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U.S. innovation and industrial competitiveness rely on NIST to provide world class traceability to the International System of Units (SI) and to advance
NIST CTL’s Radio Frequency Technology Division conducts research into electromagnetic measurement, modeling, and theory in support of advanced wireless
GaN nanowires grown by catalyst-free molecular beam epitaxy have the unique property that most nanowires are completely free of crystalline defects. This
We synthesize semiconductor nanostructures to serve both as test structures for measurement techniques and as building blocks for novel metrology tools and
Our goal is to develop the metrology to enable a materials genomic approach to the discovery and optimization of complex electronic and electromagnetic
Ferromagnet-based microelectronic devices play an increasingly important role within the semiconductor ecosystem. Magnetic RAM (MRAM) is already replacing
The High-Frequency Electronics project supports advanced communications, millimeter-wave technologies, quantum computing, and the semiconductor industry through
We develop first-principles-based methods for prediction of atomic arrangements and properties in advanced materials and develop tools for the prediction and
With the rise of artificial intelligence and its insatiable demand for low-energy, high performance computing, research is accelerating into novel nanodevices
The quantum optics of light interacting with semiconductor-based nanostructures is being studied to extend concepts of entanglement and coherence in atomic
The program on magnetic random-access memory develops metrology to determine how spin currents can be generated and used to control and manipulate magnetization
The Magnetic Resonance Spectroscopy Project strives to be at the forefront of understanding the roles that critical atomic-scale defects play in determining
Precise measurements of thermal properties at the nanoscale are needed to engineer advanced and heterogeneously integrated devices, but measurements at this
All inorganic materials contain point defects in the form of impurities, interstitials, or vacancies. Common imaging techniques fail to capture these defects
The transmission of information in today's electronics requires the movement of electrical charge, which expends energy and generates heat, creating two
A new publication describes METIS, a Metrology Exchange to Innovate in Semiconductors We are seeking comments on the draft publication through February 16, 2024
This program aims to develop the metrology to enable quantitative assessment of performance limiting reliability issues, and to describe the physics of failure
Much of the activity of the UV Physics Group is aimed at supporting the R&D effort by the microelectronics industry to develop Extreme Ultraviolet Lithography
Electromagnetic (EM) systems use magnetic components such as inductors, isolators, and adaptive filters, but these are currently bulky and difficult to
Advanced bonding and integration physically bring together components, devices, and materials that are produced separately. There are strong economic and
Microelectromechanical systems (MEMS) are integrated devices with critical applications in sensing, timing, signal processing, and biomedical diagnostics, and
Heat management in semiconductor devices is a crucial problem currently limiting device performance and essentially all progress involving reduction of device
A comprehensive understanding of how current and next-generation materials impact the performance of semiconductor devices is critical to U.S. Semiconductor