli, Dale P. Bentz, Pablo Zavattieri, Jason Weiss
In North America, some concrete pavements and sidewalks have shown severe damage during freezing. Research has been performed to better understand the cause of...
Bradley N. Damazo, Andras Vladar, Olivier M. Marie-Rose, John A. Kramar
The National Institute of Standards and Technology (NIST) is developing a specialized, metrology scanning electron microscope (SEM), having a metrology sample...
In recent years silicon photonic devices have emerged as a powerful tool for devleop novel, sensitivity sensors. In a recent study we systematically examined...
Yoshihiro Ohno, Koichi Nara, Peter Bennich, Michael Scholand, Nils Borg
The International Energy Agency (IEA) 4E Solid State Lighting Annex initiated a programme starting in 2011 looking at a global laboratory accreditation scheme...
Dynamic tension tests are performed on a quenched and partitioned high strength steel grade, QP980, using a direct tension Kolsky Bar method. In this method...
Bonita V. Saunders, Brian Antonishek, Qiming Wang, Bruce R. Miller
In 1997 the National Institute of Standards and Technology (NIST) embarked on a huge project to replace one of the most cited resources for mathematical...
This work presents experimental results on a recently developed manipulation controller applied to a multi-fingered robotic hand to execute both grasping and...
Chukwudi A. Okoro, Lyle E. Levine, Yaw S. Obeng, Ruqing Xu
In this work, an experimental study of the influence of Cu through-silicon via (TSV) diameter on stress build up was performed using synchrotron-based X-ray...
Peter B. Papazian, Kate Remley, Camillo Gentile, Nada T. Golmie
NIST has developed a new channel sounder design specifically to support radio-channel model development for 5G millimeter-wave mobile communications. Design...
Product authentication is a critical capability for all supply chains in todays globalized world. Manufacturers, distributors, retailers and customers of all...
Ultra-wide band (UWB) systems require either rapidly changing or very high sampling rates. Conventional analog-to-digital devices have limited dynamic range. We...
Existing concrete microstructural models of particles embedded in matrix materials are only represented by regular shape particles like spheres, ellipsoids, or...
Aurelien M. Delaitre, Bertrand C. Stivalet, Elizabeth N. Fong, Vadim Okun
Software static analysis is one of many options for finding bugs in software. Like compilers, static analyzers take a program as input. This paper covers tools...