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Electronics

Semiconductors

Projects/Programs

Keyword

Organizational Unit

Metrology for Emerging Integrated Systems

Ongoing

This program aims to develop the metrology to enable quantitative assessment of performance limiting reliability issues, and to describe the physics of failure

Metrology and Standards for Nanoscale Stress

Ongoing

Our objective is to develop accurate measurement methods for the nanoscale stress distributions and surface defects that control device performance and

A micromechanical bulk acoustic resonator that uses phononic crystal tethers to achieve a quality factor approaching the fundamental dissipation limit (fxQ can be as large as 1.2 x 1013 Hz)

Micro- and Nanoelectromechanical Systems

Completed

Microelectromechanical systems (MEMS) are integrated devices with critical applications in sensing, timing, signal processing, and biomedical diagnostics, and

Nanocalorimetry

Ongoing

Nanocalorimetry using micromachined devices has the capability to provide quantitative data to support the development of advanced metal silicide metallizations

Nanocalorimetry Measurements

Ongoing

Nanocalorimetry provides a capability to measure the thermal properties of very small samples and at very fast rates. Materials and interfaces of interest

Nanometrology: Composition and Structure of Nanomaterials

Ongoing

Advances in methods, instrumentation and analysis protocols are developed to enhance measurement science capabilities in nanomaterial elemental and

A scanning electron micrograph of a QDOGFET device used for photon number-resolving detection.

Nanostructure Fabrication and Metrology

Ongoing

Single photons are the fundamental particles for all optical measurements. Single photon detectors made from avalanche photodiodes or photomultiplier tubes are

Four examples of GaN nanostructures grown with selective epitaxy by molecular beam epitaxy, illustrating different morphology for Ga-polar vs. N-polar crystals.

Nanostructure Synthesis

Ongoing

We synthesize semiconductor nanostructures to serve both as test structures for measurement techniques and as building blocks for novel metrology tools and

Neuromorphic Device Measurements

Ongoing

Neuromorphic computing is a radical new approach to information processing for artificial intelligence where, instead of using digital electronics, inspiration

Novel Sources for Focused-ion Beams

Ongoing

Focused beams of ions have a wide range of uses, from nanoscale imaging to the fabrication of nanomaterials. We are developing novel cold-atom based ion sources

Plasma Process Metrology

Ongoing

Our multifaceted program provides numerous outputs to assist our customers. First, we develop and evaluate a variety of measurement techniques that provide

Polymers for Next-Generation Lithography

Completed

Our goal is to develop measurement methods with sufficiently high spatial resolution to uncover the materials limitations in the resolution of state-of-the-art

Power Conditioning Systems for Renewables, Storage, and Microgrids

Ongoing

This project develops the measurement science necessary to support the widespread use of advanced power electronics to provide new functionality in the smart

A 3" wafer is seen concentric with the lower plasma electrode.

Precision Materials for Quantum Devices

Ongoing

Tunnel junctions, single electron transistors and superconducting resonators are fabricated using ultra-high vacuum metals’ deposition and in situ low energy

Pushing the Limits of Measurement Accuracy in Atom Probe Mass Spectrometry

Ongoing

Atom probe microscopy was developed over 50 years ago; however, only within the last 15 years has the technique begun to see widespread use, due to the

Reliability Metrologies for Advanced Electronic Interconnects

Completed

This project, now concluded, developed methods to evaluate the reliability of thin films and interconnects in their as-manufactured states. Such tests are

Semiconductor Nanowire Metrology: Electronics, Photonics, and Sensors

Completed

In this project, we are developing metrology needed for the synthesis, processing, and characterization of semiconductor nanowire structures to enable reliable

Smart Grid System Testbed Facility

Ongoing

The Smart Grid Testbed Facility is a unique set of interconnected modules on the NIST Gaithersburg site. Designed as a platform to measure and characterize

Spin Dynamics and Magnetic Microscopy

Ongoing

The Spin Dynamics and Magnetic Microscopy Project develops metrology for magnetodynamic effects such as ferromagnetic resonance, switching, and damping. We

Strain Mapping and Simulation

Ongoing

We employ combined measurement and modeling to enhance understanding and capability of nanoscale strain-mapping via super-resolution confocal Raman microscopy

Sub-nanoscale electron microscopy of complex nanostructures

Ongoing

The aim of this project is to develop robust, quantitative measurement methods utilizing transmission electron microscopy methods for complex, nanostructured

Fig. 1. Time re-Envisioned: Not a biproduct of computation but the domain in which information is encoded. Leads to different mathematical functions becoming energy efficient primitives.

Temporal Computing

Ongoing

The human brain does some types of information processing, like speech recognition, image recognition, or video processing, much more efficiently than can be

Theory and Modeling of Materials for Renewable Energy

Ongoing

Renewable energy sources such as solar energy are attractive alternatives to fossil fuels because of their abundant supply and pollution-free power generation

Theory of the optical properties of materials

Ongoing

The overarching objective of this project is reliably calculating the bulk optical properties of materials, such as complex index of refraction, absorption, and

Thin Film Electronics (Archived)

Completed

The Thin Film Electronics Project develops rigorous measurements and methodology needed for continued U.S. leadership in manufacturing and innovation of

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