Mobile Device Tool Testing

Published: February 19, 2015

Author(s)

Richard P. Ayers

Abstract

The Computer Forensic Tool Testing program at NIST has spent several years researching and testing forensic tools capable of acquiring data from the internal memory of mobile devices and Subscriber Identity Modules (SIMs). Test reports provide a foundation for toolmakers to improve tools, users to make informed choices, and provide interested parties with an overview of any anomalies found. The presentation will provide an overview of the motivation behind testing mobile device forensic tools and the challenges faced by toolmakers and forensic examiners.
Proceedings Title: Mobile Device Tool Testing
Conference Dates: February 18-June 23, 2013
Conference Location: Washington, DC
Pub Type: Conferences

Keywords

Mobile Device Forensics, Digital, Testing
Created February 19, 2015, Updated May 10, 2019