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FCMN, Publications and Talks

Frontiers of Characterization and Metrology for Nanoelectronics: Archived Publications and Talks

The Frontiers of Characterization and Metrology for Nanoelectronics (FCMN) conference series brings together scientists and engineers interested in all aspects of the characterization technology needed for nanoelectronic materials and device research, development, and manufacturing. All approaches are welcome: chemical, physical, electrical, magnetic, optical, in-situ, and real-time control and monitoring. The conference summarizes major issues and provides critical reviews of important semiconductor techniques needed as the semiconductor industry moves to silicon nanoelectronics and beyond.

For details on the latest entry in this conference series, please visit the conference website.

Archived Publications

Archived Talks

Please note that most of the links below are part of the AIP webspace. We have provided the links because they have information that may be of interest to our users. NIST does not necessarily endorse the views expressed or the facts presented on this site. Further, NIST does not endorse any commercial products that may be advertised or available on this site. 

Archived Talks

Created May 28, 2009, Updated November 16, 2020