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Books

Electron Probe Microanalysis with Cryogenic Detectors

July 9, 2005

Author(s)

Dale E. Newbury, Kent D. Irwin, Gene C. Hilton, David A. Wollman, John A. Small, John M. Martinis

Electron probe x-ray microanalysis is based upon the use of a focused, high current density electron beam, 5 keV to 30 keV in energy, to excite characteristic x

Java

July 1, 2005

Author(s)

Ronald F. Boisvert, Roldan Pozo

Our goal here is to provide to non-Java programmers some guidance as to whether Java might be appropriate for scientific applications. We will discuss some of

Standard transformed Gibbs energies of formation for biochemical reactants

July 1, 2005

Author(s)

Robert N. Goldberg, R A. Alberty

Catalysis by homo- and heteronuclear polymetallic systems;palladium giant cluster catalysis; stoichiometric CO2 reduction; reductive dehydration of alcohols

April 28, 2005

Author(s)

Anzor I. Mikaia, II Moiseev, AE Gekhman, Mark Tsodikov, Kugel Kugel, FA Yandieva, Leonid S. Glebov, George A. Kliger, Vladimir G. Zaikin, Yu Maksimov, D Kochubey, V Kriventsov, V Mordovin, JA Navio

Photomask Feature Metrology

April 7, 2005

Author(s)

James E. Potzick

This chapter discusses some general issues with regard to measurement of the size and placement of the features on a photomask.
Since all linewidth and

Beyond English

April 1, 2005

Author(s)

Donna K. Harman

This chapter summarizes TREC work on retrieval for language other than English. TREC has explored a variety of tasks including both single language tasks (for

The TREC Test Collections

April 1, 2005

Author(s)

Donna K. Harman

The creation of a set of large, unbiased test collections has been critical to the success of TREC. This chapteris the documentation for the TREC collections

The TREC Ad Hoc Experiments

April 1, 2005

Author(s)

Donna K. Harman

Ad hoc retrieval is the prototypical search engine task: searching a static set of documents with a previouslyunseen query. The ad hoc task was one of the first

An Architecture for Semantic Enterprise Application Integration Standards

April 1, 2005

Author(s)

Nenad Anicic, Nenad Ivezic, Albert T. Jones

Large, industry-wide interoperability projects use syntax-based standards approaches to accomplish interoperable data exchange among enterprise applications. We

Chapter 20, Thermophysical Properties of Refrigerants, ASHRAE Handbook--Fundamentals (2005 revision)

March 28, 2005

Author(s)

Mark O. McLinden

This chapter presents data for the thermodynamic and transport properties of refrigerants. The refrigerants have a full-page thermodynamic property chart on

Boundary Lubrication and Boundary Lubricating Film

March 3, 2005

Author(s)

Stephen M. Hsu, Richard S. Gates

This chapter offers a comprehensive summary of current understanding in boundary lubrication and the formation of boundary lubricating films. Classical and

Modern wire bonding technologies - ready for the challenges of future microelectronic packaging

January 27, 2005

Author(s)

Klaus-Dieter Lang, George G. Harman, Martin Schneider-Ramelo

Increasing I/O numbers and device complexity, higher clock frequencies, and the trend to product miniaturization in microelectronics as well as microsystems

Diffraction Effects in Radiometry

January 26, 2005

Author(s)

Eric L. Shirley

This is the draft submitted to be Chapter 10 of the book, Modern Radiometric Practice, edited by Albert C. Parr, Raju U. Datla, and James W. Gardner. This

Appendix A; Example: Calibration of a Cryogenic Blackbody

January 22, 2005

Author(s)

Raju V. Datla, Eric L. Shirley, Albert C. Parr

This manuscript is intended to be an Appendix in a book on radiometry, The Practice of Optical Radiometry. The Appendix is to provide a real example of a

ProfIles of material properties in inductlon-hardened steel determined through inversion of resonant acoustic measurements

January 3, 2005

Author(s)

Ward L. Johnson, Sudook A. Kim, S J. Norton

Electromagnetic-acoustic measurements of resonant frequencies of induction-hardened steel shafts were used in an inverse calculation to determine parameters of

New and Expanded Spectroscopic Databases of the National Institute of Standards and Technology (NIST), ed. by L. Hadzievski, T. Grozdanov, and N. Bibic

January 1, 2005

Author(s)

Wolfgang L. Wiese

Atomic Oscillator Strengths in the Vacuum Ultraviolet using Fourier Transform and Grating Spectroscopy

January 1, 2005

Author(s)

Gillian Nave, Zhigang Li, Craig J. Sansonetti

Nonperturbative QED and the Fundamental Constants, ed. by W. Greiner

January 1, 2005

Author(s)

Peter J. Mohr

Electron Configuration and Ionization Energy of Neutral Atoms in the Ground State, ed. by D.R. Lide

January 1, 2005

Author(s)

William C. Martin

Laser Cooling and Trapping of Neutral Atoms to Ultralow Temperatures, ed. by B. Di Bartolo and O. Forte

January 1, 2005

Author(s)

Kristian Helmerson

NIST Atomic Transition Probabilities, ed. by D.R. Lide

January 1, 2005

Author(s)

Jeffrey R. Fuhr, Wolfgang L. Wiese

Introduction to Optical Radiometry, ed. by A.C. Parr, R.U. Datla and J.L. Gardner

January 1, 2005

Author(s)

Albert C. Parr, Raju V. Datla

The GMPLS Control Plane Architecture for Optical Networks

January 1, 2005

Author(s)

David W. Griffith

Appendix A, Example: Calibration of a Cryogenic Blackbody, ed. by A.C. Parr, R.U. Datla and J.L. Gardner

January 1, 2005

Author(s)

Raju V. Datla, Eric L. Shirley, Albert C. Parr

The Internet Marketplace and Digital Rights Management

January 1, 2005

Author(s)

Gordon E. Lyon

Lacking physical control over Internet receiving environments, traditional information security methods cannot fully protect digital products. Insisting upon

Photomask Metrology, Photomask Fabrication Technology

January 1, 2005

Author(s)

Richard M. Silver, Andras Vladar

In this paper we will focus on the different metrology techniques used to measure features on photomasks. In view of the above discussion, we will focus on the

Issues in Line Edge and Linewidth Roughness Metrology

January 1, 2005

Author(s)

John S. Villarrubia

In semiconductor electronics applications, line edge and linewidth roughness are generally measured using a root mean square (RMS) metric. The true value of RMS

Soliton dynamics in mode-locked lasers, ed. by N. Akhmediev and A. Ankiewicz

January 1, 2005

Author(s)

Steven T. Cundiff

Fundamental Neutron Physics

January 1, 2005

Author(s)

Jeffrey S. Nico, M S. Snow

Coherent amplification of femtosecond pulses with passive enhance-ment cavities, ed. by T. Kobayashi

January 1, 2005

Author(s)

R J. Jones, L -. Ma, Jun Ye

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