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Projects/Programs

Displaying 26 - 50 of 87

GaN Nanowire Growth

Ongoing
GaN nanowires grown by catalyst-free molecular beam epitaxy have the unique property that most nanowires are completely free of crystalline defects. This

GaN Nanowire Metrology and Applications

Ongoing
We synthesize semiconductor nanostructures to serve both as test structures for measurement techniques and as building blocks for novel metrology tools and

Genomics of Electronic Materials

Ongoing
Our goal is to develop the metrology to enable a materials genomic approach to the discovery and optimization of complex electronic and electromagnetic

High-Frequency Electronics

Ongoing
The High-Frequency Electronics project supports advanced communications, millimeter-wave technologies, quantum computing, and the semiconductor industry through

Magnetic Random Access Memory

Ongoing
The program on magnetic random-access memory develops metrology to determine how spin currents can be generated and used to control and manipulate magnetization

Magnetic Resonance Spectroscopy

Ongoing
The Magnetic Resonance Spectroscopy Project strives to be at the forefront of understanding the roles that critical atomic-scale defects play in determining

METIS

Ongoing
A new publication describes METIS, a Metrology Exchange to Innovate in Semiconductors We are seeking comments on the draft publication through February 16, 2024

Micro- and Nanoelectromechanical Systems

Completed
Microelectromechanical systems (MEMS) are integrated devices with critical applications in sensing, timing, signal processing, and biomedical diagnostics, and