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Mobile Device Tool Testing

Published

Author(s)

Richard Ayers

Abstract

The Computer Forensic Tool Testing program at NIST has spent several years researching and testing forensic tools capable of acquiring data from the internal memory of mobile devices and Subscriber Identity Modules (SIMs). Test reports provide a foundation for toolmakers to improve tools, users to make informed choices, and provide interested parties with an overview of any anomalies found. The presentation will provide an overview of the motivation behind testing mobile device forensic tools and the challenges faced by toolmakers and forensic examiners.
Proceedings Title
Mobile Device Tool Testing
Conference Dates
February 18-June 23, 2013
Conference Location
Washington, DC

Keywords

Mobile Device Forensics, Digital, Testing

Citation

Ayers, R. (2015), Mobile Device Tool Testing, Mobile Device Tool Testing, Washington, DC (Accessed May 21, 2022)
Created February 18, 2015, Updated June 24, 2021