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Projects/Programs

Displaying 51 - 75 of 261

Detecting Change Points in Surface Temperature Records

Ongoing
DESCRIPTION: For the purpose of exposition, consider the record daily minimums averaged by month for a station near Reno Nevada. There is a clear drop in the level between 1920 and 1940 and a positive drift starting at about 1980. There is also however, considerable variability due to seasonal

Development of SRM 2669 for Accurate Assessment of Arsenic Exposure

Ongoing
Arsenic exposure in the U.S. population is an important part of the NHANES program conducted by CDC because dietary exposure to arsenic can cause serious health effects. A major challenge in the arsenic exposure assessment is that arsenic exists as various species in nature, and the toxicity of

Development of SRM 955c Toxic Elements in Caprine Blood

Completed
Intended Impact Over the last three decades, NIST, with support from the Centers for Disease Control (CDC), and in conjunction with the New York State Department of Health’s (NYSDOH) Wadsworth Center, has produced a number of frozen whole blood certified reference materials containing endogenous

Dietary Supplement Laboratory Quality Assurance Program (DSQAP) Consortium

Ongoing
The objective of the DSQAP Consortium is to develop and evaluate measurement methods and standards to support quality and safety for the dietary supplement testing community. Approximately 75% of the U.S. population takes dietary supplements, including vitamins and mineral supplements, representing

Dietary Supplement Laboratory Quality Assurance Program (DSQAP)

Ongoing
Approximately 75% of the U.S. population takes dietary supplements, including vitamins and mineral supplements, representing an annual expenditure of more than $20 billion. Regulations, driven by reported cases of inaccurate labeling, adulteration, contamination (with pesticides, heavy metals, or

Diffraction Metrology and Standards

Ongoing
Diffraction techniques can provide data on a number of sample characteristics. Therefore, the method of certification and the artifact itself are chosen to address a specific measurement issue pertinent to a diffraction experiment. NIST diffraction SRMs may be divided into five groups: Line Position

Documentary Standards: IEC 62755 Standard N42 Data Format

Ongoing
The IEC 62755 standard specifies the XML data format that shall be used for both required and optional data to be made available by radiation measurement instruments. The performance requirements for these types of instruments are described in other IEC standards. The output from these instruments

DUV/EUV Nanoscopy for Imaging Nanostructures

Ongoing
Novel optical nanoscopy techniques using deep-ultraviolet (DUV) and extreme-ultraviolet (EUV) laser sources are developed to characterize nanostructures with high dimensional sensitivity and low uncertainty for advancing the semiconductor devices manufacturing process. The illumination beam is

Dynamic EUV Metrology of Nanoscopic Thermal Transport in Active Devices

Ongoing
Heat is greatly impeding progress in microelectronics, which is only getting worse as dimensions are reduced and device architectures move more towards being 3-dimensional. The dynamics and physics of nanoscale thermal transport are unknown and dynamic measurements of active devices at this scale do

Dynamic Mechanical Metrology: Acceleration, Force, and Acoustics

Ongoing
The Dynamic Mechanical Metrology Project develops standards and provides calibrations for SI-traceable acceleration, acoustical and dynamic force metrology. We develop improved reference standards and calibration techniques, sensor-embedded standards, calibration techniques for new technologies, and

Electric Power Metrology and the Smart Grid

Ongoing
Major advancements in electric power generation, transmission, distribution and loads over the last 20 years have led to improvements, reliability, robustness, efficiency and energy security unlike anything from the proceeding 80 years. Combined, this power grid modernization has been called the

Electrical Characterization of Nanoscale Electron Devices

Ongoing
Over the decades, many measurement methods were developed to meet the needs of advancing electron device/circuit/system technology. As technology continue to advance, new needs continue to surface, either due to old measurements are no longer adequate or due to no established method exists. A case

Electrical Scanning Probe Microscopy

Ongoing
Electrical scanning probe microscopes (eSPMs) are a subset of scanning probe microscopes which measure some electrical parameter as well as surface topography. These include techniques such as scanning capacitance microscopy (SCM), scanning spreading resistance microscopy (SSRM), conductive atomic

Electromagnetic Field Strength Metrology

Ongoing
NIST calibrates electrically-small field probes from 10 megahertz – 40 gigahertz. These measurements are done in facilities that are periodically compared against other National Metrology Institutes in conjunction with the Bureau International des Poids et Mesures (BIPM). This assures international

Electron Beam Ion Trap (EBIT) Facility

Ongoing
The NIST EBIT is a table-top device which can produce matter in excess of ten million degrees Kelvin. At these temperatures, even the heaviest atoms shed most of their electrons. The highly charged ions which result are trapped by a configuration of electric and magnetic fields in an ultrahigh

Electronic Biophysical Measurements

Ongoing
We develop measurements that leverage electronic signal transduction using FETs to maximize sensitivity and improve the resolution of biomolecular measurements. The techniques allow direct charge transduction during molecular interactions to quantify fundamental biophysical processes. Critically the